Study of the photoinduced degradation of tandem photovoltaic converters based on a-si:H/[micro]c-Si:H

Study of the photoinduced degradation of tandem photovoltaic converters based on a-si:H/[micro]c-Si:H

The photoinduced degradation of photovoltaic converters based on an a-Si:H/[micro]c-Si:H tandem structure under a standard illuminance of 1000 W/[m.sup.2] is studied. The spectral and current-voltage characteristics of specially fabricated samples with various degrees of crystallinity of the intrins...

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Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2016-08, Vol.50 (8), p.1074
Hauptverfasser: Abramov, A.S, Andronikov, D.A, Emtsev, K.V, Kukin, A.V, Semenov, A.V, Terukova, E.E, Titov, A.S, Yakovlev, S.A
Format: Artikel
Sprache:eng
Schlagworte:
Silicon
Solar energy industry
Thin films
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Zusammenfassung:The photoinduced degradation of photovoltaic converters based on an a-Si:H/[micro]c-Si:H tandem structure under a standard illuminance of 1000 W/[m.sup.2] is studied. The spectral and current-voltage characteristics of specially fabricated samples with various degrees of crystallinity of the intrinsic layer in the lower (microcrystalline) cascade are measured in the course of the tests. DOI: 10.1134/S1063782616080030
ISSN:1063-7826
DOI:10.1134/S1063782616080030