Spectrometry of the Rutherford backscattering of ions and the Raman scattering of light in gas single crystals irradiated with 140-kev [H.sup.+.sub.2] ions

The methods of the Raman scattering of light and Rutherford backscattering are used to study the degree of structural disorder in layered GaS crystals before and after irradiation with 140-keV [H.sup.+.sub.2] ions. It is shown that the distribution of the crystal's components over depth is homo...

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Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2015-05, p.586
Hauptverfasser: Garibov, A.A, Madatov, R.S, Komarov, F.F, Pilko, V.V, Mustafayev, Yu. M, Akhmedov, F.I, Jakhangirov, M.M
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container_title Semiconductors (Woodbury, N.Y.)
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creator Garibov, A.A
Madatov, R.S
Komarov, F.F
Pilko, V.V
Mustafayev, Yu. M
Akhmedov, F.I
Jakhangirov, M.M
description The methods of the Raman scattering of light and Rutherford backscattering are used to study the degree of structural disorder in layered GaS crystals before and after irradiation with 140-keV [H.sup.+.sub.2] ions. It is shown that the distribution of the crystal's components over depth is homogeneous; for doses as high as 5 x [10.sup.15] [cm.sup.-2], the stoichiometric composition of the compound's components is retained. The experimental value of the critical dose for the beginning of amorphization amounts to about 5 x [10.sup.15] [cm.sup.-2] and is in accordance with the calculated value. The results obtained by the method of the Raman scattering of light confirm conservation of crystalline structure and the start of the amorphization process. DOI: 10.1134/S1063782615050073
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fullrecord <record><control><sourceid>gale</sourceid><recordid>TN_cdi_gale_infotracacademiconefile_A451940833</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A451940833</galeid><sourcerecordid>A451940833</sourcerecordid><originalsourceid>FETCH-gale_infotracacademiconefile_A4519408333</originalsourceid><addsrcrecordid>eNqVjc1KAzEUhbNQsP48gLu7l4lJk2nHpYjStXUnIrfJnZnYmaQkqdJn8WXNqBuXcuEc-PgOl7FLKbiUSl-vpVioZTNfyFrUQizVEZtNqJrYCTtN6U0IKZtaz9jnekcmxzBSjgcILeSe4HFfMrYhWtig2SaDOVN0vpsEF3wC9PbHxBE9_BUG1_UZnIcOE6QCBwITDynjkMDFiNZhJgsfLvcgtai29A7PK572O35VcsPnL99fztlxWzZ08dtnjD_cP92tqg4HenW-DTmiKWdpdCZ4al3ht7qWN1o0Sql_D74Af6dmXg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Spectrometry of the Rutherford backscattering of ions and the Raman scattering of light in gas single crystals irradiated with 140-kev [H.sup.+.sub.2] ions</title><source>Springer Nature - Complete Springer Journals</source><creator>Garibov, A.A ; Madatov, R.S ; Komarov, F.F ; Pilko, V.V ; Mustafayev, Yu. M ; Akhmedov, F.I ; Jakhangirov, M.M</creator><creatorcontrib>Garibov, A.A ; Madatov, R.S ; Komarov, F.F ; Pilko, V.V ; Mustafayev, Yu. M ; Akhmedov, F.I ; Jakhangirov, M.M</creatorcontrib><description>The methods of the Raman scattering of light and Rutherford backscattering are used to study the degree of structural disorder in layered GaS crystals before and after irradiation with 140-keV [H.sup.+.sub.2] ions. It is shown that the distribution of the crystal's components over depth is homogeneous; for doses as high as 5 x [10.sup.15] [cm.sup.-2], the stoichiometric composition of the compound's components is retained. The experimental value of the critical dose for the beginning of amorphization amounts to about 5 x [10.sup.15] [cm.sup.-2] and is in accordance with the calculated value. The results obtained by the method of the Raman scattering of light confirm conservation of crystalline structure and the start of the amorphization process. DOI: 10.1134/S1063782615050073</description><identifier>ISSN: 1063-7826</identifier><identifier>DOI: 10.1134/S1063782615050073</identifier><language>eng</language><publisher>Springer</publisher><ispartof>Semiconductors (Woodbury, N.Y.), 2015-05, p.586</ispartof><rights>COPYRIGHT 2015 Springer</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Garibov, A.A</creatorcontrib><creatorcontrib>Madatov, R.S</creatorcontrib><creatorcontrib>Komarov, F.F</creatorcontrib><creatorcontrib>Pilko, V.V</creatorcontrib><creatorcontrib>Mustafayev, Yu. M</creatorcontrib><creatorcontrib>Akhmedov, F.I</creatorcontrib><creatorcontrib>Jakhangirov, M.M</creatorcontrib><title>Spectrometry of the Rutherford backscattering of ions and the Raman scattering of light in gas single crystals irradiated with 140-kev [H.sup.+.sub.2] ions</title><title>Semiconductors (Woodbury, N.Y.)</title><description>The methods of the Raman scattering of light and Rutherford backscattering are used to study the degree of structural disorder in layered GaS crystals before and after irradiation with 140-keV [H.sup.+.sub.2] ions. It is shown that the distribution of the crystal's components over depth is homogeneous; for doses as high as 5 x [10.sup.15] [cm.sup.-2], the stoichiometric composition of the compound's components is retained. The experimental value of the critical dose for the beginning of amorphization amounts to about 5 x [10.sup.15] [cm.sup.-2] and is in accordance with the calculated value. The results obtained by the method of the Raman scattering of light confirm conservation of crystalline structure and the start of the amorphization process. DOI: 10.1134/S1063782615050073</description><issn>1063-7826</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><sourceid/><recordid>eNqVjc1KAzEUhbNQsP48gLu7l4lJk2nHpYjStXUnIrfJnZnYmaQkqdJn8WXNqBuXcuEc-PgOl7FLKbiUSl-vpVioZTNfyFrUQizVEZtNqJrYCTtN6U0IKZtaz9jnekcmxzBSjgcILeSe4HFfMrYhWtig2SaDOVN0vpsEF3wC9PbHxBE9_BUG1_UZnIcOE6QCBwITDynjkMDFiNZhJgsfLvcgtai29A7PK572O35VcsPnL99fztlxWzZ08dtnjD_cP92tqg4HenW-DTmiKWdpdCZ4al3ht7qWN1o0Sql_D74Af6dmXg</recordid><startdate>20150501</startdate><enddate>20150501</enddate><creator>Garibov, A.A</creator><creator>Madatov, R.S</creator><creator>Komarov, F.F</creator><creator>Pilko, V.V</creator><creator>Mustafayev, Yu. M</creator><creator>Akhmedov, F.I</creator><creator>Jakhangirov, M.M</creator><general>Springer</general><scope/></search><sort><creationdate>20150501</creationdate><title>Spectrometry of the Rutherford backscattering of ions and the Raman scattering of light in gas single crystals irradiated with 140-kev [H.sup.+.sub.2] ions</title><author>Garibov, A.A ; Madatov, R.S ; Komarov, F.F ; Pilko, V.V ; Mustafayev, Yu. M ; Akhmedov, F.I ; Jakhangirov, M.M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-gale_infotracacademiconefile_A4519408333</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Garibov, A.A</creatorcontrib><creatorcontrib>Madatov, R.S</creatorcontrib><creatorcontrib>Komarov, F.F</creatorcontrib><creatorcontrib>Pilko, V.V</creatorcontrib><creatorcontrib>Mustafayev, Yu. M</creatorcontrib><creatorcontrib>Akhmedov, F.I</creatorcontrib><creatorcontrib>Jakhangirov, M.M</creatorcontrib><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Garibov, A.A</au><au>Madatov, R.S</au><au>Komarov, F.F</au><au>Pilko, V.V</au><au>Mustafayev, Yu. M</au><au>Akhmedov, F.I</au><au>Jakhangirov, M.M</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Spectrometry of the Rutherford backscattering of ions and the Raman scattering of light in gas single crystals irradiated with 140-kev [H.sup.+.sub.2] ions</atitle><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle><date>2015-05-01</date><risdate>2015</risdate><spage>586</spage><pages>586-</pages><issn>1063-7826</issn><abstract>The methods of the Raman scattering of light and Rutherford backscattering are used to study the degree of structural disorder in layered GaS crystals before and after irradiation with 140-keV [H.sup.+.sub.2] ions. It is shown that the distribution of the crystal's components over depth is homogeneous; for doses as high as 5 x [10.sup.15] [cm.sup.-2], the stoichiometric composition of the compound's components is retained. The experimental value of the critical dose for the beginning of amorphization amounts to about 5 x [10.sup.15] [cm.sup.-2] and is in accordance with the calculated value. The results obtained by the method of the Raman scattering of light confirm conservation of crystalline structure and the start of the amorphization process. DOI: 10.1134/S1063782615050073</abstract><pub>Springer</pub><doi>10.1134/S1063782615050073</doi></addata></record>
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title Spectrometry of the Rutherford backscattering of ions and the Raman scattering of light in gas single crystals irradiated with 140-kev [H.sup.+.sub.2] ions
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T22%3A23%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Spectrometry%20of%20the%20Rutherford%20backscattering%20of%20ions%20and%20the%20Raman%20scattering%20of%20light%20in%20gas%20single%20crystals%20irradiated%20with%20140-kev%20%5BH.sup.+.sub.2%5D%20ions&rft.jtitle=Semiconductors%20(Woodbury,%20N.Y.)&rft.au=Garibov,%20A.A&rft.date=2015-05-01&rft.spage=586&rft.pages=586-&rft.issn=1063-7826&rft_id=info:doi/10.1134/S1063782615050073&rft_dat=%3Cgale%3EA451940833%3C/gale%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_galeid=A451940833&rfr_iscdi=true