Advanced gamma spectrum processing technique applied to the analysis of scattering spectra for determining material thickness

In this work, an advanced gamma spectrum processing technique is applied to analyze experimental scattering spectra for determining the thickness of C45 heat-resistant steel plates. The single scattering peak of scattering spectra is taken as an advantage to measure the intensity of single scatterin...

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Veröffentlicht in:Journal of radioanalytical and nuclear chemistry 2015-01, Vol.303 (1), p.693-699
Hauptverfasser: Tam, Hoang Duc, Chuong, Huynh Dinh, Thanh, Tran Thien, Nguyen, Vo Hoang, Trang, Hoang Thi Kieu, Van Tao, Chau
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container_title Journal of radioanalytical and nuclear chemistry
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creator Tam, Hoang Duc
Chuong, Huynh Dinh
Thanh, Tran Thien
Nguyen, Vo Hoang
Trang, Hoang Thi Kieu
Van Tao, Chau
description In this work, an advanced gamma spectrum processing technique is applied to analyze experimental scattering spectra for determining the thickness of C45 heat-resistant steel plates. The single scattering peak of scattering spectra is taken as an advantage to measure the intensity of single scattering photons. Based on these results, the thickness of steel plates is determined with a maximum deviation of real thickness and measured thickness of about 4 %. Monte Carlo simulation using MCNP5 code is also performed to cross check the results, which yields a maximum deviation of 2 %. These results strongly confirm the capability of this technique in analyzing gamma scattering spectra, which is a simple, effective and convenient method for determining material thickness.
doi_str_mv 10.1007/s10967-014-3378-5
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subjects Chemistry
Chemistry and Materials Science
Diagnostic Radiology
Hadrons
Heavy Ions
Inorganic Chemistry
Methods
Monte Carlo method
Nuclear Chemistry
Nuclear Physics
Physical Chemistry
title Advanced gamma spectrum processing technique applied to the analysis of scattering spectra for determining material thickness
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