Advanced gamma spectrum processing technique applied to the analysis of scattering spectra for determining material thickness
In this work, an advanced gamma spectrum processing technique is applied to analyze experimental scattering spectra for determining the thickness of C45 heat-resistant steel plates. The single scattering peak of scattering spectra is taken as an advantage to measure the intensity of single scatterin...
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Veröffentlicht in: | Journal of radioanalytical and nuclear chemistry 2015-01, Vol.303 (1), p.693-699 |
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container_title | Journal of radioanalytical and nuclear chemistry |
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creator | Tam, Hoang Duc Chuong, Huynh Dinh Thanh, Tran Thien Nguyen, Vo Hoang Trang, Hoang Thi Kieu Van Tao, Chau |
description | In this work, an advanced gamma spectrum processing technique is applied to analyze experimental scattering spectra for determining the thickness of C45 heat-resistant steel plates. The single scattering peak of scattering spectra is taken as an advantage to measure the intensity of single scattering photons. Based on these results, the thickness of steel plates is determined with a maximum deviation of real thickness and measured thickness of about 4 %. Monte Carlo simulation using MCNP5 code is also performed to cross check the results, which yields a maximum deviation of 2 %. These results strongly confirm the capability of this technique in analyzing gamma scattering spectra, which is a simple, effective and convenient method for determining material thickness. |
doi_str_mv | 10.1007/s10967-014-3378-5 |
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The single scattering peak of scattering spectra is taken as an advantage to measure the intensity of single scattering photons. Based on these results, the thickness of steel plates is determined with a maximum deviation of real thickness and measured thickness of about 4 %. Monte Carlo simulation using MCNP5 code is also performed to cross check the results, which yields a maximum deviation of 2 %. 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The single scattering peak of scattering spectra is taken as an advantage to measure the intensity of single scattering photons. Based on these results, the thickness of steel plates is determined with a maximum deviation of real thickness and measured thickness of about 4 %. Monte Carlo simulation using MCNP5 code is also performed to cross check the results, which yields a maximum deviation of 2 %. These results strongly confirm the capability of this technique in analyzing gamma scattering spectra, which is a simple, effective and convenient method for determining material thickness.</description><subject>Chemistry</subject><subject>Chemistry and Materials Science</subject><subject>Diagnostic Radiology</subject><subject>Hadrons</subject><subject>Heavy Ions</subject><subject>Inorganic Chemistry</subject><subject>Methods</subject><subject>Monte Carlo method</subject><subject>Nuclear Chemistry</subject><subject>Nuclear Physics</subject><subject>Physical Chemistry</subject><issn>0236-5731</issn><issn>1588-2780</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNp9kM1OxCAcxInRxHX1AbzxAqxQ2gLHzcavZBMveiYUaJe1hQpdkz347tLUs5DwD5OZCfwAuCd4QzBmD4lgUTOESYkoZRxVF2BFKs5RwTi-BCtc0BpVjJJrcJPSEWMsOKcr8LM138pra2CnhkHBNFo9xdMAxxi0Tcn5Dk5WH7z7OlmoxrF32TsFOB3y1av-nFyCoYVJq2mycfYvHQq2IUJjszg4P-uDmg2qz1mnP31uvwVXreqTvfuba_Dx9Pi-e0H7t-fX3XaPNBVsQoRXtWjyyQljJWGa1qzhhlVYl3VZGVXa0lghaJ0Xzb-mmhhFdE2xappC0DXYLL2d6q10vg35fTpvYweng7ety_q2xEIwURCSA2QJ6BhSiraVY3SDimdJsJyBywW4zMDlDFxWOVMsmTTOGGyUx3CKGVH6J_QLuEWFaQ</recordid><startdate>20150101</startdate><enddate>20150101</enddate><creator>Tam, Hoang Duc</creator><creator>Chuong, Huynh Dinh</creator><creator>Thanh, Tran Thien</creator><creator>Nguyen, Vo Hoang</creator><creator>Trang, Hoang Thi Kieu</creator><creator>Van Tao, Chau</creator><general>Springer Netherlands</general><general>Springer</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20150101</creationdate><title>Advanced gamma spectrum processing technique applied to the analysis of scattering spectra for determining material thickness</title><author>Tam, Hoang Duc ; Chuong, Huynh Dinh ; Thanh, Tran Thien ; Nguyen, Vo Hoang ; Trang, Hoang Thi Kieu ; Van Tao, Chau</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c397t-18569b1858177417c367b8d750c4645da4e4de993666635883c1da1c630abb293</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Chemistry</topic><topic>Chemistry and Materials Science</topic><topic>Diagnostic Radiology</topic><topic>Hadrons</topic><topic>Heavy Ions</topic><topic>Inorganic Chemistry</topic><topic>Methods</topic><topic>Monte Carlo method</topic><topic>Nuclear Chemistry</topic><topic>Nuclear Physics</topic><topic>Physical Chemistry</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tam, Hoang Duc</creatorcontrib><creatorcontrib>Chuong, Huynh Dinh</creatorcontrib><creatorcontrib>Thanh, Tran Thien</creatorcontrib><creatorcontrib>Nguyen, Vo Hoang</creatorcontrib><creatorcontrib>Trang, Hoang Thi Kieu</creatorcontrib><creatorcontrib>Van Tao, Chau</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of radioanalytical and nuclear chemistry</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Tam, Hoang Duc</au><au>Chuong, Huynh Dinh</au><au>Thanh, Tran Thien</au><au>Nguyen, Vo Hoang</au><au>Trang, Hoang Thi Kieu</au><au>Van Tao, Chau</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Advanced gamma spectrum processing technique applied to the analysis of scattering spectra for determining material thickness</atitle><jtitle>Journal of radioanalytical and nuclear chemistry</jtitle><stitle>J Radioanal Nucl Chem</stitle><date>2015-01-01</date><risdate>2015</risdate><volume>303</volume><issue>1</issue><spage>693</spage><epage>699</epage><pages>693-699</pages><issn>0236-5731</issn><eissn>1588-2780</eissn><abstract>In this work, an advanced gamma spectrum processing technique is applied to analyze experimental scattering spectra for determining the thickness of C45 heat-resistant steel plates. The single scattering peak of scattering spectra is taken as an advantage to measure the intensity of single scattering photons. Based on these results, the thickness of steel plates is determined with a maximum deviation of real thickness and measured thickness of about 4 %. Monte Carlo simulation using MCNP5 code is also performed to cross check the results, which yields a maximum deviation of 2 %. These results strongly confirm the capability of this technique in analyzing gamma scattering spectra, which is a simple, effective and convenient method for determining material thickness.</abstract><cop>Dordrecht</cop><pub>Springer Netherlands</pub><doi>10.1007/s10967-014-3378-5</doi><tpages>7</tpages></addata></record> |
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subjects | Chemistry Chemistry and Materials Science Diagnostic Radiology Hadrons Heavy Ions Inorganic Chemistry Methods Monte Carlo method Nuclear Chemistry Nuclear Physics Physical Chemistry |
title | Advanced gamma spectrum processing technique applied to the analysis of scattering spectra for determining material thickness |
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