Influence of the thermal power of a Fe atomic flux on the formation of Cu/Fe nanofilms on a Si(001) substrate

The growth of a Fe sublayer 1.5–14.0 monolayers (MLs) thick and a Cu film (about 5 MLs) on this sublayer is studied at a reduced temperature (1240°C) and an elevated temperature (1400°C) of a Fe source and at a reduced temperature (900°C) of a Cu source. The films are examined by Auger electron spec...

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Veröffentlicht in:Technical physics 2014-07, Vol.59 (7), p.1017-1026
Hauptverfasser: Plyusnin, N. I., Il’yashchenko, V. M., Kitan’, S. A., Lin, W. -Ch, Kuo, Ch. -Ch
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Sprache:eng
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