Dispersion and edge absorption of [Y.sub.2][O.sub.3] thin films obtained by different methods

Dispersion and edge absorption of [Y.sub.2][O.sub.3] thin films obtained by different methods

In the visible and near UV regions of the spectrum, we have measured optical dispersion in [Y.sub.2][O.sub.3] thin films obtained by stepwise vaporization and high-frequency RF ion plasma sputtering. We studied the edge absorption spectrum. We have determined the parameters of the single-oscillator...

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Veröffentlicht in:Journal of applied spectroscopy 2013-01, Vol.79 (6), p.982
Hauptverfasser: Bordun, O.M, Bordun, I.O, Kukharskyy, I.Yo
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Ionizing radiation
Methods
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description In the visible and near UV regions of the spectrum, we have measured optical dispersion in [Y.sub.2][O.sub.3] thin films obtained by stepwise vaporization and high-frequency RF ion plasma sputtering. We studied the edge absorption spectrum. We have determined the parameters of the single-oscillator approximation and determined the dispersion energy, the bond ionicity, and the coordination number. We compare the results obtained with the structural perfection of the [Y.sub.2][O.sub.3] films.
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fullrecord <record><control><sourceid>gale</sourceid><recordid>TN_cdi_gale_infotracacademiconefile_A377409193</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A377409193</galeid><sourcerecordid>A377409193</sourcerecordid><originalsourceid>FETCH-LOGICAL-g733-ec835e4d36602c921fee58a0080107e22c44e7d231d4a0d75feed154cf150b9d3</originalsourceid><addsrcrecordid>eNpVjktrwzAQhEVpoWna_6BrDw6rhy37GNJXIBBocynBGNlaOSqJFCwF2n9f93Fo2cMOs_MNe0YmLFciKwupzskEgLOsAqEuyVWMbwBQlRwmpL5z8YhDdMFT7Q1F0yPVbQzDMX15wdLt6yye2hmvt-tvIWqads5T6_aHSEObtPNoaPtBjbMWB_SJHjDtgonX5MLqfcSb3z0lm4f7zeIpW60fl4v5KuuVEBl2pchRGlEUwLuKM4uYlxqgBAYKOe-kRGW4YEZqMCof74blsrMsh7YyYkpmP7W93mPjvA1p0N04Bg-uCx7HV7GZC6UkVKwSI3D7DxgzCd9Tr08xNsuX57_ZTwNoYV0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Dispersion and edge absorption of [Y.sub.2][O.sub.3] thin films obtained by different methods</title><source>SpringerNature Journals</source><creator>Bordun, O.M ; Bordun, I.O ; Kukharskyy, I.Yo</creator><creatorcontrib>Bordun, O.M ; Bordun, I.O ; Kukharskyy, I.Yo</creatorcontrib><description>In the visible and near UV regions of the spectrum, we have measured optical dispersion in [Y.sub.2][O.sub.3] thin films obtained by stepwise vaporization and high-frequency RF ion plasma sputtering. We studied the edge absorption spectrum. We have determined the parameters of the single-oscillator approximation and determined the dispersion energy, the bond ionicity, and the coordination number. We compare the results obtained with the structural perfection of the [Y.sub.2][O.sub.3] films.</description><identifier>ISSN: 0021-9037</identifier><identifier>EISSN: 1573-8647</identifier><language>eng</language><publisher>Springer</publisher><subject>Analysis ; Ionizing radiation ; Methods</subject><ispartof>Journal of applied spectroscopy, 2013-01, Vol.79 (6), p.982</ispartof><rights>COPYRIGHT 2013 Springer</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784</link.rule.ids></links><search><creatorcontrib>Bordun, O.M</creatorcontrib><creatorcontrib>Bordun, I.O</creatorcontrib><creatorcontrib>Kukharskyy, I.Yo</creatorcontrib><title>Dispersion and edge absorption of [Y.sub.2][O.sub.3] thin films obtained by different methods</title><title>Journal of applied spectroscopy</title><description>In the visible and near UV regions of the spectrum, we have measured optical dispersion in [Y.sub.2][O.sub.3] thin films obtained by stepwise vaporization and high-frequency RF ion plasma sputtering. We studied the edge absorption spectrum. We have determined the parameters of the single-oscillator approximation and determined the dispersion energy, the bond ionicity, and the coordination number. We compare the results obtained with the structural perfection of the [Y.sub.2][O.sub.3] films.</description><subject>Analysis</subject><subject>Ionizing radiation</subject><subject>Methods</subject><issn>0021-9037</issn><issn>1573-8647</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2013</creationdate><recordtype>article</recordtype><recordid>eNpVjktrwzAQhEVpoWna_6BrDw6rhy37GNJXIBBocynBGNlaOSqJFCwF2n9f93Fo2cMOs_MNe0YmLFciKwupzskEgLOsAqEuyVWMbwBQlRwmpL5z8YhDdMFT7Q1F0yPVbQzDMX15wdLt6yye2hmvt-tvIWqads5T6_aHSEObtPNoaPtBjbMWB_SJHjDtgonX5MLqfcSb3z0lm4f7zeIpW60fl4v5KuuVEBl2pchRGlEUwLuKM4uYlxqgBAYKOe-kRGW4YEZqMCof74blsrMsh7YyYkpmP7W93mPjvA1p0N04Bg-uCx7HV7GZC6UkVKwSI3D7DxgzCd9Tr08xNsuX57_ZTwNoYV0</recordid><startdate>20130101</startdate><enddate>20130101</enddate><creator>Bordun, O.M</creator><creator>Bordun, I.O</creator><creator>Kukharskyy, I.Yo</creator><general>Springer</general><scope>ISR</scope></search><sort><creationdate>20130101</creationdate><title>Dispersion and edge absorption of [Y.sub.2][O.sub.3] thin films obtained by different methods</title><author>Bordun, O.M ; Bordun, I.O ; Kukharskyy, I.Yo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-g733-ec835e4d36602c921fee58a0080107e22c44e7d231d4a0d75feed154cf150b9d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2013</creationdate><topic>Analysis</topic><topic>Ionizing radiation</topic><topic>Methods</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bordun, O.M</creatorcontrib><creatorcontrib>Bordun, I.O</creatorcontrib><creatorcontrib>Kukharskyy, I.Yo</creatorcontrib><collection>Gale In Context: Science</collection><jtitle>Journal of applied spectroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Bordun, O.M</au><au>Bordun, I.O</au><au>Kukharskyy, I.Yo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Dispersion and edge absorption of [Y.sub.2][O.sub.3] thin films obtained by different methods</atitle><jtitle>Journal of applied spectroscopy</jtitle><date>2013-01-01</date><risdate>2013</risdate><volume>79</volume><issue>6</issue><spage>982</spage><pages>982-</pages><issn>0021-9037</issn><eissn>1573-8647</eissn><abstract>In the visible and near UV regions of the spectrum, we have measured optical dispersion in [Y.sub.2][O.sub.3] thin films obtained by stepwise vaporization and high-frequency RF ion plasma sputtering. We studied the edge absorption spectrum. We have determined the parameters of the single-oscillator approximation and determined the dispersion energy, the bond ionicity, and the coordination number. We compare the results obtained with the structural perfection of the [Y.sub.2][O.sub.3] films.</abstract><pub>Springer</pub><tpages>6</tpages></addata></record>
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Ionizing radiation
Methods
title Dispersion and edge absorption of [Y.sub.2][O.sub.3] thin films obtained by different methods
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-30T21%3A17%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Dispersion%20and%20edge%20absorption%20of%20%5BY.sub.2%5D%5BO.sub.3%5D%20thin%20films%20obtained%20by%20different%20methods&rft.jtitle=Journal%20of%20applied%20spectroscopy&rft.au=Bordun,%20O.M&rft.date=2013-01-01&rft.volume=79&rft.issue=6&rft.spage=982&rft.pages=982-&rft.issn=0021-9037&rft.eissn=1573-8647&rft_id=info:doi/&rft_dat=%3Cgale%3EA377409193%3C/gale%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_galeid=A377409193&rfr_iscdi=true