The effect of annealing on the properties of [Ga.sub.2][O.sub.3] anodic films
The effect of annealing and oxygen plasma on the electrical characteristics of gallium oxide films has been investigated. [Ga.sub.2][O.sub.3] films with thicknesses of 200-300 nm were formed by the anodic oxidation of n-GaAs wafers with the donor concentration [N.sub.d] = (1-2) x [10.sup.16] [cm.sup...
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Veröffentlicht in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2012-02, Vol.46 (2), p.267 |
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creator | Kalygina, V.M Zarubin, A.N Nayden, Ye. P Novikov, V.A Petrova, Yu. S Tolbanov, O.P Tyazhev, A.V Yaskevich, T.M |
description | The effect of annealing and oxygen plasma on the electrical characteristics of gallium oxide films has been investigated. [Ga.sub.2][O.sub.3] films with thicknesses of 200-300 nm were formed by the anodic oxidation of n-GaAs wafers with the donor concentration [N.sub.d] = (1-2) x [10.sup.16] [cm.sup.-3]. It is shown that, after annealing at 900°C for 30 min, the gallium arsenide films contain only the β [Ga.sub.2][O.sub.3] phase. The effect of the duration of oxygen plasma treatment prior to annealing on the nucleation of β-phase crystallites with different orientations has been studied. It has been established that the electrical conductivity of the [Ga.sub.2][O.sub.3] films can be managed by annealing and variation in the duration of oxygen plasma treatment. It is shown that the response of the V/Ni--GaAs--[Ga.sub.2][O.sub.3]--V/Ni structure to a mixture exhaled by a person depends on the value and sign of the potential on the control electrode. DOI: 10.1134/S1063782612020145 |
doi_str_mv | 10.1134/S1063782612020145 |
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It is shown that the response of the V/Ni--GaAs--[Ga.sub.2][O.sub.3]--V/Ni structure to a mixture exhaled by a person depends on the value and sign of the potential on the control electrode. 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S</creatorcontrib><creatorcontrib>Tolbanov, O.P</creatorcontrib><creatorcontrib>Tyazhev, A.V</creatorcontrib><creatorcontrib>Yaskevich, T.M</creatorcontrib><title>The effect of annealing on the properties of [Ga.sub.2][O.sub.3] anodic films</title><title>Semiconductors (Woodbury, N.Y.)</title><description>The effect of annealing and oxygen plasma on the electrical characteristics of gallium oxide films has been investigated. [Ga.sub.2][O.sub.3] films with thicknesses of 200-300 nm were formed by the anodic oxidation of n-GaAs wafers with the donor concentration [N.sub.d] = (1-2) x [10.sup.16] [cm.sup.-3]. It is shown that, after annealing at 900°C for 30 min, the gallium arsenide films contain only the β [Ga.sub.2][O.sub.3] phase. The effect of the duration of oxygen plasma treatment prior to annealing on the nucleation of β-phase crystallites with different orientations has been studied. It has been established that the electrical conductivity of the [Ga.sub.2][O.sub.3] films can be managed by annealing and variation in the duration of oxygen plasma treatment. It is shown that the response of the V/Ni--GaAs--[Ga.sub.2][O.sub.3]--V/Ni structure to a mixture exhaled by a person depends on the value and sign of the potential on the control electrode. 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S</creatorcontrib><creatorcontrib>Tolbanov, O.P</creatorcontrib><creatorcontrib>Tyazhev, A.V</creatorcontrib><creatorcontrib>Yaskevich, T.M</creatorcontrib><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kalygina, V.M</au><au>Zarubin, A.N</au><au>Nayden, Ye. P</au><au>Novikov, V.A</au><au>Petrova, Yu. S</au><au>Tolbanov, O.P</au><au>Tyazhev, A.V</au><au>Yaskevich, T.M</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The effect of annealing on the properties of [Ga.sub.2][O.sub.3] anodic films</atitle><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle><date>2012-02-01</date><risdate>2012</risdate><volume>46</volume><issue>2</issue><spage>267</spage><pages>267-</pages><issn>1063-7826</issn><abstract>The effect of annealing and oxygen plasma on the electrical characteristics of gallium oxide films has been investigated. [Ga.sub.2][O.sub.3] films with thicknesses of 200-300 nm were formed by the anodic oxidation of n-GaAs wafers with the donor concentration [N.sub.d] = (1-2) x [10.sup.16] [cm.sup.-3]. It is shown that, after annealing at 900°C for 30 min, the gallium arsenide films contain only the β [Ga.sub.2][O.sub.3] phase. The effect of the duration of oxygen plasma treatment prior to annealing on the nucleation of β-phase crystallites with different orientations has been studied. It has been established that the electrical conductivity of the [Ga.sub.2][O.sub.3] films can be managed by annealing and variation in the duration of oxygen plasma treatment. It is shown that the response of the V/Ni--GaAs--[Ga.sub.2][O.sub.3]--V/Ni structure to a mixture exhaled by a person depends on the value and sign of the potential on the control electrode. DOI: 10.1134/S1063782612020145</abstract><pub>Springer</pub><doi>10.1134/S1063782612020145</doi></addata></record> |
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subjects | Analysis Electric properties Electrical conductivity Gallium arsenide Plasma physics |
title | The effect of annealing on the properties of [Ga.sub.2][O.sub.3] anodic films |
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