The effect of annealing on the properties of [Ga.sub.2][O.sub.3] anodic films

The effect of annealing and oxygen plasma on the electrical characteristics of gallium oxide films has been investigated. [Ga.sub.2][O.sub.3] films with thicknesses of 200-300 nm were formed by the anodic oxidation of n-GaAs wafers with the donor concentration [N.sub.d] = (1-2) x [10.sup.16] [cm.sup...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2012-02, Vol.46 (2), p.267
Hauptverfasser: Kalygina, V.M, Zarubin, A.N, Nayden, Ye. P, Novikov, V.A, Petrova, Yu. S, Tolbanov, O.P, Tyazhev, A.V, Yaskevich, T.M
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue 2
container_start_page 267
container_title Semiconductors (Woodbury, N.Y.)
container_volume 46
creator Kalygina, V.M
Zarubin, A.N
Nayden, Ye. P
Novikov, V.A
Petrova, Yu. S
Tolbanov, O.P
Tyazhev, A.V
Yaskevich, T.M
description The effect of annealing and oxygen plasma on the electrical characteristics of gallium oxide films has been investigated. [Ga.sub.2][O.sub.3] films with thicknesses of 200-300 nm were formed by the anodic oxidation of n-GaAs wafers with the donor concentration [N.sub.d] = (1-2) x [10.sup.16] [cm.sup.-3]. It is shown that, after annealing at 900°C for 30 min, the gallium arsenide films contain only the β [Ga.sub.2][O.sub.3] phase. The effect of the duration of oxygen plasma treatment prior to annealing on the nucleation of β-phase crystallites with different orientations has been studied. It has been established that the electrical conductivity of the [Ga.sub.2][O.sub.3] films can be managed by annealing and variation in the duration of oxygen plasma treatment. It is shown that the response of the V/Ni--GaAs--[Ga.sub.2][O.sub.3]--V/Ni structure to a mixture exhaled by a person depends on the value and sign of the potential on the control electrode. DOI: 10.1134/S1063782612020145
doi_str_mv 10.1134/S1063782612020145
format Article
fullrecord <record><control><sourceid>gale</sourceid><recordid>TN_cdi_gale_infotracacademiconefile_A360994407</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A360994407</galeid><sourcerecordid>A360994407</sourcerecordid><originalsourceid>FETCH-gale_infotracacademiconefile_A3609944073</originalsourceid><addsrcrecordid>eNqVi0sOgjAYhLvQRHwcwF0vALa0vJbG-NgYF7IjhFT4izXQEor3F4wXMLOYyTf5ENpS4lHK-O5OScii2A-pT3xCeTBDzoTciS3Q0toXIZTGAXfQNX0CBimhHLCRWGgNolG6xkbjYby63nTQDwrsdGdn4dn3w_Pz7PYdLB8VU6kSS9W0do3mUjQWNr9eIe90TA8XtxYNFEpLM_SiHFNBq0qjYbSg2LOQJAnnJGJ_Cx_KKEks</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>The effect of annealing on the properties of [Ga.sub.2][O.sub.3] anodic films</title><source>SpringerNature Journals</source><creator>Kalygina, V.M ; Zarubin, A.N ; Nayden, Ye. P ; Novikov, V.A ; Petrova, Yu. S ; Tolbanov, O.P ; Tyazhev, A.V ; Yaskevich, T.M</creator><creatorcontrib>Kalygina, V.M ; Zarubin, A.N ; Nayden, Ye. P ; Novikov, V.A ; Petrova, Yu. S ; Tolbanov, O.P ; Tyazhev, A.V ; Yaskevich, T.M</creatorcontrib><description>The effect of annealing and oxygen plasma on the electrical characteristics of gallium oxide films has been investigated. [Ga.sub.2][O.sub.3] films with thicknesses of 200-300 nm were formed by the anodic oxidation of n-GaAs wafers with the donor concentration [N.sub.d] = (1-2) x [10.sup.16] [cm.sup.-3]. It is shown that, after annealing at 900°C for 30 min, the gallium arsenide films contain only the β [Ga.sub.2][O.sub.3] phase. The effect of the duration of oxygen plasma treatment prior to annealing on the nucleation of β-phase crystallites with different orientations has been studied. It has been established that the electrical conductivity of the [Ga.sub.2][O.sub.3] films can be managed by annealing and variation in the duration of oxygen plasma treatment. It is shown that the response of the V/Ni--GaAs--[Ga.sub.2][O.sub.3]--V/Ni structure to a mixture exhaled by a person depends on the value and sign of the potential on the control electrode. DOI: 10.1134/S1063782612020145</description><identifier>ISSN: 1063-7826</identifier><identifier>DOI: 10.1134/S1063782612020145</identifier><language>eng</language><publisher>Springer</publisher><subject>Analysis ; Electric properties ; Electrical conductivity ; Gallium arsenide ; Plasma physics</subject><ispartof>Semiconductors (Woodbury, N.Y.), 2012-02, Vol.46 (2), p.267</ispartof><rights>COPYRIGHT 2012 Springer</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Kalygina, V.M</creatorcontrib><creatorcontrib>Zarubin, A.N</creatorcontrib><creatorcontrib>Nayden, Ye. P</creatorcontrib><creatorcontrib>Novikov, V.A</creatorcontrib><creatorcontrib>Petrova, Yu. S</creatorcontrib><creatorcontrib>Tolbanov, O.P</creatorcontrib><creatorcontrib>Tyazhev, A.V</creatorcontrib><creatorcontrib>Yaskevich, T.M</creatorcontrib><title>The effect of annealing on the properties of [Ga.sub.2][O.sub.3] anodic films</title><title>Semiconductors (Woodbury, N.Y.)</title><description>The effect of annealing and oxygen plasma on the electrical characteristics of gallium oxide films has been investigated. [Ga.sub.2][O.sub.3] films with thicknesses of 200-300 nm were formed by the anodic oxidation of n-GaAs wafers with the donor concentration [N.sub.d] = (1-2) x [10.sup.16] [cm.sup.-3]. It is shown that, after annealing at 900°C for 30 min, the gallium arsenide films contain only the β [Ga.sub.2][O.sub.3] phase. The effect of the duration of oxygen plasma treatment prior to annealing on the nucleation of β-phase crystallites with different orientations has been studied. It has been established that the electrical conductivity of the [Ga.sub.2][O.sub.3] films can be managed by annealing and variation in the duration of oxygen plasma treatment. It is shown that the response of the V/Ni--GaAs--[Ga.sub.2][O.sub.3]--V/Ni structure to a mixture exhaled by a person depends on the value and sign of the potential on the control electrode. DOI: 10.1134/S1063782612020145</description><subject>Analysis</subject><subject>Electric properties</subject><subject>Electrical conductivity</subject><subject>Gallium arsenide</subject><subject>Plasma physics</subject><issn>1063-7826</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><sourceid/><recordid>eNqVi0sOgjAYhLvQRHwcwF0vALa0vJbG-NgYF7IjhFT4izXQEor3F4wXMLOYyTf5ENpS4lHK-O5OScii2A-pT3xCeTBDzoTciS3Q0toXIZTGAXfQNX0CBimhHLCRWGgNolG6xkbjYby63nTQDwrsdGdn4dn3w_Pz7PYdLB8VU6kSS9W0do3mUjQWNr9eIe90TA8XtxYNFEpLM_SiHFNBq0qjYbSg2LOQJAnnJGJ_Cx_KKEks</recordid><startdate>20120201</startdate><enddate>20120201</enddate><creator>Kalygina, V.M</creator><creator>Zarubin, A.N</creator><creator>Nayden, Ye. P</creator><creator>Novikov, V.A</creator><creator>Petrova, Yu. S</creator><creator>Tolbanov, O.P</creator><creator>Tyazhev, A.V</creator><creator>Yaskevich, T.M</creator><general>Springer</general><scope/></search><sort><creationdate>20120201</creationdate><title>The effect of annealing on the properties of [Ga.sub.2][O.sub.3] anodic films</title><author>Kalygina, V.M ; Zarubin, A.N ; Nayden, Ye. P ; Novikov, V.A ; Petrova, Yu. S ; Tolbanov, O.P ; Tyazhev, A.V ; Yaskevich, T.M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-gale_infotracacademiconefile_A3609944073</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Analysis</topic><topic>Electric properties</topic><topic>Electrical conductivity</topic><topic>Gallium arsenide</topic><topic>Plasma physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kalygina, V.M</creatorcontrib><creatorcontrib>Zarubin, A.N</creatorcontrib><creatorcontrib>Nayden, Ye. P</creatorcontrib><creatorcontrib>Novikov, V.A</creatorcontrib><creatorcontrib>Petrova, Yu. S</creatorcontrib><creatorcontrib>Tolbanov, O.P</creatorcontrib><creatorcontrib>Tyazhev, A.V</creatorcontrib><creatorcontrib>Yaskevich, T.M</creatorcontrib><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kalygina, V.M</au><au>Zarubin, A.N</au><au>Nayden, Ye. P</au><au>Novikov, V.A</au><au>Petrova, Yu. S</au><au>Tolbanov, O.P</au><au>Tyazhev, A.V</au><au>Yaskevich, T.M</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The effect of annealing on the properties of [Ga.sub.2][O.sub.3] anodic films</atitle><jtitle>Semiconductors (Woodbury, N.Y.)</jtitle><date>2012-02-01</date><risdate>2012</risdate><volume>46</volume><issue>2</issue><spage>267</spage><pages>267-</pages><issn>1063-7826</issn><abstract>The effect of annealing and oxygen plasma on the electrical characteristics of gallium oxide films has been investigated. [Ga.sub.2][O.sub.3] films with thicknesses of 200-300 nm were formed by the anodic oxidation of n-GaAs wafers with the donor concentration [N.sub.d] = (1-2) x [10.sup.16] [cm.sup.-3]. It is shown that, after annealing at 900°C for 30 min, the gallium arsenide films contain only the β [Ga.sub.2][O.sub.3] phase. The effect of the duration of oxygen plasma treatment prior to annealing on the nucleation of β-phase crystallites with different orientations has been studied. It has been established that the electrical conductivity of the [Ga.sub.2][O.sub.3] films can be managed by annealing and variation in the duration of oxygen plasma treatment. It is shown that the response of the V/Ni--GaAs--[Ga.sub.2][O.sub.3]--V/Ni structure to a mixture exhaled by a person depends on the value and sign of the potential on the control electrode. DOI: 10.1134/S1063782612020145</abstract><pub>Springer</pub><doi>10.1134/S1063782612020145</doi></addata></record>
fulltext fulltext
identifier ISSN: 1063-7826
ispartof Semiconductors (Woodbury, N.Y.), 2012-02, Vol.46 (2), p.267
issn 1063-7826
language eng
recordid cdi_gale_infotracacademiconefile_A360994407
source SpringerNature Journals
subjects Analysis
Electric properties
Electrical conductivity
Gallium arsenide
Plasma physics
title The effect of annealing on the properties of [Ga.sub.2][O.sub.3] anodic films
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T11%3A25%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20effect%20of%20annealing%20on%20the%20properties%20of%20%5BGa.sub.2%5D%5BO.sub.3%5D%20anodic%20films&rft.jtitle=Semiconductors%20(Woodbury,%20N.Y.)&rft.au=Kalygina,%20V.M&rft.date=2012-02-01&rft.volume=46&rft.issue=2&rft.spage=267&rft.pages=267-&rft.issn=1063-7826&rft_id=info:doi/10.1134/S1063782612020145&rft_dat=%3Cgale%3EA360994407%3C/gale%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_galeid=A360994407&rfr_iscdi=true