Stable Reverse Bias or Integrated Bypass Diode in HIP-MWT+ Solar Cells Based on Different Industrial Rear Passivation

The Metal Wrap Through+ (HIP-MWT+) solar cell is based on the PERC concept but features two additional electrical contacts, namely the Schottky contact between p-type Si bulk and Ag n-contact and the metal-insulator-semiconductor (MIS) contact on the rear side of the cell below the n-contact pads. T...

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Hauptverfasser: Schweigstill, T, Spribille, A, Huyeng, J.D, Clement, F, Glunz, S.W
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Spribille, A
Huyeng, J.D
Clement, F
Glunz, S.W
description The Metal Wrap Through+ (HIP-MWT+) solar cell is based on the PERC concept but features two additional electrical contacts, namely the Schottky contact between p-type Si bulk and Ag n-contact and the metal-insulator-semiconductor (MIS) contact on the rear side of the cell below the n-contact pads. To prevent hotspots under reverse bias, both contacts shall either restrict current flow or allow a homogenous current flow at low voltage. In this work we present both options. First the stable reverse bias characteristics up to – 15 V with a MIS contact using industrially manufactured SiON passivation and second, an integrated by-pass diode using AlOX as insulator in the passivation stack allowing current flows at approximately Vrev = – 3.5 V depending on the chosen screen-print paste. The examined Schottky contacts break down at around Vrev = – 2.5 V. Reverse bias testing of the cells proof a solid performance of the cells under reverse bias and an average conversion efficiency of = 21.2 % (AlOX) and = 20.7 % (SiON), respectively.
doi_str_mv 10.4229/EUPVSEC20212021-2CO.10.2
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fullrecord <record><control><sourceid>fraunhofer_E3A</sourceid><recordid>TN_cdi_fraunhofer_primary_oai_fraunhofer_de_N_644460</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>oai_fraunhofer_de_N_644460</sourcerecordid><originalsourceid>FETCH-fraunhofer_primary_oai_fraunhofer_de_N_6444603</originalsourceid><addsrcrecordid>eNqdjDFrwzAQhbV0KGn_w-3FiaMKQ1c7DsnQxtROMooLPrcCRQon2eB_XwU6dO5wPLj3vU8IWOdLJeXbqj42p7auZC7X98tkdVimTj6KsY14sQSfNBEHgtJgAM-wd5G-GCP1UM43DAE2xvcExsFu32Tv5-4FWm-RoSJrA5QYEupdwoaBmFxMin4MkQ3aZE9gkyxmwmi8exIPA9pAz7-5EGpbd9UuGxhH9-2TQd_YXJFn7dHoP--e9IculFJF_vrP2Q_0q1vI</addsrcrecordid><sourcetype>Institutional Repository</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Stable Reverse Bias or Integrated Bypass Diode in HIP-MWT+ Solar Cells Based on Different Industrial Rear Passivation</title><source>Fraunhofer-ePrints</source><creator>Schweigstill, T ; Spribille, A ; Huyeng, J.D ; Clement, F ; Glunz, S.W</creator><creatorcontrib>Schweigstill, T ; Spribille, A ; Huyeng, J.D ; Clement, F ; Glunz, S.W</creatorcontrib><description>The Metal Wrap Through+ (HIP-MWT+) solar cell is based on the PERC concept but features two additional electrical contacts, namely the Schottky contact between p-type Si bulk and Ag n-contact and the metal-insulator-semiconductor (MIS) contact on the rear side of the cell below the n-contact pads. To prevent hotspots under reverse bias, both contacts shall either restrict current flow or allow a homogenous current flow at low voltage. In this work we present both options. First the stable reverse bias characteristics up to – 15 V with a MIS contact using industrially manufactured SiON passivation and second, an integrated by-pass diode using AlOX as insulator in the passivation stack allowing current flows at approximately Vrev = – 3.5 V depending on the chosen screen-print paste. The examined Schottky contacts break down at around Vrev = – 2.5 V. Reverse bias testing of the cells proof a solid performance of the cells under reverse bias and an average conversion efficiency of = 21.2 % (AlOX) and = 20.7 % (SiON), respectively.</description><identifier>DOI: 10.4229/EUPVSEC20212021-2CO.10.2</identifier><language>eng</language><subject>back contact ; Herstellung und Analyse von hocheffizienten Si-Solarzellen ; Metallisierung und Strukturierung ; MWT solar cells ; passivation ; PERC ; Photovoltaik ; Silicium-Photovoltaik</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,315,776,4036,27837</link.rule.ids><linktorsrc>$$Uhttp://publica.fraunhofer.de/documents/N-644460.html$$EView_record_in_Fraunhofer-Gesellschaft$$FView_record_in_$$GFraunhofer-Gesellschaft$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Schweigstill, T</creatorcontrib><creatorcontrib>Spribille, A</creatorcontrib><creatorcontrib>Huyeng, J.D</creatorcontrib><creatorcontrib>Clement, F</creatorcontrib><creatorcontrib>Glunz, S.W</creatorcontrib><title>Stable Reverse Bias or Integrated Bypass Diode in HIP-MWT+ Solar Cells Based on Different Industrial Rear Passivation</title><description>The Metal Wrap Through+ (HIP-MWT+) solar cell is based on the PERC concept but features two additional electrical contacts, namely the Schottky contact between p-type Si bulk and Ag n-contact and the metal-insulator-semiconductor (MIS) contact on the rear side of the cell below the n-contact pads. To prevent hotspots under reverse bias, both contacts shall either restrict current flow or allow a homogenous current flow at low voltage. In this work we present both options. First the stable reverse bias characteristics up to – 15 V with a MIS contact using industrially manufactured SiON passivation and second, an integrated by-pass diode using AlOX as insulator in the passivation stack allowing current flows at approximately Vrev = – 3.5 V depending on the chosen screen-print paste. The examined Schottky contacts break down at around Vrev = – 2.5 V. Reverse bias testing of the cells proof a solid performance of the cells under reverse bias and an average conversion efficiency of = 21.2 % (AlOX) and = 20.7 % (SiON), respectively.</description><subject>back contact</subject><subject>Herstellung und Analyse von hocheffizienten Si-Solarzellen</subject><subject>Metallisierung und Strukturierung</subject><subject>MWT solar cells</subject><subject>passivation</subject><subject>PERC</subject><subject>Photovoltaik</subject><subject>Silicium-Photovoltaik</subject><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2021</creationdate><recordtype>conference_proceeding</recordtype><sourceid>AFSUM</sourceid><sourceid>E3A</sourceid><recordid>eNqdjDFrwzAQhbV0KGn_w-3FiaMKQ1c7DsnQxtROMooLPrcCRQon2eB_XwU6dO5wPLj3vU8IWOdLJeXbqj42p7auZC7X98tkdVimTj6KsY14sQSfNBEHgtJgAM-wd5G-GCP1UM43DAE2xvcExsFu32Tv5-4FWm-RoSJrA5QYEupdwoaBmFxMin4MkQ3aZE9gkyxmwmi8exIPA9pAz7-5EGpbd9UuGxhH9-2TQd_YXJFn7dHoP--e9IculFJF_vrP2Q_0q1vI</recordid><startdate>2021</startdate><enddate>2021</enddate><creator>Schweigstill, T</creator><creator>Spribille, A</creator><creator>Huyeng, J.D</creator><creator>Clement, F</creator><creator>Glunz, S.W</creator><scope>AFSUM</scope><scope>E3A</scope></search><sort><creationdate>2021</creationdate><title>Stable Reverse Bias or Integrated Bypass Diode in HIP-MWT+ Solar Cells Based on Different Industrial Rear Passivation</title><author>Schweigstill, T ; Spribille, A ; Huyeng, J.D ; Clement, F ; Glunz, S.W</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-fraunhofer_primary_oai_fraunhofer_de_N_6444603</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2021</creationdate><topic>back contact</topic><topic>Herstellung und Analyse von hocheffizienten Si-Solarzellen</topic><topic>Metallisierung und Strukturierung</topic><topic>MWT solar cells</topic><topic>passivation</topic><topic>PERC</topic><topic>Photovoltaik</topic><topic>Silicium-Photovoltaik</topic><toplevel>online_resources</toplevel><creatorcontrib>Schweigstill, T</creatorcontrib><creatorcontrib>Spribille, A</creatorcontrib><creatorcontrib>Huyeng, J.D</creatorcontrib><creatorcontrib>Clement, F</creatorcontrib><creatorcontrib>Glunz, S.W</creatorcontrib><collection>Fraunhofer-ePrints - FT</collection><collection>Fraunhofer-ePrints</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Schweigstill, T</au><au>Spribille, A</au><au>Huyeng, J.D</au><au>Clement, F</au><au>Glunz, S.W</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Stable Reverse Bias or Integrated Bypass Diode in HIP-MWT+ Solar Cells Based on Different Industrial Rear Passivation</atitle><date>2021</date><risdate>2021</risdate><abstract>The Metal Wrap Through+ (HIP-MWT+) solar cell is based on the PERC concept but features two additional electrical contacts, namely the Schottky contact between p-type Si bulk and Ag n-contact and the metal-insulator-semiconductor (MIS) contact on the rear side of the cell below the n-contact pads. To prevent hotspots under reverse bias, both contacts shall either restrict current flow or allow a homogenous current flow at low voltage. In this work we present both options. First the stable reverse bias characteristics up to – 15 V with a MIS contact using industrially manufactured SiON passivation and second, an integrated by-pass diode using AlOX as insulator in the passivation stack allowing current flows at approximately Vrev = – 3.5 V depending on the chosen screen-print paste. The examined Schottky contacts break down at around Vrev = – 2.5 V. Reverse bias testing of the cells proof a solid performance of the cells under reverse bias and an average conversion efficiency of = 21.2 % (AlOX) and = 20.7 % (SiON), respectively.</abstract><doi>10.4229/EUPVSEC20212021-2CO.10.2</doi><oa>free_for_read</oa></addata></record>
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identifier DOI: 10.4229/EUPVSEC20212021-2CO.10.2
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subjects back contact
Herstellung und Analyse von hocheffizienten Si-Solarzellen
Metallisierung und Strukturierung
MWT solar cells
passivation
PERC
Photovoltaik
Silicium-Photovoltaik
title Stable Reverse Bias or Integrated Bypass Diode in HIP-MWT+ Solar Cells Based on Different Industrial Rear Passivation
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-29T03%3A31%3A11IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-fraunhofer_E3A&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Stable%20Reverse%20Bias%20or%20Integrated%20Bypass%20Diode%20in%20HIP-MWT+%20Solar%20Cells%20Based%20on%20Different%20Industrial%20Rear%20Passivation&rft.au=Schweigstill,%20T&rft.date=2021&rft_id=info:doi/10.4229/EUPVSEC20212021-2CO.10.2&rft_dat=%3Cfraunhofer_E3A%3Eoai_fraunhofer_de_N_644460%3C/fraunhofer_E3A%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true