Quantitative Evaluation of Artefact Reduction by an Optimized Specimen Orientation for Metrology Based on Industrial Computed Tomography
Industrial Computed Tomography is used to solve metrological tasks in quality assurance. Although CT has many advantages like complete and non-destructive data acquisition, artefacts can occur depending on the part’s material and geometry. Moreover the extent of scanning artefacts strongly depends o...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Tagungsbericht |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!