In Situ Solar Wafer Temperature Measurement during Firing Process via Inline IR Thermography

Herein, an inline IR thermography system as an innovative application for real‐time contactless temperature measurement of wafers—both metallized and nonmetallized-during the firing process is successfully realized in an industrial firing furnace as proof of concept and example for a thermography sy...

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Bibliographische Detailangaben
Hauptverfasser: Ourinson, D, Emanuel, G, Csordás, A, Dammaß, G, Müller, H, Sternkiker, C, Clement, F, Glunz, S.W
Format: Artikel
Sprache:eng
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