Dynamic defects in photonic Floquet topological insulators

Dynamic defects in photonic Floquet topological insulators

Edge modes in topological insulators are known to be robust against defects. We investigate if this also holds true when the defect is not static, but varies in time. We study the influence of defects with time-dependent coupling on the robustness of the transport along the edge in a Floquet system...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Jörg, C, Letscher, F, Fleischhauer, M, Freymann, G. von
Format: Artikel
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Jörg, C
Letscher, F
Fleischhauer, M
Freymann, G. von
description Edge modes in topological insulators are known to be robust against defects. We investigate if this also holds true when the defect is not static, but varies in time. We study the influence of defects with time-dependent coupling on the robustness of the transport along the edge in a Floquet system of helically curved waveguides. Waveguide arrays are fabricated via direct laser writing in a negative tone photoresist. We find that single dynamic defects do not destroy the chiral edge current, even when the temporal modulation is strong. Quantitative numerical simulation of the intensity in the bulk and edge waveguides confirms our observation.
doi_str_mv 10.1088/1367-2630/aa7c82
format Article
fullrecord <record><control><sourceid>fraunhofer_E3A</sourceid><recordid>TN_cdi_fraunhofer_primary_oai_fraunhofer_de_N_470719</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>oai_fraunhofer_de_N_470719</sourcerecordid><originalsourceid>FETCH-fraunhofer_primary_oai_fraunhofer_de_N_4707193</originalsourceid><addsrcrecordid>eNqdi7EOgjAUALs4GHV37A8gLRCKripxcnJvXkoLTUoftmXg72VwcHa65C5HyJGzE2dNk_OyFllRlywHEKoptuRyWzyMVtFOG61SpNbTacCEfnWtw_esE004ocPeKnBrj7ODhCHuycaAi_rw5Y5U7f11fWQmwOwHNDrIKdgRwiIRrPzRnZZPWQkm-Ln8c_sALYhGtw</addsrcrecordid><sourcetype>Institutional Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Dynamic defects in photonic Floquet topological insulators</title><source>Fraunhofer-ePrints</source><creator>Jörg, C ; Letscher, F ; Fleischhauer, M ; Freymann, G. von</creator><creatorcontrib>Jörg, C ; Letscher, F ; Fleischhauer, M ; Freymann, G. von</creatorcontrib><description>Edge modes in topological insulators are known to be robust against defects. We investigate if this also holds true when the defect is not static, but varies in time. We study the influence of defects with time-dependent coupling on the robustness of the transport along the edge in a Floquet system of helically curved waveguides. Waveguide arrays are fabricated via direct laser writing in a negative tone photoresist. We find that single dynamic defects do not destroy the chiral edge current, even when the temporal modulation is strong. Quantitative numerical simulation of the intensity in the bulk and edge waveguides confirms our observation.</description><identifier>DOI: 10.1088/1367-2630/aa7c82</identifier><language>eng</language><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>315,780,27860</link.rule.ids><linktorsrc>$$Uhttp://publica.fraunhofer.de/documents/N-470719.html$$EView_record_in_Fraunhofer-Gesellschaft$$FView_record_in_$$GFraunhofer-Gesellschaft$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Jörg, C</creatorcontrib><creatorcontrib>Letscher, F</creatorcontrib><creatorcontrib>Fleischhauer, M</creatorcontrib><creatorcontrib>Freymann, G. von</creatorcontrib><title>Dynamic defects in photonic Floquet topological insulators</title><description>Edge modes in topological insulators are known to be robust against defects. We investigate if this also holds true when the defect is not static, but varies in time. We study the influence of defects with time-dependent coupling on the robustness of the transport along the edge in a Floquet system of helically curved waveguides. Waveguide arrays are fabricated via direct laser writing in a negative tone photoresist. We find that single dynamic defects do not destroy the chiral edge current, even when the temporal modulation is strong. Quantitative numerical simulation of the intensity in the bulk and edge waveguides confirms our observation.</description><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>AFSUM</sourceid><sourceid>E3A</sourceid><recordid>eNqdi7EOgjAUALs4GHV37A8gLRCKripxcnJvXkoLTUoftmXg72VwcHa65C5HyJGzE2dNk_OyFllRlywHEKoptuRyWzyMVtFOG61SpNbTacCEfnWtw_esE004ocPeKnBrj7ODhCHuycaAi_rw5Y5U7f11fWQmwOwHNDrIKdgRwiIRrPzRnZZPWQkm-Ln8c_sALYhGtw</recordid><startdate>2017</startdate><enddate>2017</enddate><creator>Jörg, C</creator><creator>Letscher, F</creator><creator>Fleischhauer, M</creator><creator>Freymann, G. von</creator><scope>AFSUM</scope><scope>E3A</scope></search><sort><creationdate>2017</creationdate><title>Dynamic defects in photonic Floquet topological insulators</title><author>Jörg, C ; Letscher, F ; Fleischhauer, M ; Freymann, G. von</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-fraunhofer_primary_oai_fraunhofer_de_N_4707193</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Jörg, C</creatorcontrib><creatorcontrib>Letscher, F</creatorcontrib><creatorcontrib>Fleischhauer, M</creatorcontrib><creatorcontrib>Freymann, G. von</creatorcontrib><collection>Fraunhofer-ePrints - FT</collection><collection>Fraunhofer-ePrints</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jörg, C</au><au>Letscher, F</au><au>Fleischhauer, M</au><au>Freymann, G. von</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Dynamic defects in photonic Floquet topological insulators</atitle><date>2017</date><risdate>2017</risdate><abstract>Edge modes in topological insulators are known to be robust against defects. We investigate if this also holds true when the defect is not static, but varies in time. We study the influence of defects with time-dependent coupling on the robustness of the transport along the edge in a Floquet system of helically curved waveguides. Waveguide arrays are fabricated via direct laser writing in a negative tone photoresist. We find that single dynamic defects do not destroy the chiral edge current, even when the temporal modulation is strong. Quantitative numerical simulation of the intensity in the bulk and edge waveguides confirms our observation.</abstract><doi>10.1088/1367-2630/aa7c82</doi><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier DOI: 10.1088/1367-2630/aa7c82
ispartof
issn
language eng
recordid cdi_fraunhofer_primary_oai_fraunhofer_de_N_470719
source Fraunhofer-ePrints
title Dynamic defects in photonic Floquet topological insulators
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T18%3A28%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-fraunhofer_E3A&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Dynamic%20defects%20in%20photonic%20Floquet%20topological%20insulators&rft.au=J%C3%B6rg,%20C&rft.date=2017&rft_id=info:doi/10.1088/1367-2630/aa7c82&rft_dat=%3Cfraunhofer_E3A%3Eoai_fraunhofer_de_N_470719%3C/fraunhofer_E3A%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true