X-ray photoelectron spectroscopy : methodology and application

Materiały z 15th International Conference on Defects Recognition, Imaging and Physics in Semiconductors 15-19 September 2013, Warsaw. Materials from the 15th International Conference on Defects Recognition, Imaging and Physics in Semitors 15-19 September 2013, Warsaw.

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Veröffentlicht in:	X-ray photoelectron spectroscopy : methodology and application
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description	Materiały z 15th International Conference on Defects Recognition, Imaging and Physics in Semiconductors 15-19 September 2013, Warsaw. Materials from the 15th International Conference on Defects Recognition, Imaging and Physics in Semitors 15-19 September 2013, Warsaw.
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fullrecord	<record><control><sourceid>europeana_1GC</sourceid><recordid>TN_cdi_europeana_collections_9200479_item_48385639</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>9200479_item_48385639</sourcerecordid><originalsourceid>FETCH-europeana_collections_9200479_item_483856393</originalsourceid><addsrcrecordid>eNrjZLCL0C1KrFQoyMgvyU_NSU0uKcrPUyguADOKk_MLKhWsFHJTSzLyU_Jz8tMrFRLzUhQSCwpyMpMTSzLz83gYWNMSc4pTeaE0N4ORm2uIs4duamlRfkFqYl5ifHJ-DshcoOLieEsjAwMTc8v4zJLU3HgTC2MLUzNjS2OyNAEAdpY9zg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>journal</recordtype></control><display><type>journal</type><title>X-ray photoelectron spectroscopy : methodology and application</title><source>Europeana Collections</source><description>Materiały z 15th International Conference on Defects Recognition, Imaging and Physics in Semiconductors 15-19 September 2013, Warsaw. Materials from the 15th International Conference on Defects Recognition, Imaging and Physics in Semitors 15-19 September 2013, Warsaw.</description><language>eng ; pol</language><publisher>2014</publisher><subject>Fizyka ; Physics</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttp://polona.pl/item/48385639//thumbnail/huge/?111</thumbnail><linktohtml>$$Uhttps://data.europeana.eu/item/9200479/item_48385639_$$EHTML$$P50$$Geuropeana$$Hfree_for_read</linktohtml><link.rule.ids>286,776,38496,75922</link.rule.ids><linktorsrc>$$Uhttps://data.europeana.eu/item/9200479/item_48385639_$$EView_record_in_Europeana$$FView_record_in_$$GEuropeana$$Hfree_for_read</linktorsrc></links><search><title>X-ray photoelectron spectroscopy : methodology and application</title><description>Materiały z 15th International Conference on Defects Recognition, Imaging and Physics in Semiconductors 15-19 September 2013, Warsaw. Materials from the 15th International Conference on Defects Recognition, Imaging and Physics in Semitors 15-19 September 2013, Warsaw.</description><subject>Fizyka</subject><subject>Physics</subject><fulltext>true</fulltext><rsrctype>journal</rsrctype><creationdate>2014</creationdate><recordtype>journal</recordtype><sourceid>1GC</sourceid><recordid>eNrjZLCL0C1KrFQoyMgvyU_NSU0uKcrPUyguADOKk_MLKhWsFHJTSzLyU_Jz8tMrFRLzUhQSCwpyMpMTSzLz83gYWNMSc4pTeaE0N4ORm2uIs4duamlRfkFqYl5ifHJ-DshcoOLieEsjAwMTc8v4zJLU3HgTC2MLUzNjS2OyNAEAdpY9zg</recordid><startdate>2014</startdate><enddate>2014</enddate><general>2014</general><scope>1GC</scope></search><sort><creationdate>2014</creationdate><title>X-ray photoelectron spectroscopy : methodology and application</title></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-europeana_collections_9200479_item_483856393</frbrgroupid><rsrctype>journals</rsrctype><prefilter>journals</prefilter><language>eng ; pol</language><creationdate>2014</creationdate><topic>Fizyka</topic><topic>Physics</topic><toplevel>online_resources</toplevel><collection>Europeana Collections</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><format>Journal</format><genre>journal</genre><ristype>JOUR</ristype><jtitle>X-ray photoelectron spectroscopy : methodology and application</jtitle><date>2014</date><risdate>2014</risdate><abstract>Materiały z 15th International Conference on Defects Recognition, Imaging and Physics in Semiconductors 15-19 September 2013, Warsaw. Materials from the 15th International Conference on Defects Recognition, Imaging and Physics in Semitors 15-19 September 2013, Warsaw.</abstract><pub>2014</pub><oa>free_for_read</oa></addata></record>
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recordid	cdi_europeana_collections_9200479_item_48385639
source	Europeana Collections
subjects	Fizyka Physics
title	X-ray photoelectron spectroscopy : methodology and application
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T02%3A31%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-europeana_1GC&rft_val_fmt=info:ofi/fmt:kev:mtx:Journal&rft.genre=journal&rft.jtitle=X-ray%20photoelectron%20spectroscopy%20:%20methodology%20and%20application&rft.date=2014&rft_id=info:doi/&rft_dat=%3Ceuropeana_1GC%3E9200479_item_48385639%3C/europeana_1GC%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true