A novel approach of immittance-spectra analysis and how it resolves a decade-old deviation of the Frenkel-Poole model :Utilising process-specific physical models to find the electrical equivalent circuit representing the underlying physics in immittance spectroscopy
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| creator | Amani, Julian Alexander |
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ger</language><creationdate>2017</creationdate><topic>Analysis of immittance data</topic><topic>electrical equivalent ciruit (EEC)</topic><topic>Frenkel-Poole model</topic><topic>immittance spectroscopy</topic><topic>impedance spectroscopy</topic><topic>metal-insulator-semiconductor (MIS) device characterisation</topic><topic>metal-insulator-semiconductor (MIS) device characterization</topic><topic>Physik</topic><topic>tetrahedral-amorphous carbon (ta-C)</topic><topic>unambiguous circuits</topic><toplevel>online_resources</toplevel><creatorcontrib>Amani, Julian Alexander</creatorcontrib><collection>Europeana Collections</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Amani, Julian Alexander</au><format>book</format><genre>unknown</genre><ristype>GEN</ristype><btitle>A novel approach of immittance-spectra analysis and how it resolves a decade-old deviation of the Frenkel-Poole model :Utilising process-specific physical models to find the electrical equivalent circuit representing the underlying physics in immittance spectroscopy</btitle><date>2017</date><risdate>2017</risdate><oa>free_for_read</oa></addata></record> |
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| language | eng ; ger |
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| source | Europeana Collections |
| subjects | Analysis of immittance data electrical equivalent ciruit (EEC) Frenkel-Poole model immittance spectroscopy impedance spectroscopy metal-insulator-semiconductor (MIS) device characterisation metal-insulator-semiconductor (MIS) device characterization Physik tetrahedral-amorphous carbon (ta-C) unambiguous circuits |
| title | A novel approach of immittance-spectra analysis and how it resolves a decade-old deviation of the Frenkel-Poole model :Utilising process-specific physical models to find the electrical equivalent circuit representing the underlying physics in immittance spectroscopy |
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