MATERIAL CHARACTERISATION SYSTEM AND METHOD
The invention provides a system and method for characterising at least part of a material comprising: a source of incident X-rays (4, 28) configured to irradiate at least part of the material; one or more detectors (300,302,312,1701,1704,1600,1607,1608,1604) adapted to detect radiation emanating fro...
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| Format: | Patent |
| Sprache: | eng |
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