Fluorometric method for monitoring a clean-in-place system

Fluorometric method for monitoring a clean-in-place system

The invention pertains to a method for fluorometrically monitoring a Clean-In-Place ("CIP") system and for fluorometrically monitoring the dosage of chemical added to the CIP system. Monitoring of the said CIP system can be based upon fluormetrically monitoring the fluorescent tracer, chem...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: HOLTSLANDER, JOHN, HOOTS, JOHN E, VAN CAMP, JAMES R
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator HOLTSLANDER, JOHN
HOOTS, JOHN E
VAN CAMP, JAMES R
description The invention pertains to a method for fluorometrically monitoring a Clean-In-Place ("CIP") system and for fluorometrically monitoring the dosage of chemical added to the CIP system. Monitoring of the said CIP system can be based upon fluormetrically monitoring the fluorescent tracer, chemical or both, which are added to the CIP system.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_ZA200800173B</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>ZA200800173B</sourcerecordid><originalsourceid>FETCH-epo_espacenet_ZA200800173B3</originalsourceid><addsrcrecordid>eNrjZLByyynNL8rPTS0pykxWAFIZ-SkKaflFCrn5eZkl-UWZeekKiQrJOamJebqZeboFOYnJqQrFlcUlqbk8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uACoMi-1JD7K0cjAwMLAwNDc2MmYGDUAjmwvKQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Fluorometric method for monitoring a clean-in-place system</title><source>esp@cenet</source><creator>HOLTSLANDER, JOHN ; HOOTS, JOHN E ; VAN CAMP, JAMES R</creator><creatorcontrib>HOLTSLANDER, JOHN ; HOOTS, JOHN E ; VAN CAMP, JAMES R</creatorcontrib><description>The invention pertains to a method for fluorometrically monitoring a Clean-In-Place ("CIP") system and for fluorometrically monitoring the dosage of chemical added to the CIP system. Monitoring of the said CIP system can be based upon fluormetrically monitoring the fluorescent tracer, chemical or both, which are added to the CIP system.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20081231&amp;DB=EPODOC&amp;CC=ZA&amp;NR=200800173B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20081231&amp;DB=EPODOC&amp;CC=ZA&amp;NR=200800173B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HOLTSLANDER, JOHN</creatorcontrib><creatorcontrib>HOOTS, JOHN E</creatorcontrib><creatorcontrib>VAN CAMP, JAMES R</creatorcontrib><title>Fluorometric method for monitoring a clean-in-place system</title><description>The invention pertains to a method for fluorometrically monitoring a Clean-In-Place ("CIP") system and for fluorometrically monitoring the dosage of chemical added to the CIP system. Monitoring of the said CIP system can be based upon fluormetrically monitoring the fluorescent tracer, chemical or both, which are added to the CIP system.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLByyynNL8rPTS0pykxWAFIZ-SkKaflFCrn5eZkl-UWZeekKiQrJOamJebqZeboFOYnJqQrFlcUlqbk8DKxpiTnFqbxQmptB0c01xNlDN7UgPz61uACoMi-1JD7K0cjAwMLAwNDc2MmYGDUAjmwvKQ</recordid><startdate>20081231</startdate><enddate>20081231</enddate><creator>HOLTSLANDER, JOHN</creator><creator>HOOTS, JOHN E</creator><creator>VAN CAMP, JAMES R</creator><scope>EVB</scope></search><sort><creationdate>20081231</creationdate><title>Fluorometric method for monitoring a clean-in-place system</title><author>HOLTSLANDER, JOHN ; HOOTS, JOHN E ; VAN CAMP, JAMES R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_ZA200800173B3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2008</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HOLTSLANDER, JOHN</creatorcontrib><creatorcontrib>HOOTS, JOHN E</creatorcontrib><creatorcontrib>VAN CAMP, JAMES R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HOLTSLANDER, JOHN</au><au>HOOTS, JOHN E</au><au>VAN CAMP, JAMES R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Fluorometric method for monitoring a clean-in-place system</title><date>2008-12-31</date><risdate>2008</risdate><abstract>The invention pertains to a method for fluorometrically monitoring a Clean-In-Place ("CIP") system and for fluorometrically monitoring the dosage of chemical added to the CIP system. Monitoring of the said CIP system can be based upon fluormetrically monitoring the fluorescent tracer, chemical or both, which are added to the CIP system.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_ZA200800173B
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Fluorometric method for monitoring a clean-in-place system
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T02%3A17%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HOLTSLANDER,%20JOHN&rft.date=2008-12-31&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EZA200800173B%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true