INSPECTION METHOD FOR MICROORGANISMS AND THE LIKE, AND UNIT THEREFOR

An inspection method for microorganisms and the like and a unit therefor comprising a culturing device, an image grabbing device, a computation processing device and a device for disposal of microorganisms and the like, which method utilizes such devices in order to predict in advance a state after...

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Bibliographische Detailangaben
Hauptverfasser: TORAI, YOSHIAKI, OMI, AKIHIRO, HARA, AKIKUNI, ASANO, TOSHIMITSU
Format: Patent
Sprache:eng ; fre ; jpn
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