ELECTRO-OPTICAL SYSTEM FOR GAUGING SURFACE PROFILES

ELECTRO-OPTICAL SYSTEM FOR GAUGING SURFACE PROFILES

An electro-optical system (400) for gauging the surface profile (424) on a test object (426) includes an image sensor that detects radiation (428) naturally emanating from the test object surface. An attenuating medium (414) is provided to attenuate the radiation as a function of the distance that t...

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Hauptverfasser: LADEWSKI, THEODORE, B, BUSCH, GARLAND, E, DOWNWARD, JAMES, G, LYSOGORSKI, CHARLES, D, GOTTSCHALK, PAUL, G
Format: Patent
Sprache:eng ; fre
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator LADEWSKI, THEODORE, B
BUSCH, GARLAND, E
DOWNWARD, JAMES, G
LYSOGORSKI, CHARLES, D
GOTTSCHALK, PAUL, G
description An electro-optical system (400) for gauging the surface profile (424) on a test object (426) includes an image sensor that detects radiation (428) naturally emanating from the test object surface. An attenuating medium (414) is provided to attenuate the radiation as a function of the distance that the radiation travels through the medium (414). The intensity values associated with the radiation across the surface enables the system (400) to quantitatively determine and gauge the surface profile. Inventive means (430, 432) and associated methodology are disclosed that enable the system to correct for optically generated errors in the resulting image where those errors are caused by the nature of the surface being gauged or the components of the gauging system. Système électro-optique (400) de calibrage des profils de surface (424) d'une éprouvette (426). Ce système comporte un capteur d'image qui capte le rayonnement (428) émanant naturellement de la surface de l'éprouvette. Un milieu atténuateur (414) atténue ce rayonnement en fonction de la distance selon laquelle celui-ci se déplace à travers le milieu. Les valeurs d'intensité associées au rayonnement à travers la surface permettent au système (400) de déterminer quantitativement et de calibrer le profil de surface. L'invention porte également sur des moyens novateurs (430 à 432) et une méthodologie associée permettant au système de corriger les erreurs d'origine optique dans l'image résultante lorsque ces erreurs sont causés par la nature de la surface à calibrer ou les composants du système de calibrage.
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title ELECTRO-OPTICAL SYSTEM FOR GAUGING SURFACE PROFILES
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