RETICLE DESIGN FOR MINIMIZING THERMAL STRAIN

A method for reducing thermal strain in a reticle includes determining a target operating temperature of a reticle during use of the reticle, adjusting a thermal expansion (TE) property of the reticle based on the target operating temperature of the reticle, and exposing the reticle to radiation to...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: MAKARENKO, Ksenia, VAN DER SANDEN, Jacobus, FINNEY, Nathan, RADEMAKER, Justin, VAN DE KERKHOF, Marcus, DEENEN, Daniel, LIPSON, Matthew, MELFI, JR, BAKER, Lowell
Format: Patent
Sprache:eng ; fre
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator MAKARENKO, Ksenia
VAN DER SANDEN, Jacobus
FINNEY, Nathan
RADEMAKER, Justin
VAN DE KERKHOF, Marcus
DEENEN, Daniel
LIPSON, Matthew
MELFI, JR
BAKER, Lowell
description A method for reducing thermal strain in a reticle includes determining a target operating temperature of a reticle during use of the reticle, adjusting a thermal expansion (TE) property of the reticle based on the target operating temperature of the reticle, and exposing the reticle to radiation to perform a manufacturing process. Un procédé de réduction de contrainte thermique dans un réticule consiste à déterminer une température de fonctionnement cible d'un réticule pendant l'utilisation du réticule, à ajuster une propriété d'expansion thermique (TE) du réticule sur la base de la température de fonctionnement cible du réticule, et à exposer le réticule à un rayonnement pour mettre en œuvre un processus de fabrication.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_WO2024260733A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>WO2024260733A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_WO2024260733A13</originalsourceid><addsrcrecordid>eNrjZNAJcg3xdPZxVXBxDfZ091Nw8w9S8PX08_T1jPL0c1cI8XAN8nX0UQgOCXL09ONhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHh_kYGRiZGZgbmxsaOhsbEqQIAL3QmHw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>RETICLE DESIGN FOR MINIMIZING THERMAL STRAIN</title><source>esp@cenet</source><creator>MAKARENKO, Ksenia ; VAN DER SANDEN, Jacobus ; FINNEY, Nathan ; RADEMAKER, Justin ; VAN DE KERKHOF, Marcus ; DEENEN, Daniel ; LIPSON, Matthew ; MELFI, JR ; BAKER, Lowell</creator><creatorcontrib>MAKARENKO, Ksenia ; VAN DER SANDEN, Jacobus ; FINNEY, Nathan ; RADEMAKER, Justin ; VAN DE KERKHOF, Marcus ; DEENEN, Daniel ; LIPSON, Matthew ; MELFI, JR ; BAKER, Lowell</creatorcontrib><description>A method for reducing thermal strain in a reticle includes determining a target operating temperature of a reticle during use of the reticle, adjusting a thermal expansion (TE) property of the reticle based on the target operating temperature of the reticle, and exposing the reticle to radiation to perform a manufacturing process. Un procédé de réduction de contrainte thermique dans un réticule consiste à déterminer une température de fonctionnement cible d'un réticule pendant l'utilisation du réticule, à ajuster une propriété d'expansion thermique (TE) du réticule sur la base de la température de fonctionnement cible du réticule, et à exposer le réticule à un rayonnement pour mettre en œuvre un processus de fabrication.</description><language>eng ; fre</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; CINEMATOGRAPHY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20241226&amp;DB=EPODOC&amp;CC=WO&amp;NR=2024260733A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20241226&amp;DB=EPODOC&amp;CC=WO&amp;NR=2024260733A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MAKARENKO, Ksenia</creatorcontrib><creatorcontrib>VAN DER SANDEN, Jacobus</creatorcontrib><creatorcontrib>FINNEY, Nathan</creatorcontrib><creatorcontrib>RADEMAKER, Justin</creatorcontrib><creatorcontrib>VAN DE KERKHOF, Marcus</creatorcontrib><creatorcontrib>DEENEN, Daniel</creatorcontrib><creatorcontrib>LIPSON, Matthew</creatorcontrib><creatorcontrib>MELFI, JR</creatorcontrib><creatorcontrib>BAKER, Lowell</creatorcontrib><title>RETICLE DESIGN FOR MINIMIZING THERMAL STRAIN</title><description>A method for reducing thermal strain in a reticle includes determining a target operating temperature of a reticle during use of the reticle, adjusting a thermal expansion (TE) property of the reticle based on the target operating temperature of the reticle, and exposing the reticle to radiation to perform a manufacturing process. Un procédé de réduction de contrainte thermique dans un réticule consiste à déterminer une température de fonctionnement cible d'un réticule pendant l'utilisation du réticule, à ajuster une propriété d'expansion thermique (TE) du réticule sur la base de la température de fonctionnement cible du réticule, et à exposer le réticule à un rayonnement pour mettre en œuvre un processus de fabrication.</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAJcg3xdPZxVXBxDfZ091Nw8w9S8PX08_T1jPL0c1cI8XAN8nX0UQgOCXL09ONhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHh_kYGRiZGZgbmxsaOhsbEqQIAL3QmHw</recordid><startdate>20241226</startdate><enddate>20241226</enddate><creator>MAKARENKO, Ksenia</creator><creator>VAN DER SANDEN, Jacobus</creator><creator>FINNEY, Nathan</creator><creator>RADEMAKER, Justin</creator><creator>VAN DE KERKHOF, Marcus</creator><creator>DEENEN, Daniel</creator><creator>LIPSON, Matthew</creator><creator>MELFI, JR</creator><creator>BAKER, Lowell</creator><scope>EVB</scope></search><sort><creationdate>20241226</creationdate><title>RETICLE DESIGN FOR MINIMIZING THERMAL STRAIN</title><author>MAKARENKO, Ksenia ; VAN DER SANDEN, Jacobus ; FINNEY, Nathan ; RADEMAKER, Justin ; VAN DE KERKHOF, Marcus ; DEENEN, Daniel ; LIPSON, Matthew ; MELFI, JR ; BAKER, Lowell</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2024260733A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2024</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>MAKARENKO, Ksenia</creatorcontrib><creatorcontrib>VAN DER SANDEN, Jacobus</creatorcontrib><creatorcontrib>FINNEY, Nathan</creatorcontrib><creatorcontrib>RADEMAKER, Justin</creatorcontrib><creatorcontrib>VAN DE KERKHOF, Marcus</creatorcontrib><creatorcontrib>DEENEN, Daniel</creatorcontrib><creatorcontrib>LIPSON, Matthew</creatorcontrib><creatorcontrib>MELFI, JR</creatorcontrib><creatorcontrib>BAKER, Lowell</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MAKARENKO, Ksenia</au><au>VAN DER SANDEN, Jacobus</au><au>FINNEY, Nathan</au><au>RADEMAKER, Justin</au><au>VAN DE KERKHOF, Marcus</au><au>DEENEN, Daniel</au><au>LIPSON, Matthew</au><au>MELFI, JR</au><au>BAKER, Lowell</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>RETICLE DESIGN FOR MINIMIZING THERMAL STRAIN</title><date>2024-12-26</date><risdate>2024</risdate><abstract>A method for reducing thermal strain in a reticle includes determining a target operating temperature of a reticle during use of the reticle, adjusting a thermal expansion (TE) property of the reticle based on the target operating temperature of the reticle, and exposing the reticle to radiation to perform a manufacturing process. Un procédé de réduction de contrainte thermique dans un réticule consiste à déterminer une température de fonctionnement cible d'un réticule pendant l'utilisation du réticule, à ajuster une propriété d'expansion thermique (TE) du réticule sur la base de la température de fonctionnement cible du réticule, et à exposer le réticule à un rayonnement pour mettre en œuvre un processus de fabrication.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre
recordid cdi_epo_espacenet_WO2024260733A1
source esp@cenet
subjects APPARATUS SPECIALLY ADAPTED THEREFOR
CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHY
MATERIALS THEREFOR
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
title RETICLE DESIGN FOR MINIMIZING THERMAL STRAIN
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T06%3A16%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MAKARENKO,%20Ksenia&rft.date=2024-12-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EWO2024260733A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true