INTERFEROMETER AND METHOD FOR GENERATING AN INTERFERENCE PATTERN
The disclosure related to an interferometer comprising a first mirror array comprising a first mirror and a second mirror; and an adjustable beam-steering device. The beam steering device configured to receive a first beam and a second beam, split from a source beam; steer the first beam onto the fi...
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| creator | BOUALAM, Abderrahim ROWLANDS, Christopher HIGHAM, Paul GUO, Ke |
| description | The disclosure related to an interferometer comprising a first mirror array comprising a first mirror and a second mirror; and an adjustable beam-steering device. The beam steering device configured to receive a first beam and a second beam, split from a source beam; steer the first beam onto the first mirror of the first mirror array; and steer the second beam onto the second mirror of the first mirror array. The first mirror array is configured to reflect, by the first mirror, the first beam, and reflect, by the second mirror, the second beam, to combine the first beam and the second beam to generate an interference pattern.
L'invention concerne un interféromètre comprenant un premier réseau de miroirs composé de premier et second miroirs, ainsi qu'un dispositif de direction de faisceau réglable. Le dispositif de direction de faisceau est configuré pour : recevoir des premier et second faisceaux, divisés à partir d'un faisceau source ; diriger le premier faisceau sur le premier miroir du premier réseau de miroirs ; et diriger le second faisceau sur le second miroir du premier réseau de miroirs. Le premier réseau de miroirs est configuré pour réfléchir le premier faisceau à l'aide du premier miroir et pour réfléchir le second faisceau à l'aide du second miroir, afin de combiner les premier et second faisceaux et de générer un motif d'interférence. |
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L'invention concerne un interféromètre comprenant un premier réseau de miroirs composé de premier et second miroirs, ainsi qu'un dispositif de direction de faisceau réglable. Le dispositif de direction de faisceau est configuré pour : recevoir des premier et second faisceaux, divisés à partir d'un faisceau source ; diriger le premier faisceau sur le premier miroir du premier réseau de miroirs ; et diriger le second faisceau sur le second miroir du premier réseau de miroirs. Le premier réseau de miroirs est configuré pour réfléchir le premier faisceau à l'aide du premier miroir et pour réfléchir le second faisceau à l'aide du second miroir, afin de combiner les premier et second faisceaux et de générer un motif d'interférence.</description><language>eng ; fre</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241031&DB=EPODOC&CC=WO&NR=2024223915A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241031&DB=EPODOC&CC=WO&NR=2024223915A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BOUALAM, Abderrahim</creatorcontrib><creatorcontrib>ROWLANDS, Christopher</creatorcontrib><creatorcontrib>HIGHAM, Paul</creatorcontrib><creatorcontrib>GUO, Ke</creatorcontrib><title>INTERFEROMETER AND METHOD FOR GENERATING AN INTERFERENCE PATTERN</title><description>The disclosure related to an interferometer comprising a first mirror array comprising a first mirror and a second mirror; and an adjustable beam-steering device. The beam steering device configured to receive a first beam and a second beam, split from a source beam; steer the first beam onto the first mirror of the first mirror array; and steer the second beam onto the second mirror of the first mirror array. The first mirror array is configured to reflect, by the first mirror, the first beam, and reflect, by the second mirror, the second beam, to combine the first beam and the second beam to generate an interference pattern.
L'invention concerne un interféromètre comprenant un premier réseau de miroirs composé de premier et second miroirs, ainsi qu'un dispositif de direction de faisceau réglable. Le dispositif de direction de faisceau est configuré pour : recevoir des premier et second faisceaux, divisés à partir d'un faisceau source ; diriger le premier faisceau sur le premier miroir du premier réseau de miroirs ; et diriger le second faisceau sur le second miroir du premier réseau de miroirs. Le premier réseau de miroirs est configuré pour réfléchir le premier faisceau à l'aide du premier miroir et pour réfléchir le second faisceau à l'aide du second miroir, afin de combiner les premier et second faisceaux et de générer un motif d'interférence.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHDw9AtxDXJzDfL3dQUyFBz9XBSALA9_FwU3_yAFd1c_1yDHEE8_d6CMAkytq5-zq0KAYwiQ58fDwJqWmFOcyguluRmU3VxDnD10Uwvy41OLCxKTU_NSS-LD_Y0MjEyMjIwtDU0dDY2JUwUAYOorpA</recordid><startdate>20241031</startdate><enddate>20241031</enddate><creator>BOUALAM, Abderrahim</creator><creator>ROWLANDS, Christopher</creator><creator>HIGHAM, Paul</creator><creator>GUO, Ke</creator><scope>EVB</scope></search><sort><creationdate>20241031</creationdate><title>INTERFEROMETER AND METHOD FOR GENERATING AN INTERFERENCE PATTERN</title><author>BOUALAM, Abderrahim ; ROWLANDS, Christopher ; HIGHAM, Paul ; GUO, Ke</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2024223915A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>BOUALAM, Abderrahim</creatorcontrib><creatorcontrib>ROWLANDS, Christopher</creatorcontrib><creatorcontrib>HIGHAM, Paul</creatorcontrib><creatorcontrib>GUO, Ke</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BOUALAM, Abderrahim</au><au>ROWLANDS, Christopher</au><au>HIGHAM, Paul</au><au>GUO, Ke</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INTERFEROMETER AND METHOD FOR GENERATING AN INTERFERENCE PATTERN</title><date>2024-10-31</date><risdate>2024</risdate><abstract>The disclosure related to an interferometer comprising a first mirror array comprising a first mirror and a second mirror; and an adjustable beam-steering device. The beam steering device configured to receive a first beam and a second beam, split from a source beam; steer the first beam onto the first mirror of the first mirror array; and steer the second beam onto the second mirror of the first mirror array. The first mirror array is configured to reflect, by the first mirror, the first beam, and reflect, by the second mirror, the second beam, to combine the first beam and the second beam to generate an interference pattern.
L'invention concerne un interféromètre comprenant un premier réseau de miroirs composé de premier et second miroirs, ainsi qu'un dispositif de direction de faisceau réglable. Le dispositif de direction de faisceau est configuré pour : recevoir des premier et second faisceaux, divisés à partir d'un faisceau source ; diriger le premier faisceau sur le premier miroir du premier réseau de miroirs ; et diriger le second faisceau sur le second miroir du premier réseau de miroirs. Le premier réseau de miroirs est configuré pour réfléchir le premier faisceau à l'aide du premier miroir et pour réfléchir le second faisceau à l'aide du second miroir, afin de combiner les premier et second faisceaux et de générer un motif d'interférence.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING |
| title | INTERFEROMETER AND METHOD FOR GENERATING AN INTERFERENCE PATTERN |
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