METHOD FOR ETCHING HIGH ASPECT RATIO STRUCTURES

A method and system for etching high aspect ratio structures in a semiconducting processing chamber are disclosed herein. In one example, a method of patterning a substrate comprises etching the substrate to form a recess, depositing a passivation layer on sidewalls of the recess, treating the passi...

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Bibliographische Detailangaben
Hauptverfasser: ZHOU, Hailong, LIU, Tong, CHOI, Jayoung, PARK, Sangjun, FU, Qian, AGARWAL, Radhe, QIAO, Feng
Format: Patent
Sprache:eng ; fre
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