METHODS AND APPARATUS FOR SOURCE MEASUREMENT UNIT (SMU) OPERATION
An apparatus includes a circuit (300) including a force amplifier (104) having an output (304), a resistor (106) having a first terminal (306) coupled to the output (304) of the force amplifier (104), and a second terminal (308). The circuit (300) also includes a diode clamp (302) including a first...
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| creator | DUDAR, Taras SHAW, Rahul GOSH, Abhishek THINAKARAN, Rajavelu NANDI, Gautam SRINIVASAN, Hariharan |
| description | An apparatus includes a circuit (300) including a force amplifier (104) having an output (304), a resistor (106) having a first terminal (306) coupled to the output (304) of the force amplifier (104), and a second terminal (308). The circuit (300) also includes a diode clamp (302) including a first diode (310) having a first terminal (314) coupled to the first terminal (306) of the resistor (106), and having a second terminal (316) coupled to the second terminal (308) of the resistor (106), the first diode (310) having a first orientation. The diode clamp (302) also includes a second diode (312) coupled in parallel with the first diode (310) between the first (306) and second terminals (308) of the resistor (106), the second diode (312) having a second orientation opposite than the first diode (310).
Un appareil comprend un circuit (300) comprenant un amplificateur de force (104) ayant une sortie (304), une résistance (106) ayant une première borne (306) couplée à la sortie (304) de l'amplificateur de force (104), et une seconde borne (308). Le circuit (300) comprend également un coupleur de diodes (302) comprenant une première diode (310) ayant une première borne (314) couplée à la première borne (306) de la résistance (106), et ayant une seconde borne (316) couplée à la seconde borne (308) de la résistance (106), la première diode (310) ayant une première orientation. Le coupleur de diodes (302) comprend également une seconde diode (312) couplée en parallèle à la première diode (310) entre les première (306) et seconde bornes (308) de la résistance (106), la seconde diode (312) ayant une seconde orientation opposée à celle de la première diode (310). |
| format | Patent |
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Un appareil comprend un circuit (300) comprenant un amplificateur de force (104) ayant une sortie (304), une résistance (106) ayant une première borne (306) couplée à la sortie (304) de l'amplificateur de force (104), et une seconde borne (308). Le circuit (300) comprend également un coupleur de diodes (302) comprenant une première diode (310) ayant une première borne (314) couplée à la première borne (306) de la résistance (106), et ayant une seconde borne (316) couplée à la seconde borne (308) de la résistance (106), la première diode (310) ayant une première orientation. Le coupleur de diodes (302) comprend également une seconde diode (312) couplée en parallèle à la première diode (310) entre les première (306) et seconde bornes (308) de la résistance (106), la seconde diode (312) ayant une seconde orientation opposée à celle de la première diode (310).</description><language>eng ; fre</language><subject>AMPLIFIERS ; BASIC ELECTRONIC CIRCUITRY ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240919&DB=EPODOC&CC=WO&NR=2024192317A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240919&DB=EPODOC&CC=WO&NR=2024192317A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DUDAR, Taras</creatorcontrib><creatorcontrib>SHAW, Rahul</creatorcontrib><creatorcontrib>GOSH, Abhishek</creatorcontrib><creatorcontrib>THINAKARAN, Rajavelu</creatorcontrib><creatorcontrib>NANDI, Gautam</creatorcontrib><creatorcontrib>SRINIVASAN, Hariharan</creatorcontrib><title>METHODS AND APPARATUS FOR SOURCE MEASUREMENT UNIT (SMU) OPERATION</title><description>An apparatus includes a circuit (300) including a force amplifier (104) having an output (304), a resistor (106) having a first terminal (306) coupled to the output (304) of the force amplifier (104), and a second terminal (308). The circuit (300) also includes a diode clamp (302) including a first diode (310) having a first terminal (314) coupled to the first terminal (306) of the resistor (106), and having a second terminal (316) coupled to the second terminal (308) of the resistor (106), the first diode (310) having a first orientation. The diode clamp (302) also includes a second diode (312) coupled in parallel with the first diode (310) between the first (306) and second terminals (308) of the resistor (106), the second diode (312) having a second orientation opposite than the first diode (310).
Un appareil comprend un circuit (300) comprenant un amplificateur de force (104) ayant une sortie (304), une résistance (106) ayant une première borne (306) couplée à la sortie (304) de l'amplificateur de force (104), et une seconde borne (308). Le circuit (300) comprend également un coupleur de diodes (302) comprenant une première diode (310) ayant une première borne (314) couplée à la première borne (306) de la résistance (106), et ayant une seconde borne (316) couplée à la seconde borne (308) de la résistance (106), la première diode (310) ayant une première orientation. Le coupleur de diodes (302) comprend également une seconde diode (312) couplée en parallèle à la première diode (310) entre les première (306) et seconde bornes (308) de la résistance (106), la seconde diode (312) ayant une seconde orientation opposée à celle de la première diode (310).</description><subject>AMPLIFIERS</subject><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHD0dQ3x8HcJVnD0c1FwDAhwDHIMCQ1WcPMPUgj2Dw1ydlXwdXUMDg1y9XX1C1EI9fMMUdAI9g3VVPAPcAUq9fT342FgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8eH-RgZGJoaWRsaG5o6GxsSpAgCGZyvj</recordid><startdate>20240919</startdate><enddate>20240919</enddate><creator>DUDAR, Taras</creator><creator>SHAW, Rahul</creator><creator>GOSH, Abhishek</creator><creator>THINAKARAN, Rajavelu</creator><creator>NANDI, Gautam</creator><creator>SRINIVASAN, Hariharan</creator><scope>EVB</scope></search><sort><creationdate>20240919</creationdate><title>METHODS AND APPARATUS FOR SOURCE MEASUREMENT UNIT (SMU) OPERATION</title><author>DUDAR, Taras ; SHAW, Rahul ; GOSH, Abhishek ; THINAKARAN, Rajavelu ; NANDI, Gautam ; SRINIVASAN, Hariharan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2024192317A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2024</creationdate><topic>AMPLIFIERS</topic><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>DUDAR, Taras</creatorcontrib><creatorcontrib>SHAW, Rahul</creatorcontrib><creatorcontrib>GOSH, Abhishek</creatorcontrib><creatorcontrib>THINAKARAN, Rajavelu</creatorcontrib><creatorcontrib>NANDI, Gautam</creatorcontrib><creatorcontrib>SRINIVASAN, Hariharan</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DUDAR, Taras</au><au>SHAW, Rahul</au><au>GOSH, Abhishek</au><au>THINAKARAN, Rajavelu</au><au>NANDI, Gautam</au><au>SRINIVASAN, Hariharan</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHODS AND APPARATUS FOR SOURCE MEASUREMENT UNIT (SMU) OPERATION</title><date>2024-09-19</date><risdate>2024</risdate><abstract>An apparatus includes a circuit (300) including a force amplifier (104) having an output (304), a resistor (106) having a first terminal (306) coupled to the output (304) of the force amplifier (104), and a second terminal (308). The circuit (300) also includes a diode clamp (302) including a first diode (310) having a first terminal (314) coupled to the first terminal (306) of the resistor (106), and having a second terminal (316) coupled to the second terminal (308) of the resistor (106), the first diode (310) having a first orientation. The diode clamp (302) also includes a second diode (312) coupled in parallel with the first diode (310) between the first (306) and second terminals (308) of the resistor (106), the second diode (312) having a second orientation opposite than the first diode (310).
Un appareil comprend un circuit (300) comprenant un amplificateur de force (104) ayant une sortie (304), une résistance (106) ayant une première borne (306) couplée à la sortie (304) de l'amplificateur de force (104), et une seconde borne (308). Le circuit (300) comprend également un coupleur de diodes (302) comprenant une première diode (310) ayant une première borne (314) couplée à la première borne (306) de la résistance (106), et ayant une seconde borne (316) couplée à la seconde borne (308) de la résistance (106), la première diode (310) ayant une première orientation. Le coupleur de diodes (302) comprend également une seconde diode (312) couplée en parallèle à la première diode (310) entre les première (306) et seconde bornes (308) de la résistance (106), la seconde diode (312) ayant une seconde orientation opposée à celle de la première diode (310).</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | AMPLIFIERS BASIC ELECTRONIC CIRCUITRY ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | METHODS AND APPARATUS FOR SOURCE MEASUREMENT UNIT (SMU) OPERATION |
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