FPGA STORAGE UNIT FAILURE ANALYSIS METHOD AND APPARATUS, ELECTRONIC DEVICE, AND STORAGE MEDIUM

The present application relates to the field of semiconductor device testing, and discloses an FPGA storage unit failure analysis method and apparatus, an electronic device, and a storage medium. The FPGA storage unit failure analysis method provided by the present application comprises: exciting al...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HUANG, Shijun, BAO, Chaowei, ZHANG, Xuhua
Format:	Patent
Sprache:	chi ; eng ; fre
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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