SURFACE OBSERVATION METHOD
This surface observation method comprises a step a) and a step b). In the step a), materials including one or more kinds of solid light-emitting dye molecules are accumulated in a region, of a substrate or a structure on the substrate, having an abnormal shape. In the step b), a fluorescent image of...
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creator | OOWADA, Shin ASAKO, Ryuichi YUHARA, Kazuhiro SHIMURA, Satoru ITO, Shunichiro CHUJO, Yoshiki TANAKA, Kazuo |
description | This surface observation method comprises a step a) and a step b). In the step a), materials including one or more kinds of solid light-emitting dye molecules are accumulated in a region, of a substrate or a structure on the substrate, having an abnormal shape. In the step b), a fluorescent image of the solid light-emitting dye molecules is acquired by applying illumination light to the region, of the substrate or the structure on the substrate, having the abnormal shape.
Le présent procédé d'observation de surface comprend une étape a) et une étape b). Dans l'étape a), des matériaux comprenant un ou plusieurs types de molécules de colorant solide émettant de la lumière sont accumulés dans une région d'un substrat ou d'une structure sur le substrat qui présente une forme anormale. Dans l'étape b), une image fluorescente des molécules de colorant solide émettant de la lumière est acquise en appliquant une lumière d'éclairage sur la région du substrat ou de la structure sur le substrat qui a la forme anormale.
表面観測方法は、工程a)および工程b)を含む。工程a)では、基板または基板上の構造物における異常形状の領域に、少なくとも1種類以上の固体発光性色素分子を含む材料を集積させる。工程b)では、基板または基板上の構造物における異常形状の領域に照明光を照射し、固体発光性色素分子の蛍光像を取得する。 |
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Le présent procédé d'observation de surface comprend une étape a) et une étape b). Dans l'étape a), des matériaux comprenant un ou plusieurs types de molécules de colorant solide émettant de la lumière sont accumulés dans une région d'un substrat ou d'une structure sur le substrat qui présente une forme anormale. Dans l'étape b), une image fluorescente des molécules de colorant solide émettant de la lumière est acquise en appliquant une lumière d'éclairage sur la région du substrat ou de la structure sur le substrat qui a la forme anormale.
表面観測方法は、工程a)および工程b)を含む。工程a)では、基板または基板上の構造物における異常形状の領域に、少なくとも1種類以上の固体発光性色素分子を含む材料を集積させる。工程b)では、基板または基板上の構造物における異常形状の領域に照明光を照射し、固体発光性色素分子の蛍光像を取得する。</description><language>eng ; fre ; jpn</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; BASIC ELECTRIC ELEMENTS ; CINEMATOGRAPHY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; ELECTROGRAPHY ; HOLOGRAPHY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MATERIALS THEREFOR ; MEASURING ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240411&DB=EPODOC&CC=WO&NR=2024075598A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240411&DB=EPODOC&CC=WO&NR=2024075598A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OOWADA, Shin</creatorcontrib><creatorcontrib>ASAKO, Ryuichi</creatorcontrib><creatorcontrib>YUHARA, Kazuhiro</creatorcontrib><creatorcontrib>SHIMURA, Satoru</creatorcontrib><creatorcontrib>ITO, Shunichiro</creatorcontrib><creatorcontrib>CHUJO, Yoshiki</creatorcontrib><creatorcontrib>TANAKA, Kazuo</creatorcontrib><title>SURFACE OBSERVATION METHOD</title><description>This surface observation method comprises a step a) and a step b). In the step a), materials including one or more kinds of solid light-emitting dye molecules are accumulated in a region, of a substrate or a structure on the substrate, having an abnormal shape. In the step b), a fluorescent image of the solid light-emitting dye molecules is acquired by applying illumination light to the region, of the substrate or the structure on the substrate, having the abnormal shape.
Le présent procédé d'observation de surface comprend une étape a) et une étape b). Dans l'étape a), des matériaux comprenant un ou plusieurs types de molécules de colorant solide émettant de la lumière sont accumulés dans une région d'un substrat ou d'une structure sur le substrat qui présente une forme anormale. Dans l'étape b), une image fluorescente des molécules de colorant solide émettant de la lumière est acquise en appliquant une lumière d'éclairage sur la région du substrat ou de la structure sur le substrat qui a la forme anormale.
表面観測方法は、工程a)および工程b)を含む。工程a)では、基板または基板上の構造物における異常形状の領域に、少なくとも1種類以上の固体発光性色素分子を含む材料を集積させる。工程b)では、基板または基板上の構造物における異常形状の領域に照明光を照射し、固体発光性色素分子の蛍光像を取得する。</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MATERIALS THEREFOR</subject><subject>MEASURING</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAKDg1yc3R2VfB3CnYNCnMM8fT3U_B1DfHwd-FhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHh_kYGRiYG5qamlhaOhsbEqQIAwIYhWw</recordid><startdate>20240411</startdate><enddate>20240411</enddate><creator>OOWADA, Shin</creator><creator>ASAKO, Ryuichi</creator><creator>YUHARA, Kazuhiro</creator><creator>SHIMURA, Satoru</creator><creator>ITO, Shunichiro</creator><creator>CHUJO, Yoshiki</creator><creator>TANAKA, Kazuo</creator><scope>EVB</scope></search><sort><creationdate>20240411</creationdate><title>SURFACE OBSERVATION METHOD</title><author>OOWADA, Shin ; ASAKO, Ryuichi ; YUHARA, Kazuhiro ; SHIMURA, Satoru ; ITO, Shunichiro ; CHUJO, Yoshiki ; TANAKA, Kazuo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2024075598A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; jpn</language><creationdate>2024</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MATERIALS THEREFOR</topic><topic>MEASURING</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>OOWADA, Shin</creatorcontrib><creatorcontrib>ASAKO, Ryuichi</creatorcontrib><creatorcontrib>YUHARA, Kazuhiro</creatorcontrib><creatorcontrib>SHIMURA, Satoru</creatorcontrib><creatorcontrib>ITO, Shunichiro</creatorcontrib><creatorcontrib>CHUJO, Yoshiki</creatorcontrib><creatorcontrib>TANAKA, Kazuo</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OOWADA, Shin</au><au>ASAKO, Ryuichi</au><au>YUHARA, Kazuhiro</au><au>SHIMURA, Satoru</au><au>ITO, Shunichiro</au><au>CHUJO, Yoshiki</au><au>TANAKA, Kazuo</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SURFACE OBSERVATION METHOD</title><date>2024-04-11</date><risdate>2024</risdate><abstract>This surface observation method comprises a step a) and a step b). In the step a), materials including one or more kinds of solid light-emitting dye molecules are accumulated in a region, of a substrate or a structure on the substrate, having an abnormal shape. In the step b), a fluorescent image of the solid light-emitting dye molecules is acquired by applying illumination light to the region, of the substrate or the structure on the substrate, having the abnormal shape.
Le présent procédé d'observation de surface comprend une étape a) et une étape b). Dans l'étape a), des matériaux comprenant un ou plusieurs types de molécules de colorant solide émettant de la lumière sont accumulés dans une région d'un substrat ou d'une structure sur le substrat qui présente une forme anormale. Dans l'étape b), une image fluorescente des molécules de colorant solide émettant de la lumière est acquise en appliquant une lumière d'éclairage sur la région du substrat ou de la structure sur le substrat qui a la forme anormale.
表面観測方法は、工程a)および工程b)を含む。工程a)では、基板または基板上の構造物における異常形状の領域に、少なくとも1種類以上の固体発光性色素分子を含む材料を集積させる。工程b)では、基板または基板上の構造物における異常形状の領域に照明光を照射し、固体発光性色素分子の蛍光像を取得する。</abstract><oa>free_for_read</oa></addata></record> |
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subjects | APPARATUS SPECIALLY ADAPTED THEREFOR BASIC ELECTRIC ELEMENTS CINEMATOGRAPHY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROGRAPHY HOLOGRAPHY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MATERIALS THEREFOR MEASURING ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS SEMICONDUCTOR DEVICES TESTING |
title | SURFACE OBSERVATION METHOD |
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