POUCH CELL DEFORMATION INSPECTION DEVICE AND DEFORMATION INSPECTION METHOD USING SAME
The present invention relates to a pouch cell deformation inspection device and a deformation inspection method using same. The pouch cell deformation inspection device is characterized by comprising: a die part on which the pouch cell sits in an upright position; and a measurement member that is lo...
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| creator | JANG, In Jae |
| description | The present invention relates to a pouch cell deformation inspection device and a deformation inspection method using same. The pouch cell deformation inspection device is characterized by comprising: a die part on which the pouch cell sits in an upright position; and a measurement member that is located above the die part and measures the flatness of the pouch cell.
La présente invention concerne un dispositif d'inspection de déformation de cellule de poche et un procédé d'inspection de déformation l'utilisant. Le dispositif d'inspection de déformation de cellule de poche est caractérisé en ce qu'il comprend : une partie puce sur laquelle la cellule de poche repose dans une position verticale ; et un élément de mesure qui est situé au-dessus de la partie puce et mesure la planéité de la cellule de poche.
본 발명은 파우치 셀의 변형 검사 장치 및 이를 이용한 변형 검사 방법에 관한 것으로, 파우치 셀이 직립한 상태로 안착되는 다이부; 및 상기 다이부 상부에 위치하여 상기 파우치 셀의 평탄도를 측정하는 측정부재;를 포함하는 것을 특징으로 하는 파우치 셀의 변형 검사 장치 및 이를 이용한 변형 검사 방법에 관한 것이다. |
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La présente invention concerne un dispositif d'inspection de déformation de cellule de poche et un procédé d'inspection de déformation l'utilisant. Le dispositif d'inspection de déformation de cellule de poche est caractérisé en ce qu'il comprend : une partie puce sur laquelle la cellule de poche repose dans une position verticale ; et un élément de mesure qui est situé au-dessus de la partie puce et mesure la planéité de la cellule de poche.
본 발명은 파우치 셀의 변형 검사 장치 및 이를 이용한 변형 검사 방법에 관한 것으로, 파우치 셀이 직립한 상태로 안착되는 다이부; 및 상기 다이부 상부에 위치하여 상기 파우치 셀의 평탄도를 측정하는 측정부재;를 포함하는 것을 특징으로 하는 파우치 셀의 변형 검사 장치 및 이를 이용한 변형 검사 방법에 관한 것이다.</description><language>eng ; fre ; kor</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRICITY ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240328&DB=EPODOC&CC=WO&NR=2024063335A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240328&DB=EPODOC&CC=WO&NR=2024063335A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>JANG, In Jae</creatorcontrib><title>POUCH CELL DEFORMATION INSPECTION DEVICE AND DEFORMATION INSPECTION METHOD USING SAME</title><description>The present invention relates to a pouch cell deformation inspection device and a deformation inspection method using same. The pouch cell deformation inspection device is characterized by comprising: a die part on which the pouch cell sits in an upright position; and a measurement member that is located above the die part and measures the flatness of the pouch cell.
La présente invention concerne un dispositif d'inspection de déformation de cellule de poche et un procédé d'inspection de déformation l'utilisant. Le dispositif d'inspection de déformation de cellule de poche est caractérisé en ce qu'il comprend : une partie puce sur laquelle la cellule de poche repose dans une position verticale ; et un élément de mesure qui est situé au-dessus de la partie puce et mesure la planéité de la cellule de poche.
본 발명은 파우치 셀의 변형 검사 장치 및 이를 이용한 변형 검사 방법에 관한 것으로, 파우치 셀이 직립한 상태로 안착되는 다이부; 및 상기 다이부 상부에 위치하여 상기 파우치 셀의 평탄도를 측정하는 측정부재;를 포함하는 것을 특징으로 하는 파우치 셀의 변형 검사 장치 및 이를 이용한 변형 검사 방법에 관한 것이다.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAgN8A919lBwdvXxUXBxdfMP8nUM8fT3U_D0Cw5wdQYzXVzDPJ1dFRz9XHCp8HUN8fB3UQgN9vRzVwh29HXlYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx4f5GBkYmBmbGxsamjobGxKkCACbJMVs</recordid><startdate>20240328</startdate><enddate>20240328</enddate><creator>JANG, In Jae</creator><scope>EVB</scope></search><sort><creationdate>20240328</creationdate><title>POUCH CELL DEFORMATION INSPECTION DEVICE AND DEFORMATION INSPECTION METHOD USING SAME</title><author>JANG, In Jae</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2024063335A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; kor</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>JANG, In Jae</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>JANG, In Jae</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>POUCH CELL DEFORMATION INSPECTION DEVICE AND DEFORMATION INSPECTION METHOD USING SAME</title><date>2024-03-28</date><risdate>2024</risdate><abstract>The present invention relates to a pouch cell deformation inspection device and a deformation inspection method using same. The pouch cell deformation inspection device is characterized by comprising: a die part on which the pouch cell sits in an upright position; and a measurement member that is located above the die part and measures the flatness of the pouch cell.
La présente invention concerne un dispositif d'inspection de déformation de cellule de poche et un procédé d'inspection de déformation l'utilisant. Le dispositif d'inspection de déformation de cellule de poche est caractérisé en ce qu'il comprend : une partie puce sur laquelle la cellule de poche repose dans une position verticale ; et un élément de mesure qui est situé au-dessus de la partie puce et mesure la planéité de la cellule de poche.
본 발명은 파우치 셀의 변형 검사 장치 및 이를 이용한 변형 검사 방법에 관한 것으로, 파우치 셀이 직립한 상태로 안착되는 다이부; 및 상기 다이부 상부에 위치하여 상기 파우치 셀의 평탄도를 측정하는 측정부재;를 포함하는 것을 특징으로 하는 파우치 셀의 변형 검사 장치 및 이를 이용한 변형 검사 방법에 관한 것이다.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRICITY MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY TESTING |
| title | POUCH CELL DEFORMATION INSPECTION DEVICE AND DEFORMATION INSPECTION METHOD USING SAME |
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