INTERCONNECTION STRUCTURE IMPEDANCE MEASUREMENT CIRCUIT AND MEASUREMENT APPARATUS, AND MEASUREMENT METHOD
An interconnection structure impedance measurement circuit. A Wheatstone bridge structure is optimized, and three branches connected in parallel are used, wherein interconnection structures to be measured in one branch are connected in series, and two resistors in the other two branches are connecte...
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| creator | SUN, Niuyi SUN, Tuobei MEI, Na WU, Xiaopeng YANG, Dan |
| description | An interconnection structure impedance measurement circuit. A Wheatstone bridge structure is optimized, and three branches connected in parallel are used, wherein interconnection structures to be measured in one branch are connected in series, and two resistors in the other two branches are connected in series. The branch of the interconnection structures and one of the other two branches are controlled to be simultaneously turned on, the voltage between the two branches that are turned on is measured, and the impedance of two interconnection structures is calculated according to a current introduced into the interconnection structure impedance measurement circuit, the measured voltage, and the resistance of the branches. According to the technical solution, the impedance of the interconnection structures can be conveniently and accurately measured in a large scale, and the impedance of a single interconnection structure in a reliability experiment can be accurately monitored in real time. Further provided ar |
| format | Patent |
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A Wheatstone bridge structure is optimized, and three branches connected in parallel are used, wherein interconnection structures to be measured in one branch are connected in series, and two resistors in the other two branches are connected in series. The branch of the interconnection structures and one of the other two branches are controlled to be simultaneously turned on, the voltage between the two branches that are turned on is measured, and the impedance of two interconnection structures is calculated according to a current introduced into the interconnection structure impedance measurement circuit, the measured voltage, and the resistance of the branches. According to the technical solution, the impedance of the interconnection structures can be conveniently and accurately measured in a large scale, and the impedance of a single interconnection structure in a reliability experiment can be accurately monitored in real time. Further provided ar</description><language>chi ; eng ; fre</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240104&DB=EPODOC&CC=WO&NR=2024001883A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240104&DB=EPODOC&CC=WO&NR=2024001883A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SUN, Niuyi</creatorcontrib><creatorcontrib>SUN, Tuobei</creatorcontrib><creatorcontrib>MEI, Na</creatorcontrib><creatorcontrib>WU, Xiaopeng</creatorcontrib><creatorcontrib>YANG, Dan</creatorcontrib><title>INTERCONNECTION STRUCTURE IMPEDANCE MEASUREMENT CIRCUIT AND MEASUREMENT APPARATUS, AND MEASUREMENT METHOD</title><description>An interconnection structure impedance measurement circuit. A Wheatstone bridge structure is optimized, and three branches connected in parallel are used, wherein interconnection structures to be measured in one branch are connected in series, and two resistors in the other two branches are connected in series. The branch of the interconnection structures and one of the other two branches are controlled to be simultaneously turned on, the voltage between the two branches that are turned on is measured, and the impedance of two interconnection structures is calculated according to a current introduced into the interconnection structure impedance measurement circuit, the measured voltage, and the resistance of the branches. According to the technical solution, the impedance of the interconnection structures can be conveniently and accurately measured in a large scale, and the impedance of a single interconnection structure in a reliability experiment can be accurately monitored in real time. Further provided ar</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNirEKwjAQQLs4iPoPAVeFtHXoelxOmiGXkFxwLEUiCKKF-v_o4CIuTg_ee8vqalkoomcmFOtZJYkZJUdS1gUywEjKEaS3ccSi0EbMVhSw-fIQAkSQnHY_yZH03qyrxWW8zWXz4araHkmw35fpMZR5Gs_lXp7DyTe6OWhdd10Ldfvf9QKZyjdq</recordid><startdate>20240104</startdate><enddate>20240104</enddate><creator>SUN, Niuyi</creator><creator>SUN, Tuobei</creator><creator>MEI, Na</creator><creator>WU, Xiaopeng</creator><creator>YANG, Dan</creator><scope>EVB</scope></search><sort><creationdate>20240104</creationdate><title>INTERCONNECTION STRUCTURE IMPEDANCE MEASUREMENT CIRCUIT AND MEASUREMENT APPARATUS, AND MEASUREMENT METHOD</title><author>SUN, Niuyi ; SUN, Tuobei ; MEI, Na ; WU, Xiaopeng ; YANG, Dan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2024001883A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng ; fre</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SUN, Niuyi</creatorcontrib><creatorcontrib>SUN, Tuobei</creatorcontrib><creatorcontrib>MEI, Na</creatorcontrib><creatorcontrib>WU, Xiaopeng</creatorcontrib><creatorcontrib>YANG, Dan</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SUN, Niuyi</au><au>SUN, Tuobei</au><au>MEI, Na</au><au>WU, Xiaopeng</au><au>YANG, Dan</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INTERCONNECTION STRUCTURE IMPEDANCE MEASUREMENT CIRCUIT AND MEASUREMENT APPARATUS, AND MEASUREMENT METHOD</title><date>2024-01-04</date><risdate>2024</risdate><abstract>An interconnection structure impedance measurement circuit. A Wheatstone bridge structure is optimized, and three branches connected in parallel are used, wherein interconnection structures to be measured in one branch are connected in series, and two resistors in the other two branches are connected in series. The branch of the interconnection structures and one of the other two branches are controlled to be simultaneously turned on, the voltage between the two branches that are turned on is measured, and the impedance of two interconnection structures is calculated according to a current introduced into the interconnection structure impedance measurement circuit, the measured voltage, and the resistance of the branches. According to the technical solution, the impedance of the interconnection structures can be conveniently and accurately measured in a large scale, and the impedance of a single interconnection structure in a reliability experiment can be accurately monitored in real time. Further provided ar</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | INTERCONNECTION STRUCTURE IMPEDANCE MEASUREMENT CIRCUIT AND MEASUREMENT APPARATUS, AND MEASUREMENT METHOD |
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