EVALUATION METHOD AND APPARATUS, ELECTRONIC DEVICE, AND STORAGE MEDIUM
Embodiments of the present application disclose an evaluation method, comprising: in response to a component fault, obtaining an operation parameter and fault prompt information associated with a component; calculating a first deduction value by means of the operation parameter, wherein the first de...
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| creator | ZHANG, Meng LIU, Xiong TANG, Lei ZHANG, Dan LIU, Yunping HUANG, Yangsen ZHOU, Junzhang MA, Shijun MA, Jun |
| description | Embodiments of the present application disclose an evaluation method, comprising: in response to a component fault, obtaining an operation parameter and fault prompt information associated with a component; calculating a first deduction value by means of the operation parameter, wherein the first deduction value represents the fault degree of the component; calculating a second deduction value by means of the fault prompt information, wherein the second deduction value represents the fault degree of the component; and performing fault evaluation on the component according to the first deduction value and the second deduction value to obtain an evaluation result.
Des modes de réalisation de la présente demande divulguent un procédé d'évaluation, consistant à : en réponse à une défaillance de composant, obtenir un paramètre de fonctionnement et des informations d'invite de défaillance associés à un composant ; calculer une première valeur de déduction au moyen du paramètre de fonctionnement, la première valeur |
| format | Patent |
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Des modes de réalisation de la présente demande divulguent un procédé d'évaluation, consistant à : en réponse à une défaillance de composant, obtenir un paramètre de fonctionnement et des informations d'invite de défaillance associés à un composant ; calculer une première valeur de déduction au moyen du paramètre de fonctionnement, la première valeur</description><language>chi ; eng ; fre</language><subject>CALCULATING ; COMPUTING ; COUNTING ; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS ; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231228&DB=EPODOC&CC=WO&NR=2023246185A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25553,76306</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231228&DB=EPODOC&CC=WO&NR=2023246185A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHANG, Meng</creatorcontrib><creatorcontrib>LIU, Xiong</creatorcontrib><creatorcontrib>TANG, Lei</creatorcontrib><creatorcontrib>ZHANG, Dan</creatorcontrib><creatorcontrib>LIU, Yunping</creatorcontrib><creatorcontrib>HUANG, Yangsen</creatorcontrib><creatorcontrib>ZHOU, Junzhang</creatorcontrib><creatorcontrib>MA, Shijun</creatorcontrib><creatorcontrib>MA, Jun</creatorcontrib><title>EVALUATION METHOD AND APPARATUS, ELECTRONIC DEVICE, AND STORAGE MEDIUM</title><description>Embodiments of the present application disclose an evaluation method, comprising: in response to a component fault, obtaining an operation parameter and fault prompt information associated with a component; calculating a first deduction value by means of the operation parameter, wherein the first deduction value represents the fault degree of the component; calculating a second deduction value by means of the fault prompt information, wherein the second deduction value represents the fault degree of the component; and performing fault evaluation on the component according to the first deduction value and the second deduction value to obtain an evaluation result.
Des modes de réalisation de la présente demande divulguent un procédé d'évaluation, consistant à : en réponse à une défaillance de composant, obtenir un paramètre de fonctionnement et des informations d'invite de défaillance associés à un composant ; calculer une première valeur de déduction au moyen du paramètre de fonctionnement, la première valeur</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><subject>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHBzDXP0CXUM8fT3U_B1DfHwd1Fw9APigADHIMeQ0GAdBVcfV-eQIH8_T2cFF9cwT2dXHbCK4BD_IEd3V6AmF89QXx4G1rTEnOJUXijNzaDs5hri7KGbWpAfn1pckJicmpdaEh_ub2RgZGxkYmZoYepoaEycKgBCiCz1</recordid><startdate>20231228</startdate><enddate>20231228</enddate><creator>ZHANG, Meng</creator><creator>LIU, Xiong</creator><creator>TANG, Lei</creator><creator>ZHANG, Dan</creator><creator>LIU, Yunping</creator><creator>HUANG, Yangsen</creator><creator>ZHOU, Junzhang</creator><creator>MA, Shijun</creator><creator>MA, Jun</creator><scope>EVB</scope></search><sort><creationdate>20231228</creationdate><title>EVALUATION METHOD AND APPARATUS, ELECTRONIC DEVICE, AND STORAGE MEDIUM</title><author>ZHANG, Meng ; LIU, Xiong ; TANG, Lei ; ZHANG, Dan ; LIU, Yunping ; HUANG, Yangsen ; ZHOU, Junzhang ; MA, Shijun ; MA, Jun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2023246185A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng ; fre</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><topic>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHANG, Meng</creatorcontrib><creatorcontrib>LIU, Xiong</creatorcontrib><creatorcontrib>TANG, Lei</creatorcontrib><creatorcontrib>ZHANG, Dan</creatorcontrib><creatorcontrib>LIU, Yunping</creatorcontrib><creatorcontrib>HUANG, Yangsen</creatorcontrib><creatorcontrib>ZHOU, Junzhang</creatorcontrib><creatorcontrib>MA, Shijun</creatorcontrib><creatorcontrib>MA, Jun</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHANG, Meng</au><au>LIU, Xiong</au><au>TANG, Lei</au><au>ZHANG, Dan</au><au>LIU, Yunping</au><au>HUANG, Yangsen</au><au>ZHOU, Junzhang</au><au>MA, Shijun</au><au>MA, Jun</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>EVALUATION METHOD AND APPARATUS, ELECTRONIC DEVICE, AND STORAGE MEDIUM</title><date>2023-12-28</date><risdate>2023</risdate><abstract>Embodiments of the present application disclose an evaluation method, comprising: in response to a component fault, obtaining an operation parameter and fault prompt information associated with a component; calculating a first deduction value by means of the operation parameter, wherein the first deduction value represents the fault degree of the component; calculating a second deduction value by means of the fault prompt information, wherein the second deduction value represents the fault degree of the component; and performing fault evaluation on the component according to the first deduction value and the second deduction value to obtain an evaluation result.
Des modes de réalisation de la présente demande divulguent un procédé d'évaluation, consistant à : en réponse à une défaillance de composant, obtenir un paramètre de fonctionnement et des informations d'invite de défaillance associés à un composant ; calculer une première valeur de déduction au moyen du paramètre de fonctionnement, la première valeur</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC DIGITAL DATA PROCESSING PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR |
| title | EVALUATION METHOD AND APPARATUS, ELECTRONIC DEVICE, AND STORAGE MEDIUM |
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