TEST METHOD

This test method: causes data to be saved in a plurality of flip-flops of a logic circuit (10) and scans out the data, the flip-flops having functions of saving data and restoring the saved data; then executes a built-in self-test for the logic circuit (10); then restores the data to the plurality o...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	FUKUDA, Akiko, KAMIMOTO, Hitoshi, TAKIMOTO, Michihito, MATSUNAKA, Kota
Format:	Patent
Sprache:	eng ; fre ; jpn
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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