DEVICE DIAGNOSIS SYSTEM

It is not possible to easily divide an analysis process according to torque or a speed change. Provided is a device diagnosis system characterized by comprising: a threshold value calculation unit that uses, as reference data, a portion of time-series data measured during operation of a device and t...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	NAGATA Kouichirou, ABE Shigeyuki, MAEKAWA Tatsuya
Format:	Patent
Sprache:	eng ; fre ; jpn
Schlagworte:	CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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