AI-ACCELERATED CHARACTERIZATION OF MATERIALS

Devices, systems, and methods for material characterization can include detecting definitional data from material samples that are positionally encoded according to know attributes as operational data, characterizing at least some of the samples as training data, and processing the training data via...

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Bibliographische Detailangaben

Hauptverfasser:	IVANKIN, Andrey, SWISHER, Jordan H, ASHLEY, Michael J
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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