GRAIN FLAKE MEASUREMENT SYSTEM, GRAIN FLAKE MEASUREMENT METHOD, AND GRAIN FLAKE COLLECTION, MOVEMENT, AND MEASUREMENT SYSTEM

The invention relates to a measurement system (100), a measurement method, and a collection, movement, and measurement system for grains (200) run through a flaking process, in order to define the grain flake thickness. The grain flake measurement system comprises: an image collection device (110) c...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	OLIVEIRA CABEÇA NEVES, Carlos Fernando, SEIBERT, Artur Antonio, BONNARD, Renan, MONTEIRO VERAS, Rafael, MOLGARO, André Luís, OLIVEIRA BARBOSA, Flávio Gabriel
Format:	Patent
Sprache:	eng ; fre ; por
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!