DEFECT DETECTION METHOD AND APPARATUS, COMPUTER DEVICE, AND STORAGE MEDIUM
The present disclosure provides a defect detection method and apparatus, a computer device, and a storage medium. The method comprises: acquiring an image to be detected and a template image; performing feature extraction on the image to be detected to obtain a first feature map of the image to be d...
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| creator | NIU, Linxiao LI, Cheng |
| description | The present disclosure provides a defect detection method and apparatus, a computer device, and a storage medium. The method comprises: acquiring an image to be detected and a template image; performing feature extraction on the image to be detected to obtain a first feature map of the image to be detected, and performing feature extraction on the template image to obtain a second feature map corresponding to the template image; performing feature confusion processing on the first feature map and the second feature map to obtain a feature fused image; and obtaining, on the basis of the feature fused image, a defect detection result for the image to be detected. Embodiments of the present disclosure achieve higher defect detection accuracy.
La présente divulgation porte sur un procédé et un appareil de détection de défauts, un dispositif informatique et un support d'enregistrement. Le procédé comprend les étapes consistant à : acquérir une image à détecter et une image de modèle ; effectuer une extraction de c |
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La présente divulgation porte sur un procédé et un appareil de détection de défauts, un dispositif informatique et un support d'enregistrement. Le procédé comprend les étapes consistant à : acquérir une image à détecter et une image de modèle ; effectuer une extraction de c</description><language>chi ; eng ; fre</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220505&DB=EPODOC&CC=WO&NR=2022088628A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220505&DB=EPODOC&CC=WO&NR=2022088628A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NIU, Linxiao</creatorcontrib><creatorcontrib>LI, Cheng</creatorcontrib><title>DEFECT DETECTION METHOD AND APPARATUS, COMPUTER DEVICE, AND STORAGE MEDIUM</title><description>The present disclosure provides a defect detection method and apparatus, a computer device, and a storage medium. The method comprises: acquiring an image to be detected and a template image; performing feature extraction on the image to be detected to obtain a first feature map of the image to be detected, and performing feature extraction on the template image to obtain a second feature map corresponding to the template image; performing feature confusion processing on the first feature map and the second feature map to obtain a feature fused image; and obtaining, on the basis of the feature fused image, a defect detection result for the image to be detected. Embodiments of the present disclosure achieve higher defect detection accuracy.
La présente divulgation porte sur un procédé et un appareil de détection de défauts, un dispositif informatique et un support d'enregistrement. Le procédé comprend les étapes consistant à : acquérir une image à détecter et une image de modèle ; effectuer une extraction de c</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPBycXVzdQ5RcHENAVKe_n4Kvq4hHv4uCo5-QBwQ4BjkGBIarKPg7O8bEBriGgRUGObp7KoDlg8O8Q9ydHcFanHxDPXlYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx4f5GBkZGBhYWZkYWjobGxKkCAOVKLfw</recordid><startdate>20220505</startdate><enddate>20220505</enddate><creator>NIU, Linxiao</creator><creator>LI, Cheng</creator><scope>EVB</scope></search><sort><creationdate>20220505</creationdate><title>DEFECT DETECTION METHOD AND APPARATUS, COMPUTER DEVICE, AND STORAGE MEDIUM</title><author>NIU, Linxiao ; LI, Cheng</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2022088628A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng ; fre</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>NIU, Linxiao</creatorcontrib><creatorcontrib>LI, Cheng</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NIU, Linxiao</au><au>LI, Cheng</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DEFECT DETECTION METHOD AND APPARATUS, COMPUTER DEVICE, AND STORAGE MEDIUM</title><date>2022-05-05</date><risdate>2022</risdate><abstract>The present disclosure provides a defect detection method and apparatus, a computer device, and a storage medium. The method comprises: acquiring an image to be detected and a template image; performing feature extraction on the image to be detected to obtain a first feature map of the image to be detected, and performing feature extraction on the template image to obtain a second feature map corresponding to the template image; performing feature confusion processing on the first feature map and the second feature map to obtain a feature fused image; and obtaining, on the basis of the feature fused image, a defect detection result for the image to be detected. Embodiments of the present disclosure achieve higher defect detection accuracy.
La présente divulgation porte sur un procédé et un appareil de détection de défauts, un dispositif informatique et un support d'enregistrement. Le procédé comprend les étapes consistant à : acquérir une image à détecter et une image de modèle ; effectuer une extraction de c</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng ; fre |
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| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
| title | DEFECT DETECTION METHOD AND APPARATUS, COMPUTER DEVICE, AND STORAGE MEDIUM |
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