DETECTING A CONDITION FOR A CULTURE DEVICE USING A MACHINE LEARNING MODEL

Aspects of the present disclosure relate to a method of processing an input image of a culture device for a condition. The method can include receiving the input image and classifying the input image with a trained machine learning model that is configured to be trained on a training set of images h...

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Bibliographische Detailangaben
Hauptverfasser: TIWARI, Rohit Kumar, WATSON, Hugh Eugene, TRAN, Thanh Quoc, JOSHI, Jitesh Narendra, K, Abhilash S
Format: Patent
Sprache:eng ; fre
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