PATTERNED SUBSTRATE FOR USE IN IMAGE-BASED CLASSIFICATION OF ROCK CUTTINGS
A method of producing an image of at least one rock cutting. The method can include forming or obtaining a substrate having a patterned top surface. The method can also include using the patterned top surface of the substrate to support at least one rock cutting, controlling an image acquisition sys...
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| creator | SHARMA, Richa ELIAS, Quincy K |
| description | A method of producing an image of at least one rock cutting. The method can include forming or obtaining a substrate having a patterned top surface. The method can also include using the patterned top surface of the substrate to support at least one rock cutting, controlling an image acquisition system to acquire at least one image of the rock cutting for storage and subsequent image processing.
L'invention concerne un procédé de production d'une image d'au moins une coupe de roche. Le procédé peut comprendre la formation ou l'obtention d'un substrat ayant une surface supérieure à motifs. Le procédé peut également comprendre l'utilisation de la surface supérieure à motifs du substrat pour supporter au moins une coupe de roche, commander un système d'acquisition d'image pour acquérir au moins une image de la coupe de roche pour le stockage et le traitement d'image ultérieur. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_WO2021126866A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>WO2021126866A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_WO2021126866A13</originalsourceid><addsrcrecordid>eNqNyr0KwjAQAOAuDqK-w0HngokQXK_xUuNPIrkLjqVInEQL9f3RwQdw-pZvXh0uKEIp0A44tywJhcDFBJkJfAB_xo6aFvkb7AmZvfMWxccA0UGK9gg2i_jQ8bKa3YfHVFY_F1XtSOy-KeOrL9M43MqzvPtr1GutlDZbY1Bt_lsfDokuRA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PATTERNED SUBSTRATE FOR USE IN IMAGE-BASED CLASSIFICATION OF ROCK CUTTINGS</title><source>esp@cenet</source><creator>SHARMA, Richa ; ELIAS, Quincy K</creator><creatorcontrib>SHARMA, Richa ; ELIAS, Quincy K</creatorcontrib><description>A method of producing an image of at least one rock cutting. The method can include forming or obtaining a substrate having a patterned top surface. The method can also include using the patterned top surface of the substrate to support at least one rock cutting, controlling an image acquisition system to acquire at least one image of the rock cutting for storage and subsequent image processing.
L'invention concerne un procédé de production d'une image d'au moins une coupe de roche. Le procédé peut comprendre la formation ou l'obtention d'un substrat ayant une surface supérieure à motifs. Le procédé peut également comprendre l'utilisation de la surface supérieure à motifs du substrat pour supporter au moins une coupe de roche, commander un système d'acquisition d'image pour acquérir au moins une image de la coupe de roche pour le stockage et le traitement d'image ultérieur.</description><language>eng ; fre</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210624&DB=EPODOC&CC=WO&NR=2021126866A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210624&DB=EPODOC&CC=WO&NR=2021126866A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SHARMA, Richa</creatorcontrib><creatorcontrib>ELIAS, Quincy K</creatorcontrib><title>PATTERNED SUBSTRATE FOR USE IN IMAGE-BASED CLASSIFICATION OF ROCK CUTTINGS</title><description>A method of producing an image of at least one rock cutting. The method can include forming or obtaining a substrate having a patterned top surface. The method can also include using the patterned top surface of the substrate to support at least one rock cutting, controlling an image acquisition system to acquire at least one image of the rock cutting for storage and subsequent image processing.
L'invention concerne un procédé de production d'une image d'au moins une coupe de roche. Le procédé peut comprendre la formation ou l'obtention d'un substrat ayant une surface supérieure à motifs. Le procédé peut également comprendre l'utilisation de la surface supérieure à motifs du substrat pour supporter au moins une coupe de roche, commander un système d'acquisition d'image pour acquérir au moins une image de la coupe de roche pour le stockage et le traitement d'image ultérieur.</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyr0KwjAQAOAuDqK-w0HngokQXK_xUuNPIrkLjqVInEQL9f3RwQdw-pZvXh0uKEIp0A44tywJhcDFBJkJfAB_xo6aFvkb7AmZvfMWxccA0UGK9gg2i_jQ8bKa3YfHVFY_F1XtSOy-KeOrL9M43MqzvPtr1GutlDZbY1Bt_lsfDokuRA</recordid><startdate>20210624</startdate><enddate>20210624</enddate><creator>SHARMA, Richa</creator><creator>ELIAS, Quincy K</creator><scope>EVB</scope></search><sort><creationdate>20210624</creationdate><title>PATTERNED SUBSTRATE FOR USE IN IMAGE-BASED CLASSIFICATION OF ROCK CUTTINGS</title><author>SHARMA, Richa ; ELIAS, Quincy K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2021126866A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2021</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>SHARMA, Richa</creatorcontrib><creatorcontrib>ELIAS, Quincy K</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SHARMA, Richa</au><au>ELIAS, Quincy K</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PATTERNED SUBSTRATE FOR USE IN IMAGE-BASED CLASSIFICATION OF ROCK CUTTINGS</title><date>2021-06-24</date><risdate>2021</risdate><abstract>A method of producing an image of at least one rock cutting. The method can include forming or obtaining a substrate having a patterned top surface. The method can also include using the patterned top surface of the substrate to support at least one rock cutting, controlling an image acquisition system to acquire at least one image of the rock cutting for storage and subsequent image processing.
L'invention concerne un procédé de production d'une image d'au moins une coupe de roche. Le procédé peut comprendre la formation ou l'obtention d'un substrat ayant une surface supérieure à motifs. Le procédé peut également comprendre l'utilisation de la surface supérieure à motifs du substrat pour supporter au moins une coupe de roche, commander un système d'acquisition d'image pour acquérir au moins une image de la coupe de roche pour le stockage et le traitement d'image ultérieur.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre |
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| subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
| title | PATTERNED SUBSTRATE FOR USE IN IMAGE-BASED CLASSIFICATION OF ROCK CUTTINGS |
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