ULTRA HIGH PURITY CONDITIONS FOR ATOMIC SCALE PROCESSING

An apparatus for atomic scale processing is provided. The apparatus may include a reactor (100) and an inductively coupled plasma source (10). The reactor may have inner (154) and outer surfaces (152) such that a portion of the inner surfaces define an internal volume (156) of the reactor. The inter...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: RAYNER, JR, O'TOOLE, Noel, CARLSEN, Daniel
Format: Patent
Sprache:eng ; fre
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator RAYNER, JR
O'TOOLE, Noel
CARLSEN, Daniel
description An apparatus for atomic scale processing is provided. The apparatus may include a reactor (100) and an inductively coupled plasma source (10). The reactor may have inner (154) and outer surfaces (152) such that a portion of the inner surfaces define an internal volume (156) of the reactor. The internal volume of the reactor may contain a fixture assembly (158) to support a substrate (118) wherein the partial pressure of each background impurity within the internal volume may be below 10-6 Torr to reduce the role of said impurities in surface reactions during atomic scale processing. L'invention concerne un appareil de traitement à l'échelle atomique. L'appareil peut comprendre un réacteur (100) et une source de plasma à couplage inductif (10). Le réacteur peut avoir des surfaces internes (154) et externes (152) de telle sorte qu'une partie des surfaces internes définit un volume interne (156) du réacteur. Le volume interne du réacteur peut contenir un ensemble de fixation (158) pour supporter un substrat (118), la pression partielle de chaque impureté d'arrière-plan dans le volume interne pouvant être inférieure à 10-6 Torr pour réduire le rôle desdites impuretés dans les réactions de surface pendant le traitement à l'échelle atomique.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_WO2021030336A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>WO2021030336A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_WO2021030336A13</originalsourceid><addsrcrecordid>eNrjZLAI9QkJclTw8HT3UAgIDfIMiVRw9vdz8Qzx9PcLVnDzD1JwDPH39XRWCHZ29HFVCAjyd3YNDvb0c-dhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHh_kYGRoYGxgbGxmaOhsbEqQIAE_Apbw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ULTRA HIGH PURITY CONDITIONS FOR ATOMIC SCALE PROCESSING</title><source>esp@cenet</source><creator>RAYNER, JR ; O'TOOLE, Noel ; CARLSEN, Daniel</creator><creatorcontrib>RAYNER, JR ; O'TOOLE, Noel ; CARLSEN, Daniel</creatorcontrib><description>An apparatus for atomic scale processing is provided. The apparatus may include a reactor (100) and an inductively coupled plasma source (10). The reactor may have inner (154) and outer surfaces (152) such that a portion of the inner surfaces define an internal volume (156) of the reactor. The internal volume of the reactor may contain a fixture assembly (158) to support a substrate (118) wherein the partial pressure of each background impurity within the internal volume may be below 10-6 Torr to reduce the role of said impurities in surface reactions during atomic scale processing. L'invention concerne un appareil de traitement à l'échelle atomique. L'appareil peut comprendre un réacteur (100) et une source de plasma à couplage inductif (10). Le réacteur peut avoir des surfaces internes (154) et externes (152) de telle sorte qu'une partie des surfaces internes définit un volume interne (156) du réacteur. Le volume interne du réacteur peut contenir un ensemble de fixation (158) pour supporter un substrat (118), la pression partielle de chaque impureté d'arrière-plan dans le volume interne pouvant être inférieure à 10-6 Torr pour réduire le rôle desdites impuretés dans les réactions de surface pendant le traitement à l'échelle atomique.</description><language>eng ; fre</language><subject>BASIC ELECTRIC ELEMENTS ; CHEMICAL SURFACE TREATMENT ; CHEMISTRY ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING MATERIAL WITH METALLIC MATERIAL ; COATING METALLIC MATERIAL ; DIFFUSION TREATMENT OF METALLIC MATERIAL ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL ; METALLURGY ; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210218&amp;DB=EPODOC&amp;CC=WO&amp;NR=2021030336A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210218&amp;DB=EPODOC&amp;CC=WO&amp;NR=2021030336A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>RAYNER, JR</creatorcontrib><creatorcontrib>O'TOOLE, Noel</creatorcontrib><creatorcontrib>CARLSEN, Daniel</creatorcontrib><title>ULTRA HIGH PURITY CONDITIONS FOR ATOMIC SCALE PROCESSING</title><description>An apparatus for atomic scale processing is provided. The apparatus may include a reactor (100) and an inductively coupled plasma source (10). The reactor may have inner (154) and outer surfaces (152) such that a portion of the inner surfaces define an internal volume (156) of the reactor. The internal volume of the reactor may contain a fixture assembly (158) to support a substrate (118) wherein the partial pressure of each background impurity within the internal volume may be below 10-6 Torr to reduce the role of said impurities in surface reactions during atomic scale processing. L'invention concerne un appareil de traitement à l'échelle atomique. L'appareil peut comprendre un réacteur (100) et une source de plasma à couplage inductif (10). Le réacteur peut avoir des surfaces internes (154) et externes (152) de telle sorte qu'une partie des surfaces internes définit un volume interne (156) du réacteur. Le volume interne du réacteur peut contenir un ensemble de fixation (158) pour supporter un substrat (118), la pression partielle de chaque impureté d'arrière-plan dans le volume interne pouvant être inférieure à 10-6 Torr pour réduire le rôle desdites impuretés dans les réactions de surface pendant le traitement à l'échelle atomique.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CHEMICAL SURFACE TREATMENT</subject><subject>CHEMISTRY</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING MATERIAL WITH METALLIC MATERIAL</subject><subject>COATING METALLIC MATERIAL</subject><subject>DIFFUSION TREATMENT OF METALLIC MATERIAL</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</subject><subject>METALLURGY</subject><subject>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAI9QkJclTw8HT3UAgIDfIMiVRw9vdz8Qzx9PcLVnDzD1JwDPH39XRWCHZ29HFVCAjyd3YNDvb0c-dhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHh_kYGRoYGxgbGxmaOhsbEqQIAE_Apbw</recordid><startdate>20210218</startdate><enddate>20210218</enddate><creator>RAYNER, JR</creator><creator>O'TOOLE, Noel</creator><creator>CARLSEN, Daniel</creator><scope>EVB</scope></search><sort><creationdate>20210218</creationdate><title>ULTRA HIGH PURITY CONDITIONS FOR ATOMIC SCALE PROCESSING</title><author>RAYNER, JR ; O'TOOLE, Noel ; CARLSEN, Daniel</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2021030336A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2021</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CHEMICAL SURFACE TREATMENT</topic><topic>CHEMISTRY</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING MATERIAL WITH METALLIC MATERIAL</topic><topic>COATING METALLIC MATERIAL</topic><topic>DIFFUSION TREATMENT OF METALLIC MATERIAL</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</topic><topic>METALLURGY</topic><topic>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</topic><toplevel>online_resources</toplevel><creatorcontrib>RAYNER, JR</creatorcontrib><creatorcontrib>O'TOOLE, Noel</creatorcontrib><creatorcontrib>CARLSEN, Daniel</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>RAYNER, JR</au><au>O'TOOLE, Noel</au><au>CARLSEN, Daniel</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ULTRA HIGH PURITY CONDITIONS FOR ATOMIC SCALE PROCESSING</title><date>2021-02-18</date><risdate>2021</risdate><abstract>An apparatus for atomic scale processing is provided. The apparatus may include a reactor (100) and an inductively coupled plasma source (10). The reactor may have inner (154) and outer surfaces (152) such that a portion of the inner surfaces define an internal volume (156) of the reactor. The internal volume of the reactor may contain a fixture assembly (158) to support a substrate (118) wherein the partial pressure of each background impurity within the internal volume may be below 10-6 Torr to reduce the role of said impurities in surface reactions during atomic scale processing. L'invention concerne un appareil de traitement à l'échelle atomique. L'appareil peut comprendre un réacteur (100) et une source de plasma à couplage inductif (10). Le réacteur peut avoir des surfaces internes (154) et externes (152) de telle sorte qu'une partie des surfaces internes définit un volume interne (156) du réacteur. Le volume interne du réacteur peut contenir un ensemble de fixation (158) pour supporter un substrat (118), la pression partielle de chaque impureté d'arrière-plan dans le volume interne pouvant être inférieure à 10-6 Torr pour réduire le rôle desdites impuretés dans les réactions de surface pendant le traitement à l'échelle atomique.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre
recordid cdi_epo_espacenet_WO2021030336A1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
CHEMICAL SURFACE TREATMENT
CHEMISTRY
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING MATERIAL WITH METALLIC MATERIAL
COATING METALLIC MATERIAL
DIFFUSION TREATMENT OF METALLIC MATERIAL
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL
METALLURGY
SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION
title ULTRA HIGH PURITY CONDITIONS FOR ATOMIC SCALE PROCESSING
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T10%3A16%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=RAYNER,%20JR&rft.date=2021-02-18&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EWO2021030336A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true