NANOWIRE INK PERFORMANCE CORRELATION TO NANOWIRE DIMENSION
A method for predicting at least one performance property of a transparent conductive film to be made from an ink containing nanowires prior to making the transparent conductive film. The method includes obtaining a nanowire population from the ink for analysis. The method includes determining at le...
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| creator | SPAID, Michael WOLK, Jeff |
| description | A method for predicting at least one performance property of a transparent conductive film to be made from an ink containing nanowires prior to making the transparent conductive film. The method includes obtaining a nanowire population from the ink for analysis. The method includes determining at least one of lengths and diameters for all the nanowires within the population from the ink. The method includes comparing the determined at least one of lengths and diameters to a value index that is correlated to the at least one performance property of the to-be-made transparent conductive film.
L'invention concerne un procédé de prédiction d'au moins une propriété de performance d'un film conducteur transparent à fabriquer à partir d'une encre contenant des nanofils avant la fabrication du film conducteur transparent. Le procédé comprend l'obtention d'une population de nanofils à partir de l'encre pour analyse. Le procédé consiste à déterminer au moins un paramètre parmi les longueurs et les diamètres pour tous les nanofils à l'intérieur de la population à partir de l'encre. Le procédé consiste à comparer le ou les paramètres parmi les longueurs et diamètres déterminés à un indice de valeur qui est corrélé à la ou aux propriétés de performance du film conducteur transparent à fabriquer. |
| format | Patent |
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L'invention concerne un procédé de prédiction d'au moins une propriété de performance d'un film conducteur transparent à fabriquer à partir d'une encre contenant des nanofils avant la fabrication du film conducteur transparent. Le procédé comprend l'obtention d'une population de nanofils à partir de l'encre pour analyse. Le procédé consiste à déterminer au moins un paramètre parmi les longueurs et les diamètres pour tous les nanofils à l'intérieur de la population à partir de l'encre. Le procédé consiste à comparer le ou les paramètres parmi les longueurs et diamètres déterminés à un indice de valeur qui est corrélé à la ou aux propriétés de performance du film conducteur transparent à fabriquer.</description><language>eng ; fre</language><subject>ADHESIVES ; BASIC ELECTRIC ELEMENTS ; CABLES ; CHEMICAL PAINT OR INK REMOVERS ; CHEMISTRY ; COATING COMPOSITIONS, e.g. PAINTS, VARNISHES ORLACQUERS ; CONDUCTORS ; CORRECTING FLUIDS ; DYES ; ELECTRICITY ; FILLING PASTES ; INKS ; INSULATORS ; METALLURGY ; MISCELLANEOUS APPLICATIONS OF MATERIALS ; MISCELLANEOUS COMPOSITIONS ; NATURAL RESINS ; PAINTS ; PASTES OR SOLIDS FOR COLOURING OR PRINTING ; POLISHES ; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES ; USE OF MATERIALS THEREFOR ; WOODSTAINS</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201008&DB=EPODOC&CC=WO&NR=2020205902A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201008&DB=EPODOC&CC=WO&NR=2020205902A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SPAID, Michael</creatorcontrib><creatorcontrib>WOLK, Jeff</creatorcontrib><title>NANOWIRE INK PERFORMANCE CORRELATION TO NANOWIRE DIMENSION</title><description>A method for predicting at least one performance property of a transparent conductive film to be made from an ink containing nanowires prior to making the transparent conductive film. The method includes obtaining a nanowire population from the ink for analysis. The method includes determining at least one of lengths and diameters for all the nanowires within the population from the ink. The method includes comparing the determined at least one of lengths and diameters to a value index that is correlated to the at least one performance property of the to-be-made transparent conductive film.
L'invention concerne un procédé de prédiction d'au moins une propriété de performance d'un film conducteur transparent à fabriquer à partir d'une encre contenant des nanofils avant la fabrication du film conducteur transparent. Le procédé comprend l'obtention d'une population de nanofils à partir de l'encre pour analyse. Le procédé consiste à déterminer au moins un paramètre parmi les longueurs et les diamètres pour tous les nanofils à l'intérieur de la population à partir de l'encre. Le procédé consiste à comparer le ou les paramètres parmi les longueurs et diamètres déterminés à un indice de valeur qui est corrélé à la ou aux propriétés de performance du film conducteur transparent à fabriquer.</description><subject>ADHESIVES</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CABLES</subject><subject>CHEMICAL PAINT OR INK REMOVERS</subject><subject>CHEMISTRY</subject><subject>COATING COMPOSITIONS, e.g. PAINTS, VARNISHES ORLACQUERS</subject><subject>CONDUCTORS</subject><subject>CORRECTING FLUIDS</subject><subject>DYES</subject><subject>ELECTRICITY</subject><subject>FILLING PASTES</subject><subject>INKS</subject><subject>INSULATORS</subject><subject>METALLURGY</subject><subject>MISCELLANEOUS APPLICATIONS OF MATERIALS</subject><subject>MISCELLANEOUS COMPOSITIONS</subject><subject>NATURAL RESINS</subject><subject>PAINTS</subject><subject>PASTES OR SOLIDS FOR COLOURING OR PRINTING</subject><subject>POLISHES</subject><subject>SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES</subject><subject>USE OF MATERIALS THEREFOR</subject><subject>WOODSTAINS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDyc_TzD_cMclXw9PNWCHANcvMP8nX0c3ZVcPYPCnL1cQzx9PdTCPFXgKtz8fR19QsGivIwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvhwfyMDEDS1NDByNDQmThUAdjkqIg</recordid><startdate>20201008</startdate><enddate>20201008</enddate><creator>SPAID, Michael</creator><creator>WOLK, Jeff</creator><scope>EVB</scope></search><sort><creationdate>20201008</creationdate><title>NANOWIRE INK PERFORMANCE CORRELATION TO NANOWIRE DIMENSION</title><author>SPAID, Michael ; WOLK, Jeff</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2020205902A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2020</creationdate><topic>ADHESIVES</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CABLES</topic><topic>CHEMICAL PAINT OR INK REMOVERS</topic><topic>CHEMISTRY</topic><topic>COATING COMPOSITIONS, e.g. PAINTS, VARNISHES ORLACQUERS</topic><topic>CONDUCTORS</topic><topic>CORRECTING FLUIDS</topic><topic>DYES</topic><topic>ELECTRICITY</topic><topic>FILLING PASTES</topic><topic>INKS</topic><topic>INSULATORS</topic><topic>METALLURGY</topic><topic>MISCELLANEOUS APPLICATIONS OF MATERIALS</topic><topic>MISCELLANEOUS COMPOSITIONS</topic><topic>NATURAL RESINS</topic><topic>PAINTS</topic><topic>PASTES OR SOLIDS FOR COLOURING OR PRINTING</topic><topic>POLISHES</topic><topic>SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES</topic><topic>USE OF MATERIALS THEREFOR</topic><topic>WOODSTAINS</topic><toplevel>online_resources</toplevel><creatorcontrib>SPAID, Michael</creatorcontrib><creatorcontrib>WOLK, Jeff</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SPAID, Michael</au><au>WOLK, Jeff</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>NANOWIRE INK PERFORMANCE CORRELATION TO NANOWIRE DIMENSION</title><date>2020-10-08</date><risdate>2020</risdate><abstract>A method for predicting at least one performance property of a transparent conductive film to be made from an ink containing nanowires prior to making the transparent conductive film. The method includes obtaining a nanowire population from the ink for analysis. The method includes determining at least one of lengths and diameters for all the nanowires within the population from the ink. The method includes comparing the determined at least one of lengths and diameters to a value index that is correlated to the at least one performance property of the to-be-made transparent conductive film.
L'invention concerne un procédé de prédiction d'au moins une propriété de performance d'un film conducteur transparent à fabriquer à partir d'une encre contenant des nanofils avant la fabrication du film conducteur transparent. Le procédé comprend l'obtention d'une population de nanofils à partir de l'encre pour analyse. Le procédé consiste à déterminer au moins un paramètre parmi les longueurs et les diamètres pour tous les nanofils à l'intérieur de la population à partir de l'encre. Le procédé consiste à comparer le ou les paramètres parmi les longueurs et diamètres déterminés à un indice de valeur qui est corrélé à la ou aux propriétés de performance du film conducteur transparent à fabriquer.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre |
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| subjects | ADHESIVES BASIC ELECTRIC ELEMENTS CABLES CHEMICAL PAINT OR INK REMOVERS CHEMISTRY COATING COMPOSITIONS, e.g. PAINTS, VARNISHES ORLACQUERS CONDUCTORS CORRECTING FLUIDS DYES ELECTRICITY FILLING PASTES INKS INSULATORS METALLURGY MISCELLANEOUS APPLICATIONS OF MATERIALS MISCELLANEOUS COMPOSITIONS NATURAL RESINS PAINTS PASTES OR SOLIDS FOR COLOURING OR PRINTING POLISHES SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES USE OF MATERIALS THEREFOR WOODSTAINS |
| title | NANOWIRE INK PERFORMANCE CORRELATION TO NANOWIRE DIMENSION |
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