MICROBOLOMETER SYSTEMS AND METHODS
Microbolometer systems and methods are provided herein. For example, an infrared imaging device includes a substrate having contacts and a surface. The surface defines a plane. The infrared imaging device further includes a microbolometer array coupled to the substrate. Each microbolometer of the mi...
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| creator | KURTH, Eric A CANNATA, Robert F SIGURDSON, Marin |
| description | Microbolometer systems and methods are provided herein. For example, an infrared imaging device includes a substrate having contacts and a surface. The surface defines a plane. The infrared imaging device further includes a microbolometer array coupled to the substrate. Each microbolometer of the microbolometer array includes a cross-section having a first section, a second section substantially parallel to the first section, and a third section joining the first section and the second section.
L'invention concerne des systèmes et des procédés de microbolomètres. Par exemple, un dispositif d'imagerie infrarouge comprend un substrat présentant des contacts et une surface. La surface définit un plan. Le dispositif d'imagerie infrarouge comprend également un réseau de microbolomètres couplé au substrat. Chaque microbolomètre du réseau de microbolomètres comprend une section transversale ayant une première section, une seconde section sensiblement parallèle à la première section, et une troisième section reliant la première section et la seconde section. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_WO2020185969A3</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>WO2020185969A3</sourcerecordid><originalsourceid>FETCH-epo_espacenet_WO2020185969A33</originalsourceid><addsrcrecordid>eNrjZFDy9XQO8nfy9_H3dQ1xDVIIjgwOcfUNVnD0c1EAinj4uwTzMLCmJeYUp_JCaW4GZTfXEGcP3dSC_PjU4oLE5NS81JL4cH8jAyMDQwtTSzNLR2Nj4lQBAOCSI7M</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>MICROBOLOMETER SYSTEMS AND METHODS</title><source>esp@cenet</source><creator>KURTH, Eric A ; CANNATA, Robert F ; SIGURDSON, Marin</creator><creatorcontrib>KURTH, Eric A ; CANNATA, Robert F ; SIGURDSON, Marin</creatorcontrib><description>Microbolometer systems and methods are provided herein. For example, an infrared imaging device includes a substrate having contacts and a surface. The surface defines a plane. The infrared imaging device further includes a microbolometer array coupled to the substrate. Each microbolometer of the microbolometer array includes a cross-section having a first section, a second section substantially parallel to the first section, and a third section joining the first section and the second section.
L'invention concerne des systèmes et des procédés de microbolomètres. Par exemple, un dispositif d'imagerie infrarouge comprend un substrat présentant des contacts et une surface. La surface définit un plan. Le dispositif d'imagerie infrarouge comprend également un réseau de microbolomètres couplé au substrat. Chaque microbolomètre du réseau de microbolomètres comprend une section transversale ayant une première section, une seconde section sensiblement parallèle à la première section, et une troisième section reliant la première section et la seconde section.</description><language>eng ; fre</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201022&DB=EPODOC&CC=WO&NR=2020185969A3$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201022&DB=EPODOC&CC=WO&NR=2020185969A3$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KURTH, Eric A</creatorcontrib><creatorcontrib>CANNATA, Robert F</creatorcontrib><creatorcontrib>SIGURDSON, Marin</creatorcontrib><title>MICROBOLOMETER SYSTEMS AND METHODS</title><description>Microbolometer systems and methods are provided herein. For example, an infrared imaging device includes a substrate having contacts and a surface. The surface defines a plane. The infrared imaging device further includes a microbolometer array coupled to the substrate. Each microbolometer of the microbolometer array includes a cross-section having a first section, a second section substantially parallel to the first section, and a third section joining the first section and the second section.
L'invention concerne des systèmes et des procédés de microbolomètres. Par exemple, un dispositif d'imagerie infrarouge comprend un substrat présentant des contacts et une surface. La surface définit un plan. Le dispositif d'imagerie infrarouge comprend également un réseau de microbolomètres couplé au substrat. Chaque microbolomètre du réseau de microbolomètres comprend une section transversale ayant une première section, une seconde section sensiblement parallèle à la première section, et une troisième section reliant la première section et la seconde section.</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFDy9XQO8nfy9_H3dQ1xDVIIjgwOcfUNVnD0c1EAinj4uwTzMLCmJeYUp_JCaW4GZTfXEGcP3dSC_PjU4oLE5NS81JL4cH8jAyMDQwtTSzNLR2Nj4lQBAOCSI7M</recordid><startdate>20201022</startdate><enddate>20201022</enddate><creator>KURTH, Eric A</creator><creator>CANNATA, Robert F</creator><creator>SIGURDSON, Marin</creator><scope>EVB</scope></search><sort><creationdate>20201022</creationdate><title>MICROBOLOMETER SYSTEMS AND METHODS</title><author>KURTH, Eric A ; CANNATA, Robert F ; SIGURDSON, Marin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2020185969A33</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2020</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KURTH, Eric A</creatorcontrib><creatorcontrib>CANNATA, Robert F</creatorcontrib><creatorcontrib>SIGURDSON, Marin</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KURTH, Eric A</au><au>CANNATA, Robert F</au><au>SIGURDSON, Marin</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MICROBOLOMETER SYSTEMS AND METHODS</title><date>2020-10-22</date><risdate>2020</risdate><abstract>Microbolometer systems and methods are provided herein. For example, an infrared imaging device includes a substrate having contacts and a surface. The surface defines a plane. The infrared imaging device further includes a microbolometer array coupled to the substrate. Each microbolometer of the microbolometer array includes a cross-section having a first section, a second section substantially parallel to the first section, and a third section joining the first section and the second section.
L'invention concerne des systèmes et des procédés de microbolomètres. Par exemple, un dispositif d'imagerie infrarouge comprend un substrat présentant des contacts et une surface. La surface définit un plan. Le dispositif d'imagerie infrarouge comprend également un réseau de microbolomètres couplé au substrat. Chaque microbolomètre du réseau de microbolomètres comprend une section transversale ayant une première section, une seconde section sensiblement parallèle à la première section, et une troisième section reliant la première section et la seconde section.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
| title | MICROBOLOMETER SYSTEMS AND METHODS |
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