METHOD, DEVICE AND AND PROGRAM FOR PROCESSING DIFFRACTION IMAGES OF A CRYSTALLINE MATERIAL

The invention relates to a method for processing images obtained by a diffraction detector, of a crystalline or polycrystalline material, in which a first image of the material is acquired in a state of reference as well as a second image of the material in a deformed state. The invention is charact...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LATOURTE, Félix, ROUX, Stéphane, SHI, Qiwei, HILD, François
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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