METHODS FOR ALIGNING A LIGHT SOURCE WITH A FLOW STREAM AND SYSTEMS THEREOF
Aspects of the present disclosure include methods and systems for assessing alignment of a light source with a flow stream. Methods according to certain embodiments include detecting first and second light signals along a vertical axis of the a light irradiated flow stream and calculating a differen...
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| creator | CROW, MATTHEW J RIEKSTINS, VALDIS J PETERSEN, TIMOTHY WAYNE |
| description | Aspects of the present disclosure include methods and systems for assessing alignment of a light source with a flow stream. Methods according to certain embodiments include detecting first and second light signals along a vertical axis of the a light irradiated flow stream and calculating a differential signal amplitude between the first light signal and second light signal to assess the alignment of the light source with the flow stream. Systems for practicing the subject methods are also described.
Selon des aspects, la présente invention concerne des procédés et des systèmes d'évaluation de l'alignement d'une source de lumière avec un flux d'écoulement. Des procédés selon certains modes de réalisation consistent à détecter des premier et second signaux de lumière le long d'un axe vertical d'un flux d'écoulement éclairé par de la lumière et à calculer une amplitude de signal différentiel entre le premier signal de lumière et le second signal de lumière pour évaluer l'alignement de la source de lumière avec le flux d'écoulement. L'invention décrit également des systèmes pour l'application des procédés selon l'invention. |
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Selon des aspects, la présente invention concerne des procédés et des systèmes d'évaluation de l'alignement d'une source de lumière avec un flux d'écoulement. Des procédés selon certains modes de réalisation consistent à détecter des premier et second signaux de lumière le long d'un axe vertical d'un flux d'écoulement éclairé par de la lumière et à calculer une amplitude de signal différentiel entre le premier signal de lumière et le second signal de lumière pour évaluer l'alignement de la source de lumière avec le flux d'écoulement. L'invention décrit également des systèmes pour l'application des procédés selon l'invention.</description><language>eng ; fre</language><subject>BASIC ELECTRIC ELEMENTS ; DEVICES USING STIMULATED EMISSION ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160616&DB=EPODOC&CC=WO&NR=2016094065A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160616&DB=EPODOC&CC=WO&NR=2016094065A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CROW, MATTHEW J</creatorcontrib><creatorcontrib>RIEKSTINS, VALDIS J</creatorcontrib><creatorcontrib>PETERSEN, TIMOTHY WAYNE</creatorcontrib><title>METHODS FOR ALIGNING A LIGHT SOURCE WITH A FLOW STREAM AND SYSTEMS THEREOF</title><description>Aspects of the present disclosure include methods and systems for assessing alignment of a light source with a flow stream. Methods according to certain embodiments include detecting first and second light signals along a vertical axis of the a light irradiated flow stream and calculating a differential signal amplitude between the first light signal and second light signal to assess the alignment of the light source with the flow stream. Systems for practicing the subject methods are also described.
Selon des aspects, la présente invention concerne des procédés et des systèmes d'évaluation de l'alignement d'une source de lumière avec un flux d'écoulement. Des procédés selon certains modes de réalisation consistent à détecter des premier et second signaux de lumière le long d'un axe vertical d'un flux d'écoulement éclairé par de la lumière et à calculer une amplitude de signal différentiel entre le premier signal de lumière et le second signal de lumière pour évaluer l'alignement de la source de lumière avec le flux d'écoulement. L'invention décrit également des systèmes pour l'application des procédés selon l'invention.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>DEVICES USING STIMULATED EMISSION</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPDydQ3x8HcJVnDzD1Jw9PF09_P0c1dwVACyPEIUgv1Dg5xdFcI9QzyAYm4-_uEKwSFBro6-Co5-LgrBkcEhrr7BCiEerkGu_m48DKxpiTnFqbxQmptB2c01xNlDN7UgPz61uCAxOTUvtSQ-3N_IwNDMwNLEwMzU0dCYOFUA63wuCg</recordid><startdate>20160616</startdate><enddate>20160616</enddate><creator>CROW, MATTHEW J</creator><creator>RIEKSTINS, VALDIS J</creator><creator>PETERSEN, TIMOTHY WAYNE</creator><scope>EVB</scope></search><sort><creationdate>20160616</creationdate><title>METHODS FOR ALIGNING A LIGHT SOURCE WITH A FLOW STREAM AND SYSTEMS THEREOF</title><author>CROW, MATTHEW J ; RIEKSTINS, VALDIS J ; PETERSEN, TIMOTHY WAYNE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2016094065A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2016</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>DEVICES USING STIMULATED EMISSION</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>CROW, MATTHEW J</creatorcontrib><creatorcontrib>RIEKSTINS, VALDIS J</creatorcontrib><creatorcontrib>PETERSEN, TIMOTHY WAYNE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CROW, MATTHEW J</au><au>RIEKSTINS, VALDIS J</au><au>PETERSEN, TIMOTHY WAYNE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHODS FOR ALIGNING A LIGHT SOURCE WITH A FLOW STREAM AND SYSTEMS THEREOF</title><date>2016-06-16</date><risdate>2016</risdate><abstract>Aspects of the present disclosure include methods and systems for assessing alignment of a light source with a flow stream. Methods according to certain embodiments include detecting first and second light signals along a vertical axis of the a light irradiated flow stream and calculating a differential signal amplitude between the first light signal and second light signal to assess the alignment of the light source with the flow stream. Systems for practicing the subject methods are also described.
Selon des aspects, la présente invention concerne des procédés et des systèmes d'évaluation de l'alignement d'une source de lumière avec un flux d'écoulement. Des procédés selon certains modes de réalisation consistent à détecter des premier et second signaux de lumière le long d'un axe vertical d'un flux d'écoulement éclairé par de la lumière et à calculer une amplitude de signal différentiel entre le premier signal de lumière et le second signal de lumière pour évaluer l'alignement de la source de lumière avec le flux d'écoulement. L'invention décrit également des systèmes pour l'application des procédés selon l'invention.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS DEVICES USING STIMULATED EMISSION ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
| title | METHODS FOR ALIGNING A LIGHT SOURCE WITH A FLOW STREAM AND SYSTEMS THEREOF |
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