NEUTRAL ATOM OR MOLECULE DETECTOR
A probe (28), as used in a scanning neutral helium microscope, for detecting neutral particles originating from a beam (20) of neutral particles directed at a target location (21) of a sample (22) and subsequently scattered at the target location (21) is disclosed. The probe (28) has a direction fil...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | BALTZER, PETER |
| description | A probe (28), as used in a scanning neutral helium microscope, for detecting neutral particles originating from a beam (20) of neutral particles directed at a target location (21) of a sample (22) and subsequently scattered at the target location (21) is disclosed. The probe (28) has a direction filter (32), such a microplate shutter having a plurality of microchannels (58), that is adapted to allow passage through the direction filter (32) for particles travelling in a direction from the target location (21) to a filter area (46) of the direction filter (32). The probe further has an neutral particle detector (40) that detects the particles that has passed through the direction filter (32).
La présente invention concerne une sonde (28), telle qu'utilisée dans un microscope d'hélium neutre à balayage, permettant de détecter des particules neutres provenant d'un faisceau (20) de particules neutres dirigées au niveau d'un emplacement cible (21) d'un échantillon (22) puis diffusées au niveau de l'emplacement cible (21). La sonde (28) a un filtre de direction (32), un obturateur à microplaque ayant une pluralité de microcanaux (58), qui est adapté pour permettre le passage par le filtre de direction (32) pour les particules se déplaçant dans une direction allant de l'emplacement cible (21) à une zone de filtrage (46) du filtre de direction (32). La sonde comporte en outre un détecteur de particules neutres (40) qui détecte les particules qui sont passées par le filtre de direction (32). |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_WO2016026963A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>WO2016026963A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_WO2016026963A13</originalsourceid><addsrcrecordid>eNrjZFD0cw0NCXL0UXAM8fdV8A9S8PX3cXUO9XFVcHENcXUO8Q_iYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx4f5GBoZmBkZmlmbGjobGxKkCAJ5zIxs</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>NEUTRAL ATOM OR MOLECULE DETECTOR</title><source>esp@cenet</source><creator>BALTZER, PETER</creator><creatorcontrib>BALTZER, PETER</creatorcontrib><description>A probe (28), as used in a scanning neutral helium microscope, for detecting neutral particles originating from a beam (20) of neutral particles directed at a target location (21) of a sample (22) and subsequently scattered at the target location (21) is disclosed. The probe (28) has a direction filter (32), such a microplate shutter having a plurality of microchannels (58), that is adapted to allow passage through the direction filter (32) for particles travelling in a direction from the target location (21) to a filter area (46) of the direction filter (32). The probe further has an neutral particle detector (40) that detects the particles that has passed through the direction filter (32).
La présente invention concerne une sonde (28), telle qu'utilisée dans un microscope d'hélium neutre à balayage, permettant de détecter des particules neutres provenant d'un faisceau (20) de particules neutres dirigées au niveau d'un emplacement cible (21) d'un échantillon (22) puis diffusées au niveau de l'emplacement cible (21). La sonde (28) a un filtre de direction (32), un obturateur à microplaque ayant une pluralité de microcanaux (58), qui est adapté pour permettre le passage par le filtre de direction (32) pour les particules se déplaçant dans une direction allant de l'emplacement cible (21) à une zone de filtrage (46) du filtre de direction (32). La sonde comporte en outre un détecteur de particules neutres (40) qui détecte les particules qui sont passées par le filtre de direction (32).</description><language>eng ; fre</language><subject>GAMMA RAY OR X-RAY MICROSCOPES ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; IRRADIATION DEVICES ; MEASURING ; NUCLEAR ENGINEERING ; NUCLEAR PHYSICS ; PHYSICS ; TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160225&DB=EPODOC&CC=WO&NR=2016026963A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160225&DB=EPODOC&CC=WO&NR=2016026963A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BALTZER, PETER</creatorcontrib><title>NEUTRAL ATOM OR MOLECULE DETECTOR</title><description>A probe (28), as used in a scanning neutral helium microscope, for detecting neutral particles originating from a beam (20) of neutral particles directed at a target location (21) of a sample (22) and subsequently scattered at the target location (21) is disclosed. The probe (28) has a direction filter (32), such a microplate shutter having a plurality of microchannels (58), that is adapted to allow passage through the direction filter (32) for particles travelling in a direction from the target location (21) to a filter area (46) of the direction filter (32). The probe further has an neutral particle detector (40) that detects the particles that has passed through the direction filter (32).
La présente invention concerne une sonde (28), telle qu'utilisée dans un microscope d'hélium neutre à balayage, permettant de détecter des particules neutres provenant d'un faisceau (20) de particules neutres dirigées au niveau d'un emplacement cible (21) d'un échantillon (22) puis diffusées au niveau de l'emplacement cible (21). La sonde (28) a un filtre de direction (32), un obturateur à microplaque ayant une pluralité de microcanaux (58), qui est adapté pour permettre le passage par le filtre de direction (32) pour les particules se déplaçant dans une direction allant de l'emplacement cible (21) à une zone de filtrage (46) du filtre de direction (32). La sonde comporte en outre un détecteur de particules neutres (40) qui détecte les particules qui sont passées par le filtre de direction (32).</description><subject>GAMMA RAY OR X-RAY MICROSCOPES</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>IRRADIATION DEVICES</subject><subject>MEASURING</subject><subject>NUCLEAR ENGINEERING</subject><subject>NUCLEAR PHYSICS</subject><subject>PHYSICS</subject><subject>TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD0cw0NCXL0UXAM8fdV8A9S8PX3cXUO9XFVcHENcXUO8Q_iYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx4f5GBoZmBkZmlmbGjobGxKkCAJ5zIxs</recordid><startdate>20160225</startdate><enddate>20160225</enddate><creator>BALTZER, PETER</creator><scope>EVB</scope></search><sort><creationdate>20160225</creationdate><title>NEUTRAL ATOM OR MOLECULE DETECTOR</title><author>BALTZER, PETER</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2016026963A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2016</creationdate><topic>GAMMA RAY OR X-RAY MICROSCOPES</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>IRRADIATION DEVICES</topic><topic>MEASURING</topic><topic>NUCLEAR ENGINEERING</topic><topic>NUCLEAR PHYSICS</topic><topic>PHYSICS</topic><topic>TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>BALTZER, PETER</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BALTZER, PETER</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>NEUTRAL ATOM OR MOLECULE DETECTOR</title><date>2016-02-25</date><risdate>2016</risdate><abstract>A probe (28), as used in a scanning neutral helium microscope, for detecting neutral particles originating from a beam (20) of neutral particles directed at a target location (21) of a sample (22) and subsequently scattered at the target location (21) is disclosed. The probe (28) has a direction filter (32), such a microplate shutter having a plurality of microchannels (58), that is adapted to allow passage through the direction filter (32) for particles travelling in a direction from the target location (21) to a filter area (46) of the direction filter (32). The probe further has an neutral particle detector (40) that detects the particles that has passed through the direction filter (32).
La présente invention concerne une sonde (28), telle qu'utilisée dans un microscope d'hélium neutre à balayage, permettant de détecter des particules neutres provenant d'un faisceau (20) de particules neutres dirigées au niveau d'un emplacement cible (21) d'un échantillon (22) puis diffusées au niveau de l'emplacement cible (21). La sonde (28) a un filtre de direction (32), un obturateur à microplaque ayant une pluralité de microcanaux (58), qui est adapté pour permettre le passage par le filtre de direction (32) pour les particules se déplaçant dans une direction allant de l'emplacement cible (21) à une zone de filtrage (46) du filtre de direction (32). La sonde comporte en outre un détecteur de particules neutres (40) qui détecte les particules qui sont passées par le filtre de direction (32).</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre |
| recordid | cdi_epo_espacenet_WO2016026963A1 |
| source | esp@cenet |
| subjects | GAMMA RAY OR X-RAY MICROSCOPES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES IRRADIATION DEVICES MEASURING NUCLEAR ENGINEERING NUCLEAR PHYSICS PHYSICS TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR TESTING |
| title | NEUTRAL ATOM OR MOLECULE DETECTOR |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T03%3A19%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=BALTZER,%20PETER&rft.date=2016-02-25&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EWO2016026963A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |