OPTICAL SENSOR INTERROGATION SYSTEM A METHOD OF MANUFACTURING THE OPTICAL SENSOR INTERROGATION SYSTEM

The invention relates to an optical sensor interrogation system (12) comprising a light source (1) arranged for emitting light; a first optical arrangement (2) arranged for intercepting said light and to forward the light to an optical sensor and to receive light therefrom, wherein the wavelength re...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ODERWALD, MICHIEL PETER, CHENG, LUN KAI, TOET, PETER MARTIJN, NIEUWLAND, REMCO ALEXANDER
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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