BUILT IN SELF-TESTING AND REPAIR DEVICE AND METHOD

A memory device with background built-in self-testing (BBIST) includes a plurality of memory blocks; a memory buffer to offload data from one of the plurality of memory blocks temporarily; and a memory block stress controller to control a stress test applied to the one of the memory blocks when the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KLEVELAND, BENDIK, PATEL, JAY, SIKDAR, DIPAK, K, CHOPRA, RAJESH
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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