FILTER
Embodiments disclosed herein relate to a filter (100). In one embodiment, the filter includes a pattern (120). The pattern may reflect or fluoresce non-visible light. L'invention concerne, dans des modes de réalisation décrits ici, un filtre (100). Dans un des modes de réalisation, le filtre co...
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creator | BENSON, BRAD PHILLIPS, BARRY T ADAMS, GUY ADDINGTON, CARY G STASIAK, JAMES WU, ANGUS CLARK, STEPHAN R CROFT, DANIEL I |
description | Embodiments disclosed herein relate to a filter (100). In one embodiment, the filter includes a pattern (120). The pattern may reflect or fluoresce non-visible light.
L'invention concerne, dans des modes de réalisation décrits ici, un filtre (100). Dans un des modes de réalisation, le filtre comprend un motif (120). Le motif peut réfléchir ou émettre par fluorescence une lumière non visible. |
format | Patent |
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L'invention concerne, dans des modes de réalisation décrits ici, un filtre (100). Dans un des modes de réalisation, le filtre comprend un motif (120). Le motif peut réfléchir ou émettre par fluorescence une lumière non visible.</description><language>eng ; fre</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC ; GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES ; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES ; MEASURING ; NANOTECHNOLOGY ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PERFORMING OPERATIONS ; PHYSICS ; SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES ; TECHNICAL SUBJECTS COVERED BY FORMER USPC ; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS ; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ARTCOLLECTIONS [XRACs] AND DIGESTS ; TESTING ; TRANSPORTING</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120802&DB=EPODOC&CC=WO&NR=2012102690A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25568,76551</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120802&DB=EPODOC&CC=WO&NR=2012102690A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BENSON, BRAD</creatorcontrib><creatorcontrib>PHILLIPS, BARRY T</creatorcontrib><creatorcontrib>ADAMS, GUY</creatorcontrib><creatorcontrib>ADDINGTON, CARY G</creatorcontrib><creatorcontrib>STASIAK, JAMES</creatorcontrib><creatorcontrib>WU, ANGUS</creatorcontrib><creatorcontrib>CLARK, STEPHAN R</creatorcontrib><creatorcontrib>CROFT, DANIEL I</creatorcontrib><title>FILTER</title><description>Embodiments disclosed herein relate to a filter (100). In one embodiment, the filter includes a pattern (120). The pattern may reflect or fluoresce non-visible light.
L'invention concerne, dans des modes de réalisation décrits ici, un filtre (100). Dans un des modes de réalisation, le filtre comprend un motif (120). Le motif peut réfléchir ou émettre par fluorescence une lumière non visible.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC</subject><subject>GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</subject><subject>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</subject><subject>MEASURING</subject><subject>NANOTECHNOLOGY</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER USPC</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS</subject><subject>TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ARTCOLLECTIONS [XRACs] AND DIGESTS</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZGBz8_QJcQ3iYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx4f5GBoZGhgZGZpYGjobGxKkCAFUMG5E</recordid><startdate>20120802</startdate><enddate>20120802</enddate><creator>BENSON, BRAD</creator><creator>PHILLIPS, BARRY T</creator><creator>ADAMS, GUY</creator><creator>ADDINGTON, CARY G</creator><creator>STASIAK, JAMES</creator><creator>WU, ANGUS</creator><creator>CLARK, STEPHAN R</creator><creator>CROFT, DANIEL I</creator><scope>EVB</scope></search><sort><creationdate>20120802</creationdate><title>FILTER</title><author>BENSON, BRAD ; PHILLIPS, BARRY T ; ADAMS, GUY ; ADDINGTON, CARY G ; STASIAK, JAMES ; WU, ANGUS ; CLARK, STEPHAN R ; CROFT, DANIEL I</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2012102690A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2012</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC</topic><topic>GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</topic><topic>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</topic><topic>MEASURING</topic><topic>NANOTECHNOLOGY</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER USPC</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS</topic><topic>TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ARTCOLLECTIONS [XRACs] AND DIGESTS</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>BENSON, BRAD</creatorcontrib><creatorcontrib>PHILLIPS, BARRY T</creatorcontrib><creatorcontrib>ADAMS, GUY</creatorcontrib><creatorcontrib>ADDINGTON, CARY G</creatorcontrib><creatorcontrib>STASIAK, JAMES</creatorcontrib><creatorcontrib>WU, ANGUS</creatorcontrib><creatorcontrib>CLARK, STEPHAN R</creatorcontrib><creatorcontrib>CROFT, DANIEL I</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BENSON, BRAD</au><au>PHILLIPS, BARRY T</au><au>ADAMS, GUY</au><au>ADDINGTON, CARY G</au><au>STASIAK, JAMES</au><au>WU, ANGUS</au><au>CLARK, STEPHAN R</au><au>CROFT, DANIEL I</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>FILTER</title><date>2012-08-02</date><risdate>2012</risdate><abstract>Embodiments disclosed herein relate to a filter (100). In one embodiment, the filter includes a pattern (120). The pattern may reflect or fluoresce non-visible light.
L'invention concerne, dans des modes de réalisation décrits ici, un filtre (100). Dans un des modes de réalisation, le filtre comprend un motif (120). Le motif peut réfléchir ou émettre par fluorescence une lumière non visible.</abstract><oa>free_for_read</oa></addata></record> |
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language | eng ; fre |
recordid | cdi_epo_espacenet_WO2012102690A1 |
source | esp@cenet |
subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES MEASURING NANOTECHNOLOGY OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PERFORMING OPERATIONS PHYSICS SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ARTCOLLECTIONS [XRACs] AND DIGESTS TESTING TRANSPORTING |
title | FILTER |
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