SYSTEM AND METHOD FOR THE DETECTION AND CHARACTERISATION OF NANOPARTICLES
The invention relates to a system and a method for the detection and characterisation of nanoparticles, based on a micro-polarimeter/interferometer with two operating modes, including one or two arms for the real-time detection and characterisation of nanoparticles. The invention comprises the use o...
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| creator | BARROSO BOIXADER, FERRAN CANILLAS BIOSCA, ADOLF ARTEAGA BARRIEL, ORIOL BERTRAN SERRA, ENRIC JOVER COMAS, ERIC |
| description | The invention relates to a system and a method for the detection and characterisation of nanoparticles, based on a micro-polarimeter/interferometer with two operating modes, including one or two arms for the real-time detection and characterisation of nanoparticles. The invention comprises the use of a polariser (3) for polarising the light beam generated by the light source (2) and a photoelastic modulator (10) for modulating the periodic phase in the polarisation state of the light generated by the source (2). The nanoparticles travel sequentially through a sample holder (11) that is aligned with the first arm (7) towards a region in which the light has been focused by a lens (17).
Se describen un sistema y un método de detección y caracterización de nanopartículas basado en un micropolarímetro-interferómetro con dos modos de funcionamiento, con uno o dos brazos, para la caracterización y detección tiempo real de nanopartículas. Se utilizan un polarizador (3) encargado de polarizar el haz de luz generado por la fuente de luz (2) y a continuación un modulador fotoelástico (10) adaptado para modular la fase periódica en estado de polarización de la luz generada por la fuente (2). Las nanopartículas circulan secuencialmente hacia una región donde la luz ha sido focalizada por una lente (17) por un portamuestras (11) que se encuentra alineado con el primer brazo (7).
L'invention concerne un système et un procédé de détection et de caractérisation de nanoparticules à l'aide d'un micropolarimètre-interféromètre à deux modes de fonctionnement, l'un des modes consistant à utiliser deux bras pour la caractérisation et la détection en temps réel de nanoparticules de taille réduite. |
| format | Patent |
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Se describen un sistema y un método de detección y caracterización de nanopartículas basado en un micropolarímetro-interferómetro con dos modos de funcionamiento, con uno o dos brazos, para la caracterización y detección tiempo real de nanopartículas. Se utilizan un polarizador (3) encargado de polarizar el haz de luz generado por la fuente de luz (2) y a continuación un modulador fotoelástico (10) adaptado para modular la fase periódica en estado de polarización de la luz generada por la fuente (2). Las nanopartículas circulan secuencialmente hacia una región donde la luz ha sido focalizada por una lente (17) por un portamuestras (11) que se encuentra alineado con el primer brazo (7).
L'invention concerne un système et un procédé de détection et de caractérisation de nanoparticules à l'aide d'un micropolarimètre-interféromètre à deux modes de fonctionnement, l'un des modes consistant à utiliser deux bras pour la caractérisation et la détection en temps réel de nanoparticules de taille réduite.</description><language>eng ; fre ; spa</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110818&DB=EPODOC&CC=WO&NR=2011076968A3$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110818&DB=EPODOC&CC=WO&NR=2011076968A3$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BARROSO BOIXADER, FERRAN</creatorcontrib><creatorcontrib>CANILLAS BIOSCA, ADOLF</creatorcontrib><creatorcontrib>ARTEAGA BARRIEL, ORIOL</creatorcontrib><creatorcontrib>BERTRAN SERRA, ENRIC</creatorcontrib><creatorcontrib>JOVER COMAS, ERIC</creatorcontrib><title>SYSTEM AND METHOD FOR THE DETECTION AND CHARACTERISATION OF NANOPARTICLES</title><description>The invention relates to a system and a method for the detection and characterisation of nanoparticles, based on a micro-polarimeter/interferometer with two operating modes, including one or two arms for the real-time detection and characterisation of nanoparticles. The invention comprises the use of a polariser (3) for polarising the light beam generated by the light source (2) and a photoelastic modulator (10) for modulating the periodic phase in the polarisation state of the light generated by the source (2). The nanoparticles travel sequentially through a sample holder (11) that is aligned with the first arm (7) towards a region in which the light has been focused by a lens (17).
Se describen un sistema y un método de detección y caracterización de nanopartículas basado en un micropolarímetro-interferómetro con dos modos de funcionamiento, con uno o dos brazos, para la caracterización y detección tiempo real de nanopartículas. Se utilizan un polarizador (3) encargado de polarizar el haz de luz generado por la fuente de luz (2) y a continuación un modulador fotoelástico (10) adaptado para modular la fase periódica en estado de polarización de la luz generada por la fuente (2). Las nanopartículas circulan secuencialmente hacia una región donde la luz ha sido focalizada por una lente (17) por un portamuestras (11) que se encuentra alineado con el primer brazo (7).
L'invention concerne un système et un procédé de détection et de caractérisation de nanoparticules à l'aide d'un micropolarimètre-interféromètre à deux modes de fonctionnement, l'un des modes consistant à utiliser deux bras pour la caractérisation et la détection en temps réel de nanoparticules de taille réduite.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPAMjgwOcfVVcPRzUfB1DfHwd1Fw8w9SCPFwVXBxDXF1DvH09wNLOns4Bjk6h7gGeQY7ggX93RT8HP38AxyDQjydfVyDeRhY0xJzilN5oTQ3g7Kba4izh25qQX58anFBYnJqXmpJfLi_kYGhoYG5maWZhaOxMXGqANwlLhM</recordid><startdate>20110818</startdate><enddate>20110818</enddate><creator>BARROSO BOIXADER, FERRAN</creator><creator>CANILLAS BIOSCA, ADOLF</creator><creator>ARTEAGA BARRIEL, ORIOL</creator><creator>BERTRAN SERRA, ENRIC</creator><creator>JOVER COMAS, ERIC</creator><scope>EVB</scope></search><sort><creationdate>20110818</creationdate><title>SYSTEM AND METHOD FOR THE DETECTION AND CHARACTERISATION OF NANOPARTICLES</title><author>BARROSO BOIXADER, FERRAN ; CANILLAS BIOSCA, ADOLF ; ARTEAGA BARRIEL, ORIOL ; BERTRAN SERRA, ENRIC ; JOVER COMAS, ERIC</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2011076968A33</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; spa</language><creationdate>2011</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>BARROSO BOIXADER, FERRAN</creatorcontrib><creatorcontrib>CANILLAS BIOSCA, ADOLF</creatorcontrib><creatorcontrib>ARTEAGA BARRIEL, ORIOL</creatorcontrib><creatorcontrib>BERTRAN SERRA, ENRIC</creatorcontrib><creatorcontrib>JOVER COMAS, ERIC</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BARROSO BOIXADER, FERRAN</au><au>CANILLAS BIOSCA, ADOLF</au><au>ARTEAGA BARRIEL, ORIOL</au><au>BERTRAN SERRA, ENRIC</au><au>JOVER COMAS, ERIC</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEM AND METHOD FOR THE DETECTION AND CHARACTERISATION OF NANOPARTICLES</title><date>2011-08-18</date><risdate>2011</risdate><abstract>The invention relates to a system and a method for the detection and characterisation of nanoparticles, based on a micro-polarimeter/interferometer with two operating modes, including one or two arms for the real-time detection and characterisation of nanoparticles. The invention comprises the use of a polariser (3) for polarising the light beam generated by the light source (2) and a photoelastic modulator (10) for modulating the periodic phase in the polarisation state of the light generated by the source (2). The nanoparticles travel sequentially through a sample holder (11) that is aligned with the first arm (7) towards a region in which the light has been focused by a lens (17).
Se describen un sistema y un método de detección y caracterización de nanopartículas basado en un micropolarímetro-interferómetro con dos modos de funcionamiento, con uno o dos brazos, para la caracterización y detección tiempo real de nanopartículas. Se utilizan un polarizador (3) encargado de polarizar el haz de luz generado por la fuente de luz (2) y a continuación un modulador fotoelástico (10) adaptado para modular la fase periódica en estado de polarización de la luz generada por la fuente (2). Las nanopartículas circulan secuencialmente hacia una región donde la luz ha sido focalizada por una lente (17) por un portamuestras (11) que se encuentra alineado con el primer brazo (7).
L'invention concerne un système et un procédé de détection et de caractérisation de nanoparticules à l'aide d'un micropolarimètre-interféromètre à deux modes de fonctionnement, l'un des modes consistant à utiliser deux bras pour la caractérisation et la détection en temps réel de nanoparticules de taille réduite.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | SYSTEM AND METHOD FOR THE DETECTION AND CHARACTERISATION OF NANOPARTICLES |
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