METHODS FOR ASSESSING A TEMPERATURE IN A SUBSURFACE FORMATION
Methods for assessing a temperature in an opening in a subsurface formation are described herein. A method may include assessing one or more dielectric properties along a length of an insulated conductor located in the opening and assessing one or more temperatures along the length of the insulated...
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| creator | THOMPSON, STEPHEN TAYLOR NGUYEN, SCOTT VINH GESUALDI, ERIC ABREU DE ST. REMEY, EDWARD EVERETT ARORA, DHRUV BURNS, DAVID BOOTH BASS, RONALD MARSHALL |
| description | Methods for assessing a temperature in an opening in a subsurface formation are described herein. A method may include assessing one or more dielectric properties along a length of an insulated conductor located in the opening and assessing one or more temperatures along the length of the insulated conductor based on the one or more assessed dielectric properties.
L'invention concerne des procédés permettant d'évaluer une température dans une ouverture d'une formation souterraine. Un procédé peut consister notamment à évaluer une ou plusieurs propriétés diélectriques sur une longueur d'un conducteur isolé situé dans l'ouverture et à évaluer une ou plusieurs températures sur la longueur du conducteur isolé en fonction desdites propriétés diélectriques. |
| format | Patent |
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L'invention concerne des procédés permettant d'évaluer une température dans une ouverture d'une formation souterraine. Un procédé peut consister notamment à évaluer une ou plusieurs propriétés diélectriques sur une longueur d'un conducteur isolé situé dans l'ouverture et à évaluer une ou plusieurs températures sur la longueur du conducteur isolé en fonction desdites propriétés diélectriques.</description><language>eng ; fre</language><subject>MEASURING ; MEASURING QUANTITY OF HEAT ; MEASURING TEMPERATURE ; PHYSICS ; TESTING ; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110414&DB=EPODOC&CC=WO&NR=2011044489A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110414&DB=EPODOC&CC=WO&NR=2011044489A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>THOMPSON, STEPHEN TAYLOR</creatorcontrib><creatorcontrib>NGUYEN, SCOTT VINH</creatorcontrib><creatorcontrib>GESUALDI, ERIC ABREU</creatorcontrib><creatorcontrib>DE ST. REMEY, EDWARD EVERETT</creatorcontrib><creatorcontrib>ARORA, DHRUV</creatorcontrib><creatorcontrib>BURNS, DAVID BOOTH</creatorcontrib><creatorcontrib>BASS, RONALD MARSHALL</creatorcontrib><title>METHODS FOR ASSESSING A TEMPERATURE IN A SUBSURFACE FORMATION</title><description>Methods for assessing a temperature in an opening in a subsurface formation are described herein. A method may include assessing one or more dielectric properties along a length of an insulated conductor located in the opening and assessing one or more temperatures along the length of the insulated conductor based on the one or more assessed dielectric properties.
L'invention concerne des procédés permettant d'évaluer une température dans une ouverture d'une formation souterraine. Un procédé peut consister notamment à évaluer une ou plusieurs propriétés diélectriques sur une longueur d'un conducteur isolé situé dans l'ouverture et à évaluer une ou plusieurs températures sur la longueur du conducteur isolé en fonction desdites propriétés diélectriques.</description><subject>MEASURING</subject><subject>MEASURING QUANTITY OF HEAT</subject><subject>MEASURING TEMPERATURE</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLD1dQ3x8HcJVnDzD1JwDA52DQ729HNXcFQIcfUNcA1yDAkNclXw9AMKBIc6BYcGuTk6u4LU-jqGePr78TCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-HB_IwNDQwMTExMLS0dDY-JUAQDXlyrK</recordid><startdate>20110414</startdate><enddate>20110414</enddate><creator>THOMPSON, STEPHEN TAYLOR</creator><creator>NGUYEN, SCOTT VINH</creator><creator>GESUALDI, ERIC ABREU</creator><creator>DE ST. REMEY, EDWARD EVERETT</creator><creator>ARORA, DHRUV</creator><creator>BURNS, DAVID BOOTH</creator><creator>BASS, RONALD MARSHALL</creator><scope>EVB</scope></search><sort><creationdate>20110414</creationdate><title>METHODS FOR ASSESSING A TEMPERATURE IN A SUBSURFACE FORMATION</title><author>THOMPSON, STEPHEN TAYLOR ; NGUYEN, SCOTT VINH ; GESUALDI, ERIC ABREU ; DE ST. REMEY, EDWARD EVERETT ; ARORA, DHRUV ; BURNS, DAVID BOOTH ; BASS, RONALD MARSHALL</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2011044489A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2011</creationdate><topic>MEASURING</topic><topic>MEASURING QUANTITY OF HEAT</topic><topic>MEASURING TEMPERATURE</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>THOMPSON, STEPHEN TAYLOR</creatorcontrib><creatorcontrib>NGUYEN, SCOTT VINH</creatorcontrib><creatorcontrib>GESUALDI, ERIC ABREU</creatorcontrib><creatorcontrib>DE ST. REMEY, EDWARD EVERETT</creatorcontrib><creatorcontrib>ARORA, DHRUV</creatorcontrib><creatorcontrib>BURNS, DAVID BOOTH</creatorcontrib><creatorcontrib>BASS, RONALD MARSHALL</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>THOMPSON, STEPHEN TAYLOR</au><au>NGUYEN, SCOTT VINH</au><au>GESUALDI, ERIC ABREU</au><au>DE ST. REMEY, EDWARD EVERETT</au><au>ARORA, DHRUV</au><au>BURNS, DAVID BOOTH</au><au>BASS, RONALD MARSHALL</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHODS FOR ASSESSING A TEMPERATURE IN A SUBSURFACE FORMATION</title><date>2011-04-14</date><risdate>2011</risdate><abstract>Methods for assessing a temperature in an opening in a subsurface formation are described herein. A method may include assessing one or more dielectric properties along a length of an insulated conductor located in the opening and assessing one or more temperatures along the length of the insulated conductor based on the one or more assessed dielectric properties.
L'invention concerne des procédés permettant d'évaluer une température dans une ouverture d'une formation souterraine. Un procédé peut consister notamment à évaluer une ou plusieurs propriétés diélectriques sur une longueur d'un conducteur isolé situé dans l'ouverture et à évaluer une ou plusieurs températures sur la longueur du conducteur isolé en fonction desdites propriétés diélectriques.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR |
| title | METHODS FOR ASSESSING A TEMPERATURE IN A SUBSURFACE FORMATION |
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