HIGH SPEED QUANTUM EFFICIENCY MEASUREMENT APPARATUS UTILIZING SOLID STATE LIGHTSOURCE

The present invention provides a high-speed Quantum Efficiency (QE) measurement device that includes at least one device under test (DUT), at least one conditioned light source with a less than 50nm bandwidth, where a portion of the conditioned light source 5 is monitored. Delivery optics are provid...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ARBORE, MARK, A, VASILYEV, LEONID, A, KLEIN, DAVID, L, HUDSON, JAMES, E, HORNER, GREGORY, S, SCHMIDT, JOHN, M
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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