QUALITY TESTER OF GLASS BOARD AND METHOD THEREOF
Provided are an apparatus for inspecting quality of a glass substrate including an illumination part for radiating light to transmit through a glass substrate only to inspect waveness of the glass substrate. The apparatus and method use a camera to more clearly photograph a shadow image of a surface...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | WOO, BONG-JOO |
| description | Provided are an apparatus for inspecting quality of a glass substrate including an illumination part for radiating light to transmit through a glass substrate only to inspect waveness of the glass substrate. The apparatus and method use a camera to more clearly photograph a shadow image of a surface of a glass substrate and more precisely inspect the existence of waveness from the shadow image through a differential algorithm. As a result, it is possible to inspect in real time the quality of the glass substrate continuously conveyed by a conveyance unit to thereby improve quality of and satisfaction regarding the product. Of course, it is also possible to reduce time consumed to inspect the quality of the glass substrate to thereby rapidly and continuously perform processes using plasma such as deposition, etching, sputtering, and so on.
Dispositif de contrôle de la qualité d'un substrat en verre, comprenant une partie d'éclairage dont la lumière émise traverse ce substrat de verre aux seules fins d'y détecter des ondulations. Le dispositif et le procédé font appel à une caméra permettant de photographier plus nettement une ombre portée de limage d'une surface de substrat de verre, et plus précisément de contrôler la présence d'ondulations à partir de cette image d'ombre portée au moyen d'un algorithme différentiel. Il est ainsi possible de contrôler en temps réel la qualité d'un substrat de verre déplacé en continu par une unité transporteuse, et donc d'en améliorer la qualité et la satisfaction du client. De plus, il est évidemment possible d'accélérer les contrôles de qualité de manière à effectuer rapidement et en continu diverses opérations faisant intervenir un plasma telles que dépôt, gravure, pulvérisation, etc |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_WO2008050941A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>WO2008050941A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_WO2008050941A13</originalsourceid><addsrcrecordid>eNrjZDAIDHX08QyJVAhxDQ5xDVLwd1Nw93EMDlZw8ncMclFw9HNR8HUN8fB3UQjxcA1y9XfjYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx4f5GBgYWBqYGliaGjobGxKkCALGuJvk</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>QUALITY TESTER OF GLASS BOARD AND METHOD THEREOF</title><source>esp@cenet</source><creator>WOO, BONG-JOO</creator><creatorcontrib>WOO, BONG-JOO</creatorcontrib><description>Provided are an apparatus for inspecting quality of a glass substrate including an illumination part for radiating light to transmit through a glass substrate only to inspect waveness of the glass substrate. The apparatus and method use a camera to more clearly photograph a shadow image of a surface of a glass substrate and more precisely inspect the existence of waveness from the shadow image through a differential algorithm. As a result, it is possible to inspect in real time the quality of the glass substrate continuously conveyed by a conveyance unit to thereby improve quality of and satisfaction regarding the product. Of course, it is also possible to reduce time consumed to inspect the quality of the glass substrate to thereby rapidly and continuously perform processes using plasma such as deposition, etching, sputtering, and so on.
Dispositif de contrôle de la qualité d'un substrat en verre, comprenant une partie d'éclairage dont la lumière émise traverse ce substrat de verre aux seules fins d'y détecter des ondulations. Le dispositif et le procédé font appel à une caméra permettant de photographier plus nettement une ombre portée de limage d'une surface de substrat de verre, et plus précisément de contrôler la présence d'ondulations à partir de cette image d'ombre portée au moyen d'un algorithme différentiel. Il est ainsi possible de contrôler en temps réel la qualité d'un substrat de verre déplacé en continu par une unité transporteuse, et donc d'en améliorer la qualité et la satisfaction du client. De plus, il est évidemment possible d'accélérer les contrôles de qualité de manière à effectuer rapidement et en continu diverses opérations faisant intervenir un plasma telles que dépôt, gravure, pulvérisation, etc</description><language>eng ; fre</language><subject>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING ; FREQUENCY-CHANGING ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; NON-LINEAR OPTICS ; OPTICAL ANALOGUE/DIGITAL CONVERTERS ; OPTICAL LOGIC ELEMENTS ; OPTICS ; PHYSICS ; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080502&DB=EPODOC&CC=WO&NR=2008050941A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080502&DB=EPODOC&CC=WO&NR=2008050941A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WOO, BONG-JOO</creatorcontrib><title>QUALITY TESTER OF GLASS BOARD AND METHOD THEREOF</title><description>Provided are an apparatus for inspecting quality of a glass substrate including an illumination part for radiating light to transmit through a glass substrate only to inspect waveness of the glass substrate. The apparatus and method use a camera to more clearly photograph a shadow image of a surface of a glass substrate and more precisely inspect the existence of waveness from the shadow image through a differential algorithm. As a result, it is possible to inspect in real time the quality of the glass substrate continuously conveyed by a conveyance unit to thereby improve quality of and satisfaction regarding the product. Of course, it is also possible to reduce time consumed to inspect the quality of the glass substrate to thereby rapidly and continuously perform processes using plasma such as deposition, etching, sputtering, and so on.
Dispositif de contrôle de la qualité d'un substrat en verre, comprenant une partie d'éclairage dont la lumière émise traverse ce substrat de verre aux seules fins d'y détecter des ondulations. Le dispositif et le procédé font appel à une caméra permettant de photographier plus nettement une ombre portée de limage d'une surface de substrat de verre, et plus précisément de contrôler la présence d'ondulations à partir de cette image d'ombre portée au moyen d'un algorithme différentiel. Il est ainsi possible de contrôler en temps réel la qualité d'un substrat de verre déplacé en continu par une unité transporteuse, et donc d'en améliorer la qualité et la satisfaction du client. De plus, il est évidemment possible d'accélérer les contrôles de qualité de manière à effectuer rapidement et en continu diverses opérations faisant intervenir un plasma telles que dépôt, gravure, pulvérisation, etc</description><subject>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</subject><subject>FREQUENCY-CHANGING</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>NON-LINEAR OPTICS</subject><subject>OPTICAL ANALOGUE/DIGITAL CONVERTERS</subject><subject>OPTICAL LOGIC ELEMENTS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAIDHX08QyJVAhxDQ5xDVLwd1Nw93EMDlZw8ncMclFw9HNR8HUN8fB3UQjxcA1y9XfjYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx4f5GBgYWBqYGliaGjobGxKkCALGuJvk</recordid><startdate>20080502</startdate><enddate>20080502</enddate><creator>WOO, BONG-JOO</creator><scope>EVB</scope></search><sort><creationdate>20080502</creationdate><title>QUALITY TESTER OF GLASS BOARD AND METHOD THEREOF</title><author>WOO, BONG-JOO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2008050941A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2008</creationdate><topic>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</topic><topic>FREQUENCY-CHANGING</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>NON-LINEAR OPTICS</topic><topic>OPTICAL ANALOGUE/DIGITAL CONVERTERS</topic><topic>OPTICAL LOGIC ELEMENTS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WOO, BONG-JOO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WOO, BONG-JOO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>QUALITY TESTER OF GLASS BOARD AND METHOD THEREOF</title><date>2008-05-02</date><risdate>2008</risdate><abstract>Provided are an apparatus for inspecting quality of a glass substrate including an illumination part for radiating light to transmit through a glass substrate only to inspect waveness of the glass substrate. The apparatus and method use a camera to more clearly photograph a shadow image of a surface of a glass substrate and more precisely inspect the existence of waveness from the shadow image through a differential algorithm. As a result, it is possible to inspect in real time the quality of the glass substrate continuously conveyed by a conveyance unit to thereby improve quality of and satisfaction regarding the product. Of course, it is also possible to reduce time consumed to inspect the quality of the glass substrate to thereby rapidly and continuously perform processes using plasma such as deposition, etching, sputtering, and so on.
Dispositif de contrôle de la qualité d'un substrat en verre, comprenant une partie d'éclairage dont la lumière émise traverse ce substrat de verre aux seules fins d'y détecter des ondulations. Le dispositif et le procédé font appel à une caméra permettant de photographier plus nettement une ombre portée de limage d'une surface de substrat de verre, et plus précisément de contrôler la présence d'ondulations à partir de cette image d'ombre portée au moyen d'un algorithme différentiel. Il est ainsi possible de contrôler en temps réel la qualité d'un substrat de verre déplacé en continu par une unité transporteuse, et donc d'en améliorer la qualité et la satisfaction du client. De plus, il est évidemment possible d'accélérer les contrôles de qualité de manière à effectuer rapidement et en continu diverses opérations faisant intervenir un plasma telles que dépôt, gravure, pulvérisation, etc</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre |
| recordid | cdi_epo_espacenet_WO2008050941A1 |
| source | esp@cenet |
| subjects | DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING FREQUENCY-CHANGING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING |
| title | QUALITY TESTER OF GLASS BOARD AND METHOD THEREOF |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T18%3A23%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WOO,%20BONG-JOO&rft.date=2008-05-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EWO2008050941A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |