METHOD AND APPARATUS FOR SIMULTANEOUS DETECTION AND MEASUREMENT OF CHARGED PARTICLES AT ONE OR MORE LEVELS OF PARTICLE FLUX FOR ANALYSIS OF SAME
A charged particle detector and method are disclosed providing for simultaneous detection and measurement of charged particles at one or more levels of particle flux in a measurement cycle. The detector provides multiple and independently selectable levels of integration and/or gain in a fully addre...
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| creator | SPERLINE, ROGER BARINAGA, CHARLES J BARNES, JAMES H. IV DENTON, BONNER M ATLAS, EUGENE KOPPENAAL, DAVID W HIEFTJE, GARY |
| description | A charged particle detector and method are disclosed providing for simultaneous detection and measurement of charged particles at one or more levels of particle flux in a measurement cycle. The detector provides multiple and independently selectable levels of integration and/or gain in a fully addressable readout manner.
La présente invention concerne un détecteur de particules chargées et un procédé permettant d'effectuer une détection et une mesure simultanées de particules chargées à un ou plusieurs niveaux de flux de particules dans un cycle de mesure. Le détecteur fournit de multiples niveaux d'intégration et/ou de gain indépendamment sélectionnable d'une manière entièrement adressable en lecture. |
| format | Patent |
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La présente invention concerne un détecteur de particules chargées et un procédé permettant d'effectuer une détection et une mesure simultanées de particules chargées à un ou plusieurs niveaux de flux de particules dans un cycle de mesure. Le détecteur fournit de multiples niveaux d'intégration et/ou de gain indépendamment sélectionnable d'une manière entièrement adressable en lecture.</description><language>eng ; fre</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY</subject><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20071018&DB=EPODOC&CC=WO&NR=2007118186A2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20071018&DB=EPODOC&CC=WO&NR=2007118186A2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SPERLINE, ROGER</creatorcontrib><creatorcontrib>BARINAGA, CHARLES J</creatorcontrib><creatorcontrib>BARNES, JAMES H. IV</creatorcontrib><creatorcontrib>DENTON, BONNER M</creatorcontrib><creatorcontrib>ATLAS, EUGENE</creatorcontrib><creatorcontrib>KOPPENAAL, DAVID W</creatorcontrib><creatorcontrib>HIEFTJE, GARY</creatorcontrib><title>METHOD AND APPARATUS FOR SIMULTANEOUS DETECTION AND MEASUREMENT OF CHARGED PARTICLES AT ONE OR MORE LEVELS OF PARTICLE FLUX FOR ANALYSIS OF SAME</title><description>A charged particle detector and method are disclosed providing for simultaneous detection and measurement of charged particles at one or more levels of particle flux in a measurement cycle. The detector provides multiple and independently selectable levels of integration and/or gain in a fully addressable readout manner.
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La présente invention concerne un détecteur de particules chargées et un procédé permettant d'effectuer une détection et une mesure simultanées de particules chargées à un ou plusieurs niveaux de flux de particules dans un cycle de mesure. Le détecteur fournit de multiples niveaux d'intégration et/ou de gain indépendamment sélectionnable d'une manière entièrement adressable en lecture.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY |
| title | METHOD AND APPARATUS FOR SIMULTANEOUS DETECTION AND MEASUREMENT OF CHARGED PARTICLES AT ONE OR MORE LEVELS OF PARTICLE FLUX FOR ANALYSIS OF SAME |
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