RFID DEVICE TEST THRESHOLDS SYSTEMS AND METHODS
Systems and methods are disclosed herein to provide RFID device test techniques. For example, in accordance with an embodiment of the present invention, a radio frequency identification (RFID) device test system includes an RFID device tester adapted to test RFID devices that are disposed in a close...
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| creator | FORSTER, IAN, JAMES WEAKLEY, THOMAS, C |
| description | Systems and methods are disclosed herein to provide RFID device test techniques. For example, in accordance with an embodiment of the present invention, a radio frequency identification (RFID) device test system includes an RFID device tester adapted to test RFID devices that are disposed in a closely spaced configuration. The RFID device tester applies a variable threshold, to each of the RFID devices tested, based on characteristics of at least one of the RFID devices neighboring the RFID device being tested.
L'invention concerne des systèmes et des procédés permettant de disposer de techniques de test de dispositif d'identification par radiofréquence. Dans un mode de réalisation de la présente invention par exemple, un système de test de dispositif par radiofréquence (RFID) comprend un testeur de dispositif RFID adapté aux dispositifs RFID de test qui sont disposés selon une configuration d'espacement serrée. Le testeur de dispositif RFID applique un seuil variable à chaque dispositif RFID testé, basé sur les caractéristiques d'au moins un dispositif RFID situé à proximité du dispositif RFID testé. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_WO2006110414A2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>WO2006110414A2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_WO2006110414A23</originalsourceid><addsrcrecordid>eNrjZNAPcvN0UXBxDfN0dlUIcQ0OUQjxCHIN9vD3cQlWCI4MDnH1DVZw9HNR8HUN8fB3CeZhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHh_kYGBmaGhgYmhiaORsbEqQIAoGcm4g</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>RFID DEVICE TEST THRESHOLDS SYSTEMS AND METHODS</title><source>esp@cenet</source><creator>FORSTER, IAN, JAMES ; WEAKLEY, THOMAS, C</creator><creatorcontrib>FORSTER, IAN, JAMES ; WEAKLEY, THOMAS, C</creatorcontrib><description>Systems and methods are disclosed herein to provide RFID device test techniques. For example, in accordance with an embodiment of the present invention, a radio frequency identification (RFID) device test system includes an RFID device tester adapted to test RFID devices that are disposed in a closely spaced configuration. The RFID device tester applies a variable threshold, to each of the RFID devices tested, based on characteristics of at least one of the RFID devices neighboring the RFID device being tested.
L'invention concerne des systèmes et des procédés permettant de disposer de techniques de test de dispositif d'identification par radiofréquence. Dans un mode de réalisation de la présente invention par exemple, un système de test de dispositif par radiofréquence (RFID) comprend un testeur de dispositif RFID adapté aux dispositifs RFID de test qui sont disposés selon une configuration d'espacement serrée. Le testeur de dispositif RFID applique un seuil variable à chaque dispositif RFID testé, basé sur les caractéristiques d'au moins un dispositif RFID situé à proximité du dispositif RFID testé.</description><language>eng ; fre</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20061019&DB=EPODOC&CC=WO&NR=2006110414A2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20061019&DB=EPODOC&CC=WO&NR=2006110414A2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FORSTER, IAN, JAMES</creatorcontrib><creatorcontrib>WEAKLEY, THOMAS, C</creatorcontrib><title>RFID DEVICE TEST THRESHOLDS SYSTEMS AND METHODS</title><description>Systems and methods are disclosed herein to provide RFID device test techniques. For example, in accordance with an embodiment of the present invention, a radio frequency identification (RFID) device test system includes an RFID device tester adapted to test RFID devices that are disposed in a closely spaced configuration. The RFID device tester applies a variable threshold, to each of the RFID devices tested, based on characteristics of at least one of the RFID devices neighboring the RFID device being tested.
L'invention concerne des systèmes et des procédés permettant de disposer de techniques de test de dispositif d'identification par radiofréquence. Dans un mode de réalisation de la présente invention par exemple, un système de test de dispositif par radiofréquence (RFID) comprend un testeur de dispositif RFID adapté aux dispositifs RFID de test qui sont disposés selon une configuration d'espacement serrée. Le testeur de dispositif RFID applique un seuil variable à chaque dispositif RFID testé, basé sur les caractéristiques d'au moins un dispositif RFID situé à proximité du dispositif RFID testé.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAPcvN0UXBxDfN0dlUIcQ0OUQjxCHIN9vD3cQlWCI4MDnH1DVZw9HNR8HUN8fB3CeZhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfHh_kYGBmaGhgYmhiaORsbEqQIAoGcm4g</recordid><startdate>20061019</startdate><enddate>20061019</enddate><creator>FORSTER, IAN, JAMES</creator><creator>WEAKLEY, THOMAS, C</creator><scope>EVB</scope></search><sort><creationdate>20061019</creationdate><title>RFID DEVICE TEST THRESHOLDS SYSTEMS AND METHODS</title><author>FORSTER, IAN, JAMES ; WEAKLEY, THOMAS, C</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2006110414A23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2006</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>FORSTER, IAN, JAMES</creatorcontrib><creatorcontrib>WEAKLEY, THOMAS, C</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FORSTER, IAN, JAMES</au><au>WEAKLEY, THOMAS, C</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>RFID DEVICE TEST THRESHOLDS SYSTEMS AND METHODS</title><date>2006-10-19</date><risdate>2006</risdate><abstract>Systems and methods are disclosed herein to provide RFID device test techniques. For example, in accordance with an embodiment of the present invention, a radio frequency identification (RFID) device test system includes an RFID device tester adapted to test RFID devices that are disposed in a closely spaced configuration. The RFID device tester applies a variable threshold, to each of the RFID devices tested, based on characteristics of at least one of the RFID devices neighboring the RFID device being tested.
L'invention concerne des systèmes et des procédés permettant de disposer de techniques de test de dispositif d'identification par radiofréquence. Dans un mode de réalisation de la présente invention par exemple, un système de test de dispositif par radiofréquence (RFID) comprend un testeur de dispositif RFID adapté aux dispositifs RFID de test qui sont disposés selon une configuration d'espacement serrée. Le testeur de dispositif RFID applique un seuil variable à chaque dispositif RFID testé, basé sur les caractéristiques d'au moins un dispositif RFID situé à proximité du dispositif RFID testé.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | RFID DEVICE TEST THRESHOLDS SYSTEMS AND METHODS |
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