HIGH CONTRAST TIP-ENHANCED RAMAN SPECTROSCOPY
The present invention relates generally to the field of spectroscopy, and more particularly to tip-enhanced Raman spectroscopy that provides an enhanced contrast-ratio of a near-field Raman signal to a background signal. The near-field Raman signal is captured from a small volume of material near a...
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| creator | SOKOLOV, ALEXEI, P KISLIUK, ALEXANDER HARTSCHUH, RYAN, D LEE, NAM-HEUI MEHTANI, DISHA |
| description | The present invention relates generally to the field of spectroscopy, and more particularly to tip-enhanced Raman spectroscopy that provides an enhanced contrast-ratio of a near-field Raman signal to a background signal. The near-field Raman signal is captured from a small volume of material near a metal-coated tip thereby achieving submicron lateral resolution.
L'invention concerne en général le domaine de la spectroscopie et plus particulièrement la spectroscopie Raman à pointe améliorée, produisant un rapport de contraste amélioré entre un signal Raman de champ proche et un signal de fond. Le signal Raman de champ proche est capturé dans un petit volume de matière à proximité d'une pointe recouverte de métal, une résolution latérale submicronique étant ainsi obtenue. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_WO2006089000A2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>WO2006089000A2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_WO2006089000A23</originalsourceid><addsrcrecordid>eNrjZND18HT3UHD29wsJcgwOUQjxDNB19fNw9HN2dVEIcvR19FMIDnB1DgnyD3b2D4jkYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx4f5GBgZmBhaWBgYGjkbGxKkCAFqVJnM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>HIGH CONTRAST TIP-ENHANCED RAMAN SPECTROSCOPY</title><source>esp@cenet</source><creator>SOKOLOV, ALEXEI, P ; KISLIUK, ALEXANDER ; HARTSCHUH, RYAN, D ; LEE, NAM-HEUI ; MEHTANI, DISHA</creator><creatorcontrib>SOKOLOV, ALEXEI, P ; KISLIUK, ALEXANDER ; HARTSCHUH, RYAN, D ; LEE, NAM-HEUI ; MEHTANI, DISHA</creatorcontrib><description>The present invention relates generally to the field of spectroscopy, and more particularly to tip-enhanced Raman spectroscopy that provides an enhanced contrast-ratio of a near-field Raman signal to a background signal. The near-field Raman signal is captured from a small volume of material near a metal-coated tip thereby achieving submicron lateral resolution.
L'invention concerne en général le domaine de la spectroscopie et plus particulièrement la spectroscopie Raman à pointe améliorée, produisant un rapport de contraste amélioré entre un signal Raman de champ proche et un signal de fond. Le signal Raman de champ proche est capturé dans un petit volume de matière à proximité d'une pointe recouverte de métal, une résolution latérale submicronique étant ainsi obtenue.</description><language>eng ; fre</language><subject>COLORIMETRY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060824&DB=EPODOC&CC=WO&NR=2006089000A2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060824&DB=EPODOC&CC=WO&NR=2006089000A2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SOKOLOV, ALEXEI, P</creatorcontrib><creatorcontrib>KISLIUK, ALEXANDER</creatorcontrib><creatorcontrib>HARTSCHUH, RYAN, D</creatorcontrib><creatorcontrib>LEE, NAM-HEUI</creatorcontrib><creatorcontrib>MEHTANI, DISHA</creatorcontrib><title>HIGH CONTRAST TIP-ENHANCED RAMAN SPECTROSCOPY</title><description>The present invention relates generally to the field of spectroscopy, and more particularly to tip-enhanced Raman spectroscopy that provides an enhanced contrast-ratio of a near-field Raman signal to a background signal. The near-field Raman signal is captured from a small volume of material near a metal-coated tip thereby achieving submicron lateral resolution.
L'invention concerne en général le domaine de la spectroscopie et plus particulièrement la spectroscopie Raman à pointe améliorée, produisant un rapport de contraste amélioré entre un signal Raman de champ proche et un signal de fond. Le signal Raman de champ proche est capturé dans un petit volume de matière à proximité d'une pointe recouverte de métal, une résolution latérale submicronique étant ainsi obtenue.</description><subject>COLORIMETRY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZND18HT3UHD29wsJcgwOUQjxDNB19fNw9HN2dVEIcvR19FMIDnB1DgnyD3b2D4jkYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx4f5GBgZmBhaWBgYGjkbGxKkCAFqVJnM</recordid><startdate>20060824</startdate><enddate>20060824</enddate><creator>SOKOLOV, ALEXEI, P</creator><creator>KISLIUK, ALEXANDER</creator><creator>HARTSCHUH, RYAN, D</creator><creator>LEE, NAM-HEUI</creator><creator>MEHTANI, DISHA</creator><scope>EVB</scope></search><sort><creationdate>20060824</creationdate><title>HIGH CONTRAST TIP-ENHANCED RAMAN SPECTROSCOPY</title><author>SOKOLOV, ALEXEI, P ; KISLIUK, ALEXANDER ; HARTSCHUH, RYAN, D ; LEE, NAM-HEUI ; MEHTANI, DISHA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2006089000A23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2006</creationdate><topic>COLORIMETRY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SOKOLOV, ALEXEI, P</creatorcontrib><creatorcontrib>KISLIUK, ALEXANDER</creatorcontrib><creatorcontrib>HARTSCHUH, RYAN, D</creatorcontrib><creatorcontrib>LEE, NAM-HEUI</creatorcontrib><creatorcontrib>MEHTANI, DISHA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SOKOLOV, ALEXEI, P</au><au>KISLIUK, ALEXANDER</au><au>HARTSCHUH, RYAN, D</au><au>LEE, NAM-HEUI</au><au>MEHTANI, DISHA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>HIGH CONTRAST TIP-ENHANCED RAMAN SPECTROSCOPY</title><date>2006-08-24</date><risdate>2006</risdate><abstract>The present invention relates generally to the field of spectroscopy, and more particularly to tip-enhanced Raman spectroscopy that provides an enhanced contrast-ratio of a near-field Raman signal to a background signal. The near-field Raman signal is captured from a small volume of material near a metal-coated tip thereby achieving submicron lateral resolution.
L'invention concerne en général le domaine de la spectroscopie et plus particulièrement la spectroscopie Raman à pointe améliorée, produisant un rapport de contraste amélioré entre un signal Raman de champ proche et un signal de fond. Le signal Raman de champ proche est capturé dans un petit volume de matière à proximité d'une pointe recouverte de métal, une résolution latérale submicronique étant ainsi obtenue.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
| title | HIGH CONTRAST TIP-ENHANCED RAMAN SPECTROSCOPY |
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