SYSTEMS AND METHODS FOR GENERATING IMAGES OF CRYSTALS
The present invention provides computer-implementable systems and methods for generating images of crystals. The systems each include (a) a light source (12); (b) a rotatable first polarizing material (42); (c) a rotatable second polarizing material (68); (d) a light-capturing device (16); and (e) a...
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| creator | NOLLERT-VON SPECHT, PETER MIXON, MARK, B |
| description | The present invention provides computer-implementable systems and methods for generating images of crystals. The systems each include (a) a light source (12); (b) a rotatable first polarizing material (42); (c) a rotatable second polarizing material (68); (d) a light-capturing device (16); and (e) a software program executable on the computer-implementable system for analyzing electrical signals from the light-capturing device.
La présente invention concerne des procédés et système informatiques de production d'images de cristaux. Ces systèmes incluent chacun (a) une source de lumière, (b) un premier matériau polarisant tournant, (c) un second matériau polarisant tournant, (d) un dispositif captant la lumière, et (e) un logiciel s'exécutant dans le cadre du système informatique de façon à analyser les signaux électriques provenant du dispositif captant la lumière. |
| format | Patent |
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La présente invention concerne des procédés et système informatiques de production d'images de cristaux. Ces systèmes incluent chacun (a) une source de lumière, (b) un premier matériau polarisant tournant, (c) un second matériau polarisant tournant, (d) un dispositif captant la lumière, et (e) un logiciel s'exécutant dans le cadre du système informatique de façon à analyser les signaux électriques provenant du dispositif captant la lumière.</description><language>eng ; fre</language><subject>COLORIMETRY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070405&DB=EPODOC&CC=WO&NR=2006004905A3$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070405&DB=EPODOC&CC=WO&NR=2006004905A3$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NOLLERT-VON SPECHT, PETER</creatorcontrib><creatorcontrib>MIXON, MARK, B</creatorcontrib><title>SYSTEMS AND METHODS FOR GENERATING IMAGES OF CRYSTALS</title><description>The present invention provides computer-implementable systems and methods for generating images of crystals. The systems each include (a) a light source (12); (b) a rotatable first polarizing material (42); (c) a rotatable second polarizing material (68); (d) a light-capturing device (16); and (e) a software program executable on the computer-implementable system for analyzing electrical signals from the light-capturing device.
La présente invention concerne des procédés et système informatiques de production d'images de cristaux. Ces systèmes incluent chacun (a) une source de lumière, (b) un premier matériau polarisant tournant, (c) un second matériau polarisant tournant, (d) un dispositif captant la lumière, et (e) un logiciel s'exécutant dans le cadre du système informatique de façon à analyser les signaux électriques provenant du dispositif captant la lumière.</description><subject>COLORIMETRY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDANjgwOcfUNVnD0c1HwdQ3x8HcJVnDzD1Jwd_VzDXIM8fRzV_D0dXR3DVbwd1NwDgKqdvQJ5mFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8eH-RgYGZgYGJpYGpo7GxsSpAgCN3yiO</recordid><startdate>20070405</startdate><enddate>20070405</enddate><creator>NOLLERT-VON SPECHT, PETER</creator><creator>MIXON, MARK, B</creator><scope>EVB</scope></search><sort><creationdate>20070405</creationdate><title>SYSTEMS AND METHODS FOR GENERATING IMAGES OF CRYSTALS</title><author>NOLLERT-VON SPECHT, PETER ; MIXON, MARK, B</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2006004905A33</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2007</creationdate><topic>COLORIMETRY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NOLLERT-VON SPECHT, PETER</creatorcontrib><creatorcontrib>MIXON, MARK, B</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NOLLERT-VON SPECHT, PETER</au><au>MIXON, MARK, B</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEMS AND METHODS FOR GENERATING IMAGES OF CRYSTALS</title><date>2007-04-05</date><risdate>2007</risdate><abstract>The present invention provides computer-implementable systems and methods for generating images of crystals. The systems each include (a) a light source (12); (b) a rotatable first polarizing material (42); (c) a rotatable second polarizing material (68); (d) a light-capturing device (16); and (e) a software program executable on the computer-implementable system for analyzing electrical signals from the light-capturing device.
La présente invention concerne des procédés et système informatiques de production d'images de cristaux. Ces systèmes incluent chacun (a) une source de lumière, (b) un premier matériau polarisant tournant, (c) un second matériau polarisant tournant, (d) un dispositif captant la lumière, et (e) un logiciel s'exécutant dans le cadre du système informatique de façon à analyser les signaux électriques provenant du dispositif captant la lumière.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
| title | SYSTEMS AND METHODS FOR GENERATING IMAGES OF CRYSTALS |
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