REMOTE BIST FOR HIGH SPEED TEST AND REDUNDANCY CALCULATION

Disclosed is a hybrid built-in self test (BIST ) architecture for embedded memory arrays that segments BIST functionality into remote lower-speed executable instructions and. local higher-speed executable instructions. A standalone BIST logic controller (110) operates at a lower frequency and commun...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	DREIBELBIS, JEFFREY, H, GORMAN, KEVIN, W, NELMS, MICHAEL, R
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
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